| 國立交通大學 |
2014-12-13T10:33:48Z |
基片型全像式雙向傳輸波長區分多工元件
|
蘇德欽; SU DER-CHIN |
| 國立交通大學 |
2014-12-13T10:33:27Z |
以干涉相位測量法探討對掌物質的特性及其相關應用(I)
|
蘇德欽; SU DER-CHIN |
| 國立交通大學 |
2014-12-13T10:31:42Z |
以干涉相位測量法探討對掌物質的特性及其相關應用(II)
|
蘇德欽; SU DER-CHIN |
| 國立交通大學 |
2014-12-13T10:30:41Z |
以干涉相位測量法探討對掌物質的特性及其相關應用(III)
|
蘇德欽; SU DER-CHIN |
| 國立交通大學 |
2014-12-13T10:29:46Z |
小透明生化材料可視化成像研究與其在顯微術上的應用
|
蘇德欽; SU DER-CHIN |
| 國立交通大學 |
2014-12-12T02:19:21Z |
光微影蝕刻技術中濾波效應之分析
|
李俊佑; Lee, Chun-You; 蘇德欽; Su, Der-Chin |
| 國立交通大學 |
2014-12-12T02:18:30Z |
共光程外差干涉儀的原理與其應用之研究
|
邱銘宏; Chiu, Ming-Horng; 蘇德欽; Su Der-Chin |
| 國立交通大學 |
2014-12-12T02:18:05Z |
相移光罩中最少相位衝突的圖案修正
|
郭智亮; Kuo, Chi-Liang; 蘇德欽; Su, Der-Chin |
| 國立交通大學 |
2014-12-12T02:14:47Z |
光學外差表面粗糙度測量術
|
許武 憲 □Hsu, Wun Shan; 蘇 德 欽; Su Der-Chin |
| 國立交通大學 |
2014-12-12T02:06:42Z |
干涉相位量測術及其應用 於光學參數之測量
|
簡志成; Jian, Zhi-Cheng; 蘇德欽; Su, Der-Chin |
| 國立交通大學 |
2014-12-12T01:25:20Z |
外差干涉術在中央條紋法的應用與誤差分析
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吳旺聰; Wu, Wang-Tsung; 蘇德欽; Su, Der-Chin |
| 國立交通大學 |
2014-12-12T01:25:20Z |
使用新穎取樣技術之全場外差干涉儀
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謝鴻志; Hsieh, Hung-Chih; 蘇德欽; Su, Der-Chin |
| 國立交通大學 |
2014-12-12T01:23:47Z |
全場顯微干涉術及其在折射率及表面形貌之量測應用
|
陳彥良; Chen, Yen-Liang; 蘇德欽; Su, Der-Chin |
| 國立交通大學 |
2014-12-08T15:48:23Z |
Improved technique for measuring full-field absolute phases in a common-path heterodyne interferometer
|
Chen, Yen-Liang; Su, Der-Chin |
| 國立交通大學 |
2014-12-08T15:48:14Z |
Full-field refractive index distribution measurement of a gradient-index lens with heterodyne interferometry
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Hsieh, Hung-Chih; Chen, Yen-Liang; Wu, Wang-Tsung; Chang, Wei-Yao; Su, Der-Chin |
| 國立交通大學 |
2014-12-08T15:38:24Z |
An alternative bend-testing technique for a flexible indium tin oxide film
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Chen, Yen-Liang; Hsieh, Hung-Chih; Wu, Wang-Tsung; Wen, Bor-Jiunn; Chang, Wei-Yao; Su, Der-Chin |
| 國立交通大學 |
2014-12-08T15:38:15Z |
Alternative method for measuring the full-field refractive index of a gradient-index lens with normal incidence heterodyne interferometry
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Chen, Yen-Liang; Hsieh, Hung-Chih; Wu, Wang-Tsung; Chang, Wei-Yao; Su, Der-Chin |
| 國立交通大學 |
2014-12-08T15:30:03Z |
High-accuracy thickness measurement of a transparent plate with the heterodyne central fringe identification technique
|
Wu, Wang-Tsung; Hsieh, Hung-Chih; Chang, Wei-Yao; Chen, Yen-Liang; Su, Der-Chin |
| 國立交通大學 |
2014-12-08T15:15:48Z |
Phase geographical map for determining the material type of a right-angle prism
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Chiu, Ming-Hung; Lai, Chih-Wen; Wang, Shinn-Fwu; Su, Der-Chin; Chang, Springfield |
| 國立交通大學 |
2014-12-08T15:15:18Z |
A method for measuring two-dimensional refractive index distribution with the total internal reflection of p-polarized light and the phase-shifting interferometry
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Jian, Zhi-Cheng; Hsieh, Po-Jen; Hsieh, Hung-Chih; Chen, Huei-Wen; Su, Der-Chin |
| 國立交通大學 |
2014-12-08T15:13:09Z |
Optimal condition for full-field heterodyne interferometry
|
Jian, Zhi-Cheng; Chen, Yen-Liang; Hsieh, Hung-Chih; Hsieh, Po-Jen; Su, Der-Chin |
| 國立交通大學 |
2014-12-08T15:12:42Z |
4-Port polarization-independent wavelength-interleaving bidirectional circulator
|
Hsieh, Po-Jen; Chen, Jing-Heng; Hsieh, Hung-Chih; Jian, Zhi-Cheng; Su, Der-Chin |
| 國立交通大學 |
2014-12-08T15:12:13Z |
Multiport polarization-independent wavelength-interleaving bidirectional quasicirculator
|
Hsieh, Po-Jen; Su, Der-Chin |
| 國立交通大學 |
2014-12-08T15:11:47Z |
Optimal sampling conditions for a commonly used charge-coupled device camera in the full-field heterodyne interferometry
|
Hsieh, Hung-Chih; Wu, Wang-Tsung; Chang, Wei-Yao; Chen, Yen-Liang; Su, Der-Chin |
| 國立交通大學 |
2014-12-08T15:10:34Z |
Nano-roughness measurements with a modified Linnik microscope and the uses of full-field heterodyne interferometry
|
Chen, Yen-Liang; Jian, Zhi-Cheng; Hsieh, Hung-Chih; Wu, Wang-Tsung; Su, Der-Chin |
