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Taiwan Academic Institutional Repository >
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"su pin"
Showing items 131-140 of 199 (20 Page(s) Totally) << < 9 10 11 12 13 14 15 16 17 18 > >> View [10|25|50] records per page
| 國立交通大學 |
2014-12-08T15:35:20Z |
Simulation and Investigation of Random Grain-Boundary-Induced Variabilities for Stackable NAND Flash Using 3-D Voronoi Grain Patterns
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Yang, Ching-Wei; Su, Pin |
| 國立交通大學 |
2014-12-08T15:35:18Z |
Impacts of Single Trap Induced Random Telegraph Noise on Si and Ge Nanowire FETs, 6T SRAM Cells and Logic Circuits
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Yang, Shao-Yu; Chen, Yin-Nien; Fan, Ming-Long; Hu, Vita Pi-Ho; Su, Pin; Chuang, Ching-Te |
| 國立交通大學 |
2014-12-08T15:32:43Z |
Analysis of Germanium FinFET Logic Circuits and SRAMs with Asymmetric Gate to Source/Drain Underlap Devices
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Hu, Vita Pi-Ho; Fan, Ming-Long; Su, Pin; Chuang, Ching-Te |
| 國立交通大學 |
2014-12-08T15:32:43Z |
Source/Drain Series Resistance Induced Feedback Effect on Drain Current Mismatch and Its Implication
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Kuo, Jack J. -Y.; Fan, Ming-Long; Lee, Wei; Su, Pin |
| 國立交通大學 |
2014-12-08T15:32:43Z |
Design and Optimization of 6T SRAM using Vertically Stacked Nanowire MOSFETs
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Tsai, Ming-Fu; Fan, Ming-Long; Pao, Chia-Hao; Chen, Yin-Nien; Hu, Vita Pi-Ho; Su, Pin; Chuang, Ching-Te |
| 國立交通大學 |
2014-12-08T15:32:20Z |
Comparative Leakage Analysis of GeOI FinFET and Ge Bulk FinFET
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Hu, Vita Pi-Ho; Fan, Ming-Long; Su, Pin; Chuang, Ching-Te |
| 國立交通大學 |
2014-12-08T15:32:12Z |
Investigation of Single-Trap-Induced Random Telegraph Noise for Tunnel FET Based Devices, 8T SRAM Cell, and Sense Amplifiers
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Fan, Ming-Long; Hu, Vita Pi-Ho; Chen, Yin-Nien; Su, Pin; Chuang, Ching-Te |
| 國立交通大學 |
2014-12-08T15:32:12Z |
Device Design and Analysis of Logic Circuits and SRAMs for Germanium FinFETs on SOI and Bulk Substrates
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Hu, Vita Pi-Ho; Fan, Ming-Long; Su, Pin; Chuang, Ching-Te |
| 國立交通大學 |
2014-12-08T15:31:13Z |
Threshold Voltage Design of UTB SOI SRAM With Improved Stability/Variability for Ultralow Voltage Near Subthreshold Operation
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Hu, Vita Pi-Ho; Fan, Ming-Long; Su, Pin; Chuang, Ching-Te |
| 國立交通大學 |
2014-12-08T15:30:35Z |
Analysis of Single-Trap-Induced Random Telegraph Noise and its Interaction With Work Function Variation for Tunnel FET
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Fan, Ming-Long; Hu, Vita Pi-Ho; Chen, Yin-Nein; Su, Pin; Chuang, Ching-Te |
Showing items 131-140 of 199 (20 Page(s) Totally) << < 9 10 11 12 13 14 15 16 17 18 > >> View [10|25|50] records per page
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