| 國立交通大學 |
2014-12-08T15:29:40Z |
Variability Analysis of Sense Amplifier for FinFET Subthreshold SRAM Applications
|
Fan, Ming-Long; Hu, Vita Pi-Ho; Chen, Yin-Nien; Su, Pin; Chuang, Ching-Te |
| 國立交通大學 |
2014-12-08T15:28:05Z |
Impacts of Random Telegraph Noise on FinFET Devices, 6T SRAM cell, and Logic Circuits
|
Fan, Ming-Long; Hu, Vita Pi-Ho; Chen, Yin-Nien; Su, Pin; Chuang, Ching-Te |
| 國立交通大學 |
2014-12-08T15:25:22Z |
Quantum Confinement Effect in Short-Channel Gate-All-Around MOSFETs and Its Impact on the Sensitivity of Threshold Voltage to Process Variations
|
Wu, Yu-Sheng; Su, Pin |
| 國立交通大學 |
2014-12-08T15:25:21Z |
Investigation of Static Noise Margin of FinFET SRAM Cells in Sub-threshold Region
|
Fan, Ming-Long; Wu, Yu-Sheng; Hu, Vita Pi-Ho; Su, Pin; Chuang, Ching-Te |
| 國立交通大學 |
2014-12-08T15:25:09Z |
Temperature Dependences of RF Small-Signal Characteristics for the SOI Dynamic Threshold Voltage MOSFET
|
Wang, Sheng-Chun; Su, Pin; Chen, Kun-Ming; Huang, Sheng-Yi; Hung, Cheng-Chou; Huang, Guo-Wei |
| 國立交通大學 |
2014-12-08T15:25:08Z |
RF extrinsic resistance extraction considering neutral-body effect for partially-depleted SOI MOSFETs
|
Wang, Sheng-Chun; Su, Pin; Chen, Kun-Ming; Lin, Chien-Ting; Liang, Victor; Huang, Guo-Wei |
| 國立交通大學 |
2014-12-08T15:24:28Z |
Investigation of Low Frequency Noise in Uniaxial Strained PMOSFETs
|
Kuo, Jack J. -Y.; Chen, William P. -N.; Su, Pin |
| 國立交通大學 |
2014-12-08T15:24:25Z |
Investigation of Static Noise Margin of Ultra-Thin-Body SOI SRAM Cells in Subthreshold Region using Analytical Solution of Poisson's Equation
|
Hu, Vita Pi-Ho; Wu, Yu-Sheng; Fan, Ming-Long; Su, Pin; Chuang, Ching-Te |
| 國立交通大學 |
2014-12-08T15:23:48Z |
"Analysis of Single-Trap-Induced Random Telegraph Noise on FinFET Devices, 6T SRAM Cell, and Logic Circuits"
|
Fan, Ming-Long; Hu, Vita Pi-Ho; Chen, Yin-Nien; Su, Pin; Chuang, Ching-Te |
| 國立交通大學 |
2014-12-08T15:23:33Z |
Independently-Controlled-Gate FinFET Schmitt Trigger Sub-Threshold SRAMs
|
Hsieh, Chien-Yu; Fan, Ming-Long; Hu, Vita Pi-Ho; Su, Pin; Chuang, Ching-Te |
| 國立交通大學 |
2014-12-08T15:23:32Z |
Impact of Quantum Confinement on Backgate-Bias Modulated Threshold-Voltage and Subthreshold Characteristics for Ultra-Thin-Body GeOI MOSFETs
|
Yu, Chang-Hung; Wu, Yu-Sheng; Hu, Vita Pi-Ho; Su, Pin |
| 國立交通大學 |
2014-12-08T15:22:22Z |
Impact of Quantum Confinement on Subthreshold Swing and Electrostatic Integrity of Ultra-Thin-Body GeOI and InGaAs-OI n-MOSFETs
|
Yu, Chang-Hung; Wu, Yu-Sheng; Hu, Vita Pi-Ho; Su, Pin |
| 國立交通大學 |
2014-12-08T15:21:55Z |
Investigation of Temperature-Dependent High-Frequency Noise Characteristics for Deep-Submicrometer Bulk and SOI MOSFETs
|
Wang, Sheng-Chun; Su, Pin; Chen, Kun-Ming; Chen, Bo-Yuan; Huang, Guo-Wei |
| 國立交通大學 |
2014-12-08T15:21:55Z |
Impact of Uniaxial Strain on Channel Backscattering Characteristics and Drain Current Variation for Nanoscale PMOSFETs
|
Lee, Wei; Kuo, Jack J. -Y.; Chen, Willian P. -N.; Su, Pin; Jeng, Min-Chie |
| 國立交通大學 |
2014-12-08T15:21:54Z |
A Closed-Form Quantum "Dark Space" Model for Predicting the Electrostatic Integrity of Germanium MOSFETs With High-k Gate Dielectric
|
Wu, Yu-Sheng; Su, Pin |
| 國立交通大學 |
2014-12-08T15:21:25Z |
Band-to-Band-Tunneling Leakage Suppression for Ultra-Thin-Body GeOI MOSFETs Using Transistor Stacking
|
Hu, Vita Pi-Ho; Fan, Ming-Long; Su, Pin; Chuang, Ching-Te |
| 國立交通大學 |
2014-12-08T15:21:20Z |
Impacts of Single Trap Induced Random Telegraph Noise on FinFET Devices and SRAM Cell Stability
|
Fan, Ming-Long; Hu, Vita Pi-Ho; Chen, Yin-Nien; Su, Pin; Chuang, Ching-Te |
| 國立交通大學 |
2014-12-08T15:21:19Z |
Comprehensive Analysis of UTB GeOI Logic Circuits and 6T SRAM Cells considering Variability and Temperature Sensitivity
|
Hu, Vita Pi-Ho; Fan, Ming-Long; Su, Pin; Chuang, Ching-Te |
| 國立交通大學 |
2014-12-08T15:21:19Z |
Self-Heating Induced Feedback Effect on Drain Current Mismatch and Its Modeling
|
Kuo, Jack J-Y.; Su, Pin |
| 國立交通大學 |
2014-12-08T15:20:59Z |
Enhanced Temperature Dependence of Phonon-Scattering-Limited Mobility in Compressively Uniaxial Strained pMOSFETs
|
Chen, William Po-Nien; Kuo, Jack Jyun-Yan; Su, Pin |
| 國立交通大學 |
2014-12-08T15:19:54Z |
Design and Analysis of Ultra-Thin-Body SOI Based Subthreshold SRAM
|
Hu, Vita Pi-Ho; Wu, Yu-Sheng; Fan, Ming-Long; Su, Pin; Chuang, Ching-Te |
| 國立交通大學 |
2014-12-08T15:16:47Z |
Investigation of scaling for multi-gate MOSFETs using analytical solution of 3-D Poisson's equation
|
Wu, Yu-Sheng; Su, Pin |
| 國立交通大學 |
2014-12-08T15:14:23Z |
Investigation of analogue performance for process-induced-strained PMOSFETs
|
Kuo, Jack J-Y; Chen, William P-N; Su, Pin |
| 國立交通大學 |
2014-12-08T15:14:12Z |
On the RF extrinsic resistance extraction for partially-depleted SOI MOSFETs
|
Wang, Sheng-Chun; Su, Pin; Chen, Kun-Ming; Lin, Chien-Ting; Liang, Victor; Huang, Guo-Wei |
| 國立交通大學 |
2014-12-08T15:13:45Z |
On the enhanced impact ionization in uniaxial strained p-MOSFETs
|
Su, Pin; Kuo, Jack J. -Y. |
| 國立交通大學 |
2014-12-08T15:12:40Z |
Investigation of anomalous inversion C-V characteristics for long-channel MOSFETs with leaky dielectrics: Mechanisms and reconstruction
|
Lee, Wei; Su, Pin; Su, Ke-Wei; Chiang, Chung-Shi; Liu, Sally |
| 國立交通大學 |
2014-12-08T15:12:24Z |
Investigation of random dopant fluctuation for multi-gate metal-oxide-semiconductor field-effect transistors using analytical solutions of three-dimensional Poisson's equation
|
Wu, Yu-Sheng; Su, Pin |
| 國立交通大學 |
2014-12-08T15:12:12Z |
Sensitivity of multigate MOSFETs to process variations - An assessment based on analytical solutions of 3-D Poisson's equation
|
Wu, Yu-Sheng; Su, Pin |
| 國立交通大學 |
2014-12-08T15:12:04Z |
FinFET SRAM Cell Optimization Considering Temporal Variability Due to NBTI/PBTI, Surface Orientation and Various Gate Dielectrics
|
Hu, Vita Pi-Ho; Fan, Ming-Long; Hsieh, Chien-Yu; Su, Pin; Chuang, Ching-Te |
| 國立交通大學 |
2014-12-08T15:12:04Z |
Investigation of High-Frequency Noise Characteristics in Tensile-Strained nMOSFETs
|
Wang, Sheng-Chun; Su, Pin; Chen, Kun-Ming; Chen, Bo-Yuan; Huang, Guo-Wei; Hung, Cheng-Chou; Huang, Sheng-Yi; Fan, Cheng-Wen; Tzeng, Chih-Yuh; Chou, Sam |
| 國立交通大學 |
2014-12-08T15:12:03Z |
Comparison of 4T and 6T FinFET SRAM Cells for Subthreshold Operation Considering Variability-A Model-Based Approach
|
Fan, Ming-Long; Wu, Yu-Sheng; Hu, Vita Pi-Ho; Hsieh, Chien-Yu; Su, Pin; Chuang, Ching-Te |
| 國立交通大學 |
2014-12-08T15:11:57Z |
Investigation of Electrostatic Integrity for Ultrathin-Body Germanium-On-Nothing MOSFET
|
Hu, Vita Pi-Ho; Wu, Yu-Sheng; Su, Pin |
| 國立交通大學 |
2014-12-08T15:11:16Z |
Impact of process-induced strain on Coulomb scattering mobility in short-channel n-MOSFETs
|
Chen, William P. N.; Su, Pin; Goto, K. |
| 國立交通大學 |
2014-12-08T15:11:07Z |
Temperature dependence of high frequency noise behaviors for RF MOSFETs
|
Wang, Sheng-Chun; Su, Pin; Chen, Kun-Ming; Lin, Chien-Ting; Liang, Victor; Huang, Guo-Wei |
| 國立交通大學 |
2014-12-08T15:10:57Z |
Investigation of Coulomb Mobility in Nanoscale Strained PMOSFETs
|
Chen, William Po-Nien; Su, Pin; Goto, Ken-Ichi |
| 國立交通大學 |
2014-12-08T15:10:41Z |
Sensitivity of Gate-All-Around Nanowire MOSFETs to Process Variations-A Comparison With Multigate MOSFETs
|
Wu, Yu-Sheng; Su, Pin |
| 國立交通大學 |
2014-12-08T15:10:19Z |
Series Resistance and Mobility Extraction Method in Nanoscale MOSFETs
|
Chen, William Po-Nien; Su, Pin; Goto, Ken-Ichi; Diaz, Carlos H. |
| 國立交通大學 |
2014-12-08T15:10:02Z |
A Comprehensive Investigation of Analog Performance for Uniaxial Strained PMOSFETs
|
Kuo, Jack Jyun-Yan; Chen, William Po-Nien; Su, Pin |
| 國立交通大學 |
2014-12-08T15:09:42Z |
Investigation of electrostatic integrity for ultra-thin-body GeOI MOSFET using analytical solution of Poisson's equation
|
Hu, Vita Pi-Ho; Wu, Yu-Sheng; Su, Pin |
| 國立交通大學 |
2014-12-08T15:09:23Z |
Impact of Uniaxial Strain on Low-Frequency Noise in Nanoscale PMOSFETs
|
Kuo, Jack J. -Y.; Chen, William P. -N.; Su, Pin |
| 國立交通大學 |
2014-12-08T15:09:10Z |
A Comparative Study of Carrier Transport for Overlapped and Nonoverlapped Multiple-Gate SOI MOSFETs
|
Lee, Wei; Su, Pin |
| 國立交通大學 |
2014-12-08T15:08:46Z |
Static Noise Margin of Ultrathin-Body SOI Subthreshold SRAM Cells-An Assessment Based on Analytical Solutions of Poisson's Equation
|
Hu, Vita Pi-Ho; Wu, Yu-Sheng; Fan, Ming-Long; Su, Pin; Chuang, Ching-Te |
| 國立交通大學 |
2014-12-08T15:08:39Z |
On the Experimental Determination of Channel Backscattering Characteristics-Limitation and Application for the Process Monitoring Purpose
|
Lee, Wei; Su, Pin |
| 國立交通大學 |
2014-12-08T15:08:25Z |
Investigation of Channel Backscattering Characteristics in Nanoscale Uniaxial-Strained PMOSFETs
|
Lee, Wei; Su, Pin |
| 國立交通大學 |
2014-12-08T15:08:20Z |
Analytical Quantum-Confinement Model for Short-Channel Gate-All-Around MOSFETs Under Subthreshold Region
|
Wu, Yu-Sheng; Su, Pin |
| 國立交通大學 |
2014-12-08T15:07:33Z |
Investigation of Switching-Time Variations for Nanoscale MOSFETs Using the Effective-Drive-Current Approach
|
Wu, Yu-Sheng; Fan, Ming-Long; Su, Pin |
| 國立交通大學 |
2014-12-08T15:07:17Z |
Investigation and Analysis of Mismatching Properties for Nanoscale Strained MOSFETs
|
Kuo, Jack Jyun-Yan; Chen, William Po-Nien; Su, Pin |
| 國立交通大學 |
2014-12-08T15:07:04Z |
Comprehensive Noise Characterization and Modeling for 65-nm MOSFETs for Millimeter-Wave Applications
|
Wang, Sheng-Chun; Su, Pin; Chen, Kun-Ming; Liao, Kuo-Hsiang; Chen, Bo-Yuan; Huang, Sheng-Yi; Hung, Cheng-Chou; Huang, Guo-Wei |
| 國立交通大學 |
2014-12-08T15:06:58Z |
Impact of Process-Induced Uniaxial Strain on the Temperature Dependence of Carrier Mobility in Nanoscale pMOSFETs
|
Chen, William P. N.; Kuo, Jack J. Y.; Su, Pin |
| 國立交通大學 |
2014-12-08T15:06:58Z |
Enhanced Carrier-Mobility-Fluctuation Origin Low-Frequency Noise in Uniaxial Strained PMOSFETs
|
Kuo, Jack J. -Y.; Chen, William P. -N.; Su, Pin |
