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机构 日期 题名 作者
國立交通大學 2014-12-08T15:29:40Z Variability Analysis of Sense Amplifier for FinFET Subthreshold SRAM Applications Fan, Ming-Long; Hu, Vita Pi-Ho; Chen, Yin-Nien; Su, Pin; Chuang, Ching-Te
國立交通大學 2014-12-08T15:28:05Z Impacts of Random Telegraph Noise on FinFET Devices, 6T SRAM cell, and Logic Circuits Fan, Ming-Long; Hu, Vita Pi-Ho; Chen, Yin-Nien; Su, Pin; Chuang, Ching-Te
國立交通大學 2014-12-08T15:25:22Z Quantum Confinement Effect in Short-Channel Gate-All-Around MOSFETs and Its Impact on the Sensitivity of Threshold Voltage to Process Variations Wu, Yu-Sheng; Su, Pin
國立交通大學 2014-12-08T15:25:21Z Investigation of Static Noise Margin of FinFET SRAM Cells in Sub-threshold Region Fan, Ming-Long; Wu, Yu-Sheng; Hu, Vita Pi-Ho; Su, Pin; Chuang, Ching-Te
國立交通大學 2014-12-08T15:25:09Z Temperature Dependences of RF Small-Signal Characteristics for the SOI Dynamic Threshold Voltage MOSFET Wang, Sheng-Chun; Su, Pin; Chen, Kun-Ming; Huang, Sheng-Yi; Hung, Cheng-Chou; Huang, Guo-Wei
國立交通大學 2014-12-08T15:25:08Z RF extrinsic resistance extraction considering neutral-body effect for partially-depleted SOI MOSFETs Wang, Sheng-Chun; Su, Pin; Chen, Kun-Ming; Lin, Chien-Ting; Liang, Victor; Huang, Guo-Wei
國立交通大學 2014-12-08T15:24:28Z Investigation of Low Frequency Noise in Uniaxial Strained PMOSFETs Kuo, Jack J. -Y.; Chen, William P. -N.; Su, Pin
國立交通大學 2014-12-08T15:24:25Z Investigation of Static Noise Margin of Ultra-Thin-Body SOI SRAM Cells in Subthreshold Region using Analytical Solution of Poisson's Equation Hu, Vita Pi-Ho; Wu, Yu-Sheng; Fan, Ming-Long; Su, Pin; Chuang, Ching-Te
國立交通大學 2014-12-08T15:23:48Z "Analysis of Single-Trap-Induced Random Telegraph Noise on FinFET Devices, 6T SRAM Cell, and Logic Circuits" Fan, Ming-Long; Hu, Vita Pi-Ho; Chen, Yin-Nien; Su, Pin; Chuang, Ching-Te
國立交通大學 2014-12-08T15:23:33Z Independently-Controlled-Gate FinFET Schmitt Trigger Sub-Threshold SRAMs Hsieh, Chien-Yu; Fan, Ming-Long; Hu, Vita Pi-Ho; Su, Pin; Chuang, Ching-Te
國立交通大學 2014-12-08T15:23:32Z Impact of Quantum Confinement on Backgate-Bias Modulated Threshold-Voltage and Subthreshold Characteristics for Ultra-Thin-Body GeOI MOSFETs Yu, Chang-Hung; Wu, Yu-Sheng; Hu, Vita Pi-Ho; Su, Pin
國立交通大學 2014-12-08T15:22:22Z Impact of Quantum Confinement on Subthreshold Swing and Electrostatic Integrity of Ultra-Thin-Body GeOI and InGaAs-OI n-MOSFETs Yu, Chang-Hung; Wu, Yu-Sheng; Hu, Vita Pi-Ho; Su, Pin
國立交通大學 2014-12-08T15:21:55Z Investigation of Temperature-Dependent High-Frequency Noise Characteristics for Deep-Submicrometer Bulk and SOI MOSFETs Wang, Sheng-Chun; Su, Pin; Chen, Kun-Ming; Chen, Bo-Yuan; Huang, Guo-Wei
國立交通大學 2014-12-08T15:21:55Z Impact of Uniaxial Strain on Channel Backscattering Characteristics and Drain Current Variation for Nanoscale PMOSFETs Lee, Wei; Kuo, Jack J. -Y.; Chen, Willian P. -N.; Su, Pin; Jeng, Min-Chie
國立交通大學 2014-12-08T15:21:54Z A Closed-Form Quantum "Dark Space" Model for Predicting the Electrostatic Integrity of Germanium MOSFETs With High-k Gate Dielectric Wu, Yu-Sheng; Su, Pin
國立交通大學 2014-12-08T15:21:25Z Band-to-Band-Tunneling Leakage Suppression for Ultra-Thin-Body GeOI MOSFETs Using Transistor Stacking Hu, Vita Pi-Ho; Fan, Ming-Long; Su, Pin; Chuang, Ching-Te
國立交通大學 2014-12-08T15:21:20Z Impacts of Single Trap Induced Random Telegraph Noise on FinFET Devices and SRAM Cell Stability Fan, Ming-Long; Hu, Vita Pi-Ho; Chen, Yin-Nien; Su, Pin; Chuang, Ching-Te
國立交通大學 2014-12-08T15:21:19Z Comprehensive Analysis of UTB GeOI Logic Circuits and 6T SRAM Cells considering Variability and Temperature Sensitivity Hu, Vita Pi-Ho; Fan, Ming-Long; Su, Pin; Chuang, Ching-Te
國立交通大學 2014-12-08T15:21:19Z Self-Heating Induced Feedback Effect on Drain Current Mismatch and Its Modeling Kuo, Jack J-Y.; Su, Pin
國立交通大學 2014-12-08T15:20:59Z Enhanced Temperature Dependence of Phonon-Scattering-Limited Mobility in Compressively Uniaxial Strained pMOSFETs Chen, William Po-Nien; Kuo, Jack Jyun-Yan; Su, Pin
國立交通大學 2014-12-08T15:19:54Z Design and Analysis of Ultra-Thin-Body SOI Based Subthreshold SRAM Hu, Vita Pi-Ho; Wu, Yu-Sheng; Fan, Ming-Long; Su, Pin; Chuang, Ching-Te
國立交通大學 2014-12-08T15:16:47Z Investigation of scaling for multi-gate MOSFETs using analytical solution of 3-D Poisson's equation Wu, Yu-Sheng; Su, Pin
國立交通大學 2014-12-08T15:14:23Z Investigation of analogue performance for process-induced-strained PMOSFETs Kuo, Jack J-Y; Chen, William P-N; Su, Pin
國立交通大學 2014-12-08T15:14:12Z On the RF extrinsic resistance extraction for partially-depleted SOI MOSFETs Wang, Sheng-Chun; Su, Pin; Chen, Kun-Ming; Lin, Chien-Ting; Liang, Victor; Huang, Guo-Wei
國立交通大學 2014-12-08T15:13:45Z On the enhanced impact ionization in uniaxial strained p-MOSFETs Su, Pin; Kuo, Jack J. -Y.

显示项目 146-170 / 199 (共8页)
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