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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Institution Date Title Author
國立交通大學 2014-12-08T15:12:40Z Investigation of anomalous inversion C-V characteristics for long-channel MOSFETs with leaky dielectrics: Mechanisms and reconstruction Lee, Wei; Su, Pin; Su, Ke-Wei; Chiang, Chung-Shi; Liu, Sally
國立交通大學 2014-12-08T15:12:24Z Investigation of random dopant fluctuation for multi-gate metal-oxide-semiconductor field-effect transistors using analytical solutions of three-dimensional Poisson's equation Wu, Yu-Sheng; Su, Pin
國立交通大學 2014-12-08T15:12:12Z Sensitivity of multigate MOSFETs to process variations - An assessment based on analytical solutions of 3-D Poisson's equation Wu, Yu-Sheng; Su, Pin
國立交通大學 2014-12-08T15:12:04Z FinFET SRAM Cell Optimization Considering Temporal Variability Due to NBTI/PBTI, Surface Orientation and Various Gate Dielectrics Hu, Vita Pi-Ho; Fan, Ming-Long; Hsieh, Chien-Yu; Su, Pin; Chuang, Ching-Te
國立交通大學 2014-12-08T15:12:04Z Investigation of High-Frequency Noise Characteristics in Tensile-Strained nMOSFETs Wang, Sheng-Chun; Su, Pin; Chen, Kun-Ming; Chen, Bo-Yuan; Huang, Guo-Wei; Hung, Cheng-Chou; Huang, Sheng-Yi; Fan, Cheng-Wen; Tzeng, Chih-Yuh; Chou, Sam
國立交通大學 2014-12-08T15:12:03Z Comparison of 4T and 6T FinFET SRAM Cells for Subthreshold Operation Considering Variability-A Model-Based Approach Fan, Ming-Long; Wu, Yu-Sheng; Hu, Vita Pi-Ho; Hsieh, Chien-Yu; Su, Pin; Chuang, Ching-Te
國立交通大學 2014-12-08T15:11:57Z Investigation of Electrostatic Integrity for Ultrathin-Body Germanium-On-Nothing MOSFET Hu, Vita Pi-Ho; Wu, Yu-Sheng; Su, Pin
國立交通大學 2014-12-08T15:11:16Z Impact of process-induced strain on Coulomb scattering mobility in short-channel n-MOSFETs Chen, William P. N.; Su, Pin; Goto, K.
國立交通大學 2014-12-08T15:11:07Z Temperature dependence of high frequency noise behaviors for RF MOSFETs Wang, Sheng-Chun; Su, Pin; Chen, Kun-Ming; Lin, Chien-Ting; Liang, Victor; Huang, Guo-Wei
國立交通大學 2014-12-08T15:10:57Z Investigation of Coulomb Mobility in Nanoscale Strained PMOSFETs Chen, William Po-Nien; Su, Pin; Goto, Ken-Ichi

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