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"su pin"
Showing items 176-185 of 199 (20 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:12:03Z |
Comparison of 4T and 6T FinFET SRAM Cells for Subthreshold Operation Considering Variability-A Model-Based Approach
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Fan, Ming-Long; Wu, Yu-Sheng; Hu, Vita Pi-Ho; Hsieh, Chien-Yu; Su, Pin; Chuang, Ching-Te |
| 國立交通大學 |
2014-12-08T15:11:57Z |
Investigation of Electrostatic Integrity for Ultrathin-Body Germanium-On-Nothing MOSFET
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Hu, Vita Pi-Ho; Wu, Yu-Sheng; Su, Pin |
| 國立交通大學 |
2014-12-08T15:11:16Z |
Impact of process-induced strain on Coulomb scattering mobility in short-channel n-MOSFETs
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Chen, William P. N.; Su, Pin; Goto, K. |
| 國立交通大學 |
2014-12-08T15:11:07Z |
Temperature dependence of high frequency noise behaviors for RF MOSFETs
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Wang, Sheng-Chun; Su, Pin; Chen, Kun-Ming; Lin, Chien-Ting; Liang, Victor; Huang, Guo-Wei |
| 國立交通大學 |
2014-12-08T15:10:57Z |
Investigation of Coulomb Mobility in Nanoscale Strained PMOSFETs
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Chen, William Po-Nien; Su, Pin; Goto, Ken-Ichi |
| 國立交通大學 |
2014-12-08T15:10:41Z |
Sensitivity of Gate-All-Around Nanowire MOSFETs to Process Variations-A Comparison With Multigate MOSFETs
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Wu, Yu-Sheng; Su, Pin |
| 國立交通大學 |
2014-12-08T15:10:19Z |
Series Resistance and Mobility Extraction Method in Nanoscale MOSFETs
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Chen, William Po-Nien; Su, Pin; Goto, Ken-Ichi; Diaz, Carlos H. |
| 國立交通大學 |
2014-12-08T15:10:02Z |
A Comprehensive Investigation of Analog Performance for Uniaxial Strained PMOSFETs
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Kuo, Jack Jyun-Yan; Chen, William Po-Nien; Su, Pin |
| 國立交通大學 |
2014-12-08T15:09:42Z |
Investigation of electrostatic integrity for ultra-thin-body GeOI MOSFET using analytical solution of Poisson's equation
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Hu, Vita Pi-Ho; Wu, Yu-Sheng; Su, Pin |
| 國立交通大學 |
2014-12-08T15:09:23Z |
Impact of Uniaxial Strain on Low-Frequency Noise in Nanoscale PMOSFETs
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Kuo, Jack J. -Y.; Chen, William P. -N.; Su, Pin |
Showing items 176-185 of 199 (20 Page(s) Totally)
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