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Showing items 1-11 of 11 (1 Page(s) Totally)
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| 國立交通大學 |
2020-02-02T23:54:29Z |
Analytical Modeling of Read-Induced SET-State Conductance Change in a Hafnium-Oxide Resistive Switching Device
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Su, Po-Cheng; Jiang, Cheng-Min; Chen, Yu-Jia; Wang, Chih-Chieh; Li, Kai-Shin; Lin, Chao-Cheng; Wang, Tahui |
| 國立交通大學 |
2019-04-02T05:59:54Z |
Modeling of Read-Disturb-Induced SET-State Current Degradation in a Tungsten Oxide Resistive Switching Memory
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Su, Po-Cheng; Jiang, Cheng-Min; Wang, Chih-Wei; Wang, Tahui |
| 國立交通大學 |
2018-08-21T05:56:39Z |
A Numerical Study of Si-TMD Contact with n/p Type Operation and Interface Barrier Reduction for Sub-5 nm Monolayer MoS2 FET
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Tang, Ying-Tsan; Li, Kai-Shin; Li, Lain-Jong; Li, Ming-Yang; Lin, Chang-Hsien; Chen, Yi-Ju; Chen, Chun-Chi; Su, Chuan-Jung; Wu, Bo-Wei; Wu, Cheng-San; Chen, Min-Cheng; Shieh, Jia-Min; Yeh, Wen-Kuan; Su, Po-Cheng; Wang, Tahui; Yang, Fu-Liang; Hu, Chenming |
| 國立交通大學 |
2018-08-21T05:53:02Z |
Characterization and modeling of SET/RESET cycling induced read-disturb failure time degradation in a resistive switching memory
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Su, Po-Cheng; Hsu, Chun-Chi; Du, Sin-I; Wang, Tahui |
| 國立成功大學 |
2018-07-26 |
點膠機轉移奈米銀漿料暨電遷移研究
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蘇柏丞; Su, Po-Cheng |
| 國立成功大學 |
2018-07-26 |
點膠機轉移奈米銀漿料暨電遷移研究
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蘇柏丞; Su, Po-Cheng |
| 國立交通大學 |
2017-04-21T06:56:32Z |
SET/RESET Cycling-Induced Trap Creation and SET-Disturb Failure Time Degradation in a Resistive-Switching Memory
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Chung, Yueh-Ting; Su, Po-Cheng; Lin, Wen-Jie; Chen, Min-Cheng; Wang, Tahui |
| 國立交通大學 |
2017-04-21T06:48:18Z |
TMD FinFET with 4 nm Thin Body and Back Gate Control for Future Low Power Technology
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Chen, Min-Cheng; Li, Kai-Shin; Li, Lain-Jong; Lu, Ang-Yu; Li, Ming-Yang; Chang, Yung-Huang; Lin, Chang-Hsien; Chen, Yi-Ju; Hou, Yun-Fang; Chen, Chun-Chi; Wu, Bo-Wei; Wu, Cheng-San; Yang, Ivy; Lee, Yao-Jen; Shieh, Jia-Min; Yeh, Wen-Kuan; Shih, Jyun-Hong; Su, Po-Cheng; Sachid, Angada B.; Wang, Tahui; Yang, Fu-Liang; Hu, Chenming |
| 國立成功大學 |
2016-08-15 |
應用弧長法與移動最小二乘法於旋轉體薄殼大變形分析
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蘇柏誠; Su, Po-Cheng |
| 國立交通大學 |
2015-07-21T08:28:33Z |
Cycling-Induced SET-Disturb Failure Time Degradation in a Resistive Switching Memory
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Chung, Yueh-Ting; Su, Po-Cheng; Cheng, Yu-Hsuan; Wang, Tahui; Chen, Min-Cheng; Lu, Chih-Yuan |
| 國立高雄餐旅大學 |
2013 |
旅行業品牌建立策略管理、關鍵成功因素與品牌績效之研究
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蘇柏丞; Su, Po-Cheng |
Showing items 1-11 of 11 (1 Page(s) Totally)
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