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Showing items 1-2 of 2 (1 Page(s) Totally) 1 View [10|25|50] records per page
國立交通大學 |
2014-12-08T15:36:06Z |
Statistical Simulation of Metal-Gate Work-function Fluctuation in High-kappa/Metal-Gate Devices
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Yu, Chia-Hui; Han, Ming-Hung; Cheng, Hui-Wen; Su, Zhong-Cheng; Li, Yiming; Watanabe, Hiroshi |
國立交通大學 |
2014-12-08T15:13:15Z |
Device and circuit level suppression techniques for random-dopant-induced static noise margin fluctuation in 16-nm-gate SRAM cell
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Lee, Kuo-Fu; Li, Yiming; Li, Tien-Yen; Su, Zhong-Cheng; Hwang, Chin-Hong |
Showing items 1-2 of 2 (1 Page(s) Totally) 1 View [10|25|50] records per page
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