|
English
|
正體中文
|
简体中文
|
0
|
|
???header.visitor??? :
53175903
???header.onlineuser??? :
604
???header.sponsordeclaration???
|
|
|
|
???tair.name??? >
???browser.page.title.author???
|
"sun cl"???jsp.browse.items-by-author.description???
Showing items 1-10 of 17 (2 Page(s) Totally)
1 2 > >>
View [10|25|50] records per page
| 國立交通大學 |
2018-08-21T05:54:06Z |
Characterization of BaPbO3 and Ba(Pb1-xBix)O-3 thin films
|
Sun, CL; Wang, HW; Chang, MC; Lin, MS; Chen, SY |
| 國立交通大學 |
2018-08-21T05:53:56Z |
Electrical and structural characteristics of PbTiO3 thin films with ultra-thin Al2O3 buffer layers
|
Sun, CL; Chen, SY; Yang, MY; Chin, A |
| 國立交通大學 |
2014-12-08T15:43:40Z |
Stack gate PZT/Al2O3 one transistor ferroelectric memory
|
Chin, A; Yang, MY; Sun, CL; Chen, SY |
| 國立交通大學 |
2014-12-08T15:43:26Z |
Ferroelectric characteristics of oriented Pb(Zr1-xTix)O-3 films
|
Chen, SY; Sun, CL |
| 國立交通大學 |
2014-12-08T15:43:18Z |
Characteristics of Pb(Zr0.53Ti0.47)O-3 on metal and Al2O3/Si substrates
|
Sun, CL; Chen, SY; Yang, MY; Chin, A |
| 國立交通大學 |
2014-12-08T15:42:38Z |
Effect of annealing temperature on physical and electrical properties of Bi3.25La0.75Ti3O12 thin films on Al2O3-buffered Si
|
Sun, CL; Chen, SY; Chen, SB; Chin, A |
| 國立交通大學 |
2014-12-08T15:42:29Z |
Bi3.25La0.75Ti3O12 thin films on ultrathin Al2O3 buffered Si for ferroelectric memory application
|
Chen, SY; Sun, CL; Chen, SB; Chin, A |
| 國立交通大學 |
2014-12-08T15:41:18Z |
Electrical and structural characteristics of PbTiO3 thin films with ultra-thin Al2O3 buffer layers
|
Sun, CL; Chen, SY; Yang, MY; Chin, A |
| 國立交通大學 |
2014-12-08T15:41:18Z |
Characterization of BaPbO3 and Ba(Pb1-xBix)O-3 thin films
|
Sun, CL; Wang, HW; Chang, MC; Lin, MS; Chen, SY |
| 國立交通大學 |
2014-12-08T15:41:16Z |
Effect of Zr/Ti ratios on characterization of Pb(ZrxTi1-x)O-3 thin films on Al2O3 buffered Si for one-transistor memory applications
|
Sun, CL; Hsu, JJ; Chen, SY; Chin, A |
Showing items 1-10 of 17 (2 Page(s) Totally)
1 2 > >>
View [10|25|50] records per page
|
