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"sun s w"的相關文件
顯示項目 36-45 / 52 (共6頁)
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| 臺大學術典藏 |
2018-09-10T04:38:19Z |
Determination of ursodeoxycholic acid in pharmaceutical preparations by capillary electrophoresis with indirect UV detection
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Chang, H.-Y.;Kuo, C.-H.;Sun, S.-W.; CHING-HUA KUO |
| 臺大學術典藏 |
2018-09-10T04:18:03Z |
Separation of bisbenzylisoquinoline alkaloids by micellar electrokinetic chromatography
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Kuo, C.-H.;Sun, S.-W.; CHING-HUA KUO |
| 臺大學術典藏 |
2018-09-10T04:12:59Z |
Applications of pattern-matched beam forming algorithm in the design of adaptive array antennas
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Chou, H.-T.; Lin, Y.-Y.; Sun, S.-W.; HSI-TSENG CHOU |
| 臺大學術典藏 |
2018-09-10T03:31:25Z |
Determination of bisbenzylisoquinoline alkaloids by high-performance liquid chromatography (II)
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Sun, S.-W.;Kuo, C.-H.;Lee, S.-S.;Chen, C.-K.; CHING-HUA KUO; SHOEI-SHENG LEE |
| 國立交通大學 |
2014-12-08T15:48:21Z |
New Observation of an Abnormal Leakage Current in Advanced CMOS Devices with Short Channel Lengths Down to 50nm and Beyond
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Hsieh, E. R.; Chung, Steve S.; Lin, Y. H.; Tsai, C. H.; Liu, P. W.; Tsai, C. T.; Ma, G. H.; Chien, S. C.; Sun, S. W. |
| 國立交通大學 |
2014-12-08T15:45:54Z |
The Observation of Trapping and Detrapping Effects in High-k Gate Dielectric MOSFETs by a New Gate Current Random Telegraph Noise (I(G)-RTN) Approach
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Chang, C. M.; Chung, Steve S.; Hsieh, Y. S.; Cheng, L. W.; Tsai, C. T.; Ma, G. H.; Chien, S. C.; Sun, S. W. |
| 國立交通大學 |
2014-12-08T15:45:53Z |
More Strain and Less Stress- The Guideline for Developing High-End Strained CMOS Technologies with Acceptable Reliability
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Chung, Steve S.; Hsieh, E. R.; Huang, D. C.; Lai, C. S.; Tsai, C. H.; Liu, P. W.; Lin, Y. H.; Tsai, C. T.; Ma, G. H.; Chien, S. C.; Sun, S. W. |
| 國立交通大學 |
2014-12-08T15:24:59Z |
Twin-GD: A new twin gated-diode measurement for the interface characterization of ultra-thin gate oxide MOSFET's with EOT down to 1nm
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Lee, G. D.; Chung, S. S.; Mao, A. Y.; Lin, W. M.; Yang, C. W.; Hsieh, Y. S.; Chu, K. T.; Cheng, L. W.; Tai, H.; Hsu, L. T.; Lee, C. R.; Meng, H. L.; Tsai, C. T.; Ma, G. H.; Chien, S. C.; Sun, S. W. |
| 國立交通大學 |
2014-12-08T15:24:57Z |
New observations on the uniaxial and biaxial strain-induced hot carrier and NBTI Reliabilities for 65nm node CMOS devices and beyond
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Chung, Steve S.; Huang, D. C.; Tsai, Y. J.; Lai, C. S.; Tsai, C. H.; Liu, P. W.; Lin, Y. H.; Tsai, C. T.; Ma, G. H.; Chien, S. C.; Sun, S. W. |
| 國立交通大學 |
2014-12-08T15:21:56Z |
Design of High-Performance and Highly Reliable nMOSFETs with Embedded Si:C S/D Extension Stressor(Si:C S/D-E)
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Chung, Steve S.; Hsieh, E. R.; Liu, P. W.; Chiang, W. T.; Tsai, S. H.; Tsai, T. L.; Huang, R. M.; Tsai, C. H.; Teng, W. Y.; Li, C. I.; Kuo, T. F.; Wang, Y. R.; Yang, C. L.; Tsai, C. T.; Ma, G. H.; Chien, S. C.; Sun, S. W. |
顯示項目 36-45 / 52 (共6頁)
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