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| 臺大學術典藏 |
2018-09-10T05:53:08Z |
Test of equivalence and non-inferiority for diagnostic accuracy based on the paired areas under ROC curves
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Liu, J.-P.;Ma, M.-C.;Wu, C.-Y.;Tai, J.-Y.; Liu, J.-P.; Ma, M.-C.; Wu, C.-Y.; Tai, J.-Y.; JEN-PEI LIU |
| 國立臺灣科技大學 |
2004 |
Dynamic State-Dependent Dispatching for Wafer Fabrication
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Chen, J. C. ; Chen, C. W. ; Tai, J. Y. ; Tyan, J. C. |
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