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Showing items 26-35 of 46 (5 Page(s) Totally)
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| 國立交通大學 |
2015-12-02T02:59:41Z |
Convenient Ratio Approach for Industrial Implementation in Estimating and Testing Process Yield
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Pearn, W. L.; Tai, Y. T.; Kao, C. M. |
| 國立交通大學 |
2015-12-02T02:59:16Z |
Measuring the Manufacturing Yield for Skewed Wire Bonding Processes
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Tai, Y. T.; Pearn, W. L. |
| 國立交通大學 |
2015-07-21T08:29:06Z |
Product mix determination and capacity allocation for heterogeneous products in thin film transistor liquid crystal display manufacturing
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Tai, Y. T.; Pearn, W. L.; Chen, C. C. |
| 國立交通大學 |
2015-07-21T08:28:07Z |
Approximately Unbiased Estimator for Non-Normal Process Capability Index C-Npk
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Pearn, W. L.; Tai, Y. T.; Hsiao, I. F.; Ao, Y. P. |
| 國立交通大學 |
2014-12-12T01:58:21Z |
具工單等級之液晶注入排程問題研究
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鄧光陵; Deng, Kuang Ling; 彭文理; 戴于婷; Pearn, W.L.; Tai, Y. T. |
| 國立交通大學 |
2014-12-08T15:29:08Z |
The burn-in test scheduling problem with batch dependent processing time and sequence dependent setup time
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Pearn, W. L.; Hong, J. S.; Tai, Y. T. |
| 國立交通大學 |
2014-12-08T15:24:05Z |
An Effective Powerful Test for Supplier Selection Evaluation with Multiple Characteristics
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Pearn, W. L.; Tai, Y. T.; Wang, C. Y. |
| 國立交通大學 |
2014-12-08T15:23:16Z |
Measuring the Manufacturing Yield for Processes With Multiple Manufacturing Lines
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Tai, Y. T.; Pearn, W. L.; Kao, Chun-Min |
| 國立交通大學 |
2014-12-08T15:22:56Z |
Cycle time estimation for semiconductor final testing processes with Weibull-distributed waiting time
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Tai, Y. T.; Pearn, W. L.; Lee, J. H. |
| 國立交通大學 |
2014-12-08T15:21:02Z |
An Effective Test for Supplier Selection Evaluation with Multiple Characteristics
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Tai, Y. T.; Pearn, W. L.; You, S. K. |
Showing items 26-35 of 46 (5 Page(s) Totally)
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