| 國立交通大學 |
2014-12-08T15:28:09Z |
Effects of Post-Deposition Annealing Atmosphere and Duration on Sol-Gel Derived Amorphous Indium-Zinc-Oxide Thin Film Transistors
|
Chung, Wan-Fang; Chang, Ting-Chang; Li, Hung-Wei; Tseng, Tseung-Yuen; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:28:09Z |
The Impact of Active Layer Pre-Treatment on Bias Stress Stability of Sol-gel Derived Amorphous Indium-Gallium-Zinc-Oxide Thin Film Transistor
|
Chung, Wan-Fang; Chang, Ting-Chang; Li, Hung-Wei; Chen, Yu-Chun; Li, Iue-Hen; Tseng, Tseung-Yuen; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:26:31Z |
Effect of Lateral Body Terminal on Silicon-Oxide-Nitride-Oxide-Silicon Thin-Film Transistors
|
Li, Hung-Wei; Chang, Ting-Chang; Chang, Geng-Wei; Lin, Chia-Sheng; Tsai, Tsung-Ming; Jian, Fu-Yen; Tai, Ya-Hsiang; Lee, Ming-Hsien |
| 國立交通大學 |
2014-12-08T15:25:31Z |
New pixel circuits for driving organic light emitting diodes with low temperature polycrystalline Si thin film transistors
|
Cheng, Huang-Chung; Chen, Bo-Ting; Kuo, Yu-Ju; Wei, Ying-Jyun; Tsai, Chun-Chien; Chiang, Ko-Yu; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:25:30Z |
A new pixel circuit for driving organic light emitting diodes with low temperature polycrystalline thin film transistors
|
Chen, Bo-Ting; Kuo, Yu-Ju; Pai, Cheng-Chiu; Tsai, Chun-Chien; Cheng, Huang-Chung; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:25:30Z |
A new evaluation method of the threshold voltage for a low temperature poly-silicon thin film transistor in a source follower configuration
|
Huang, Shi-Zhe; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:25:30Z |
Evaluation of the operation for the shift register circuit implemented by low temperature poly-Si thin-film transistors
|
Liou, Hung-Guang; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:25:30Z |
A novel analogue buffer using poly-Si TFTs for active matrix displays
|
Pai, Cheng-Chiu; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:25:30Z |
Diverse instability behaviors for n-channel low-temperature polycrystalline silicon thin film transistors
|
Yu, Cheng-Ho; Tai, Ya-Hsiang; Teng, Te-Hung |
| 國立交通大學 |
2014-12-08T15:25:29Z |
New analog buffer circuit using low temperature polycrystalline thin film transistors for active matrix displays
|
Tai, Ya-Hsiang; Chen, Bo-Ting; Kuo, Yu-Ju; Wei, Ying-Jyun; Pai, Cheng-Chiu; Fang, Chun -Hsiang; Tsai, Chun-Chien; Cheng, Huang-Chung |
| 國立交通大學 |
2014-12-08T15:25:29Z |
A new voltage driving pixel circuit for active matrix organic light emitting diodes
|
Pai, Cheng-Chiu; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:24:59Z |
Source-Follower Type Analog Buffer Using Low Temperature Poly-Si TFTs for AMLCDs
|
Chen, Bo-Ting; Tai, Ya-Hsiang; Wei, Ying-Jyun; Tsai, Chun-Chien; Chen, Hsu-Hsin; Huang, Chun-Yao; Kuo, Yu-Ju; Cheng, Huang-Chung |
| 國立交通大學 |
2014-12-08T15:23:34Z |
High-stability oxygen sensor based on amorphous zinc tin oxide thin film transistor
|
Chen, Yu-Chun; Chang, Ting-Chang; Li, Hung-Wei; Chung, Wan-Fang; Wu, Chang-Pei; Chen, Shih-Ching; Lu, Jin; Chen, Yi-Hsien; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:23:11Z |
Active matrix touch sensor detecting time-constant change implemented by dual-gate IGZO TFTs
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Tai, Ya-Hsiang; Chiu, Hao-Lin; Chou, Lu-Sheng |
| 國立交通大學 |
2014-12-08T15:22:59Z |
The Deterioration of a-IGZO TFTs Owing to the Copper Diffusion after the Process of the Source/Drain Metal Formation
|
Tai, Ya-Hsiang; Chiu, Hao-Lin; Chou, Lu-Sheng |
| 國立交通大學 |
2014-12-08T15:22:46Z |
Abnormal Subthreshold Leakage Current at High Temperature in InGaZnO Thin-Film Transistors
|
Chang, Geng-Wei; Chang, Ting-Chang; Jhu, Jhe-Ciou; Tsai, Tsung-Ming; Syu, Yong-En; Chang, Kuan-Chang; Tai, Ya-Hsiang; Jian, Fu-Yen; Hung, Ya-Chi |
| 國立交通大學 |
2014-12-08T15:22:41Z |
Suppress temperature instability of InGaZnO thin film transistors by N2O plasma treatment, including thermal-induced hole trapping phenomenon under gate bias stress
|
Chang, Geng-Wei; Chang, Ting-Chang; Jhu, Jhe-Ciou; Tsai, Tsung-Ming; Syu, Yong-En; Chang, Kuan-Chang; Tai, Ya-Hsiang; Jian, Fu-Yen; Hung, Ya-Chi |
| 國立交通大學 |
2014-12-08T15:21:54Z |
Asymmetric Carrier Conduction Mechanism by Tip Electric Field in WSiOX Resistance Switching Device
|
Syu, Yong-En; Chang, Ting-Chang; Tsai, Tsung-Ming; Chang, Geng-Wei; Chang, Kuan-Chang; Lou, Jyun-Hao; Tai, Ya-Hsiang; Tsai, Ming-Jinn; Wang, Ying-Lang; Sze, Simon M. |
| 國立交通大學 |
2014-12-08T15:21:54Z |
Three-Transistor AMOLED Pixel Circuit With Threshold Voltage Compensation Function Using Dual-Gate IGZO TFT
|
Tai, Ya-Hsiang; Chou, Lu-Sheng; Chiu, Hao-Lin; Chen, Bo-Cheng |
| 國立交通大學 |
2014-12-08T15:21:35Z |
Surface states related the bias stability of amorphous In-Ga-Zn-O thin film transistors under different ambient gasses
|
Chen, Yu-Chun; Chang, Ting-Chang; Li, Hung-Wei; Chen, Shih-Cheng; Chung, Wan-Fang; Chen, Yi-Hsien; Tai, Ya-Hsiang; Tseng, Tseung-Yuen; Yeh (Huang), Fon-Shan |
| 國立交通大學 |
2014-12-08T15:21:35Z |
Paraffin wax passivation layer improvements in electrical characteristics of bottom gate amorphous indium-gallium-zinc oxide thin-film transistors
|
Chang, Geng-Wei; Chang, Ting-Chang; Syu, Yong-En; Tsai, Tsung-Ming; Chang, Kuan-Chang; Tu, Chun-Hao; Jian, Fu-Yen; Hung, Ya-Chi; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:21:32Z |
Oxygen-Adsorption-Induced Anomalous Capacitance Degradation in Amorphous Indium-Gallium-Zinc-Oxide Thin-Film-Transistors under Hot-Carrier Stress
|
Chung, Wan-Fang; Chang, Ting-Chang; Lin, Chia-Sheng; Tu, Kuan-Jen; Li, Hung-Wei; Tseng, Tseung-Yuen; Chen, Ying-Chung; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:21:29Z |
Silicon introduced effect on resistive switching characteristics of WO(X) thin films
|
Syu, Yong-En; Chang, Ting-Chang; Tsai, Tsung-Ming; Chang, Geng-Wei; Chang, Kuan-Chang; Tai, Ya-Hsiang; Tsai, Ming-Jinn; Wang, Ying-Lang; Sze, Simon M. |
| 國立交通大學 |
2014-12-08T15:20:32Z |
Gap-Type a-Si TFTs for Front Light Sensing Application
|
Tai, Ya-Hsiang; Chou, Lu-Sheng; Chiu, Hao-Lin |
| 國立交通大學 |
2014-12-08T15:18:34Z |
A New Pixel Circuit for Driving Organic Light-Emitting Diode With Low Temperature Polycrystalline Silicon Thin-Film Transistors
|
Tai, Ya-Hsiang; Chen, Bo-Ting; Kuo, Yu-Ju; Tsai, Chun-Chien; Chiang, Ko-Yu; Wei, Ying-Jyun; Cheng, Huang-Chung |
| 國立交通大學 |
2014-12-08T15:16:01Z |
Threshold-voltage-compensation methods for AMOLED pixel and analog buffer circuits
|
Chen, Bo-Ting; Tai, Ya-Hsiang; Wei, Ying-Jyun; Tsai, Chun-Chien; Huang, Chun-Yao; Kuo, Yu-Ju; Cheng, Huang-Chung |
| 國立交通大學 |
2014-12-08T15:15:21Z |
Study on electrical degradation of p-type low-temperature polycrystalline silicon thin film transistors with C-V measurement analysis
|
Huang, Shih-Che; Kao, Yu-Han; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:15:21Z |
Statistical study on the states in the low-temperature poly-silicon films with thin film transistors
|
Huang, Shih-Che; Chou, Yen-Pang; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:15:20Z |
Analysis of poly-Si TFT degradation under gate pulse stress using the slicing model
|
Tai, Ya-Hsiang; Huang, Shih-Che; Chen, Chien-Kwen |
| 國立交通大學 |
2014-12-08T15:15:06Z |
Degradation of the capacitance-voltage behaviors of the low-temperature polysilicon TFTs under DC stress
|
Tai, Ya-Hsiang; Huang, Shih-Che; Lin, Chien Wen; Chiu, Hao Lin |
| 國立交通大學 |
2014-12-08T15:14:31Z |
Investigation of source-follower type analog buffer using low temperature poly-Si TFTs
|
Chen, Bo-Ting; Tai, Ya-Hsiang; Wei, Ying-Jyun; Wei, Kai-Fang; Tsai, Chun-Chien; Huang, Chun-Yao; Kuo, Yu-Ju; Cheng, Huang-Chung |
| 國立交通大學 |
2014-12-08T15:13:37Z |
Statistical study on the temperature dependence of the turn-on characteristics for p-type LTPS TFTs
|
Kuo, Yan-Fu; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:13:02Z |
A statistical model for simulating the effect of UPS TFT device variation for SOP applications
|
Tai, Ya-Hsiang; Huang, Shih-Che; Chen, Wan-Ping; Chao, Yu-Te; Chou, Yen-Pang; Peng, Guo-Feng |
| 國立交通大學 |
2014-12-08T15:12:56Z |
Elimination of photoleakage current in poly-Si TFTs using a metal-shielding structure
|
Lu, Hau-Yan; Chang, Ting-Chang; Liu, Po-Tsun; Li, Hung-Wei; Hu, Chin-Wei; Lin, Kun-Chih; Tai, Ya-Hsiang; Chi, Sien |
| 國立交通大學 |
2014-12-08T15:12:18Z |
Reduction of photoleakage current in polycrystalline silicon thin-film transistor using NH(3) plasma treatment on buffer layer
|
Lu, Hau-Yan; Chang, Ting-Chang; Liu, Po-Tsun; Li, Hung-Wei; Hu, Chin-Wei; Lin, Kun-Chin; Wang, Chao-Chun; Tai, Ya-Hsiang; Chi, Sien |
| 國立交通大學 |
2014-12-08T15:12:16Z |
Variation and mismatch effects of the low-temperature poly-Si TFTs on the circuit for the X-ray active matrix sensor
|
Tai, Ya-Hsiang; Huang, Shih-Che; Su, Ko-Ching; Tseng, Chen-Yeh |
| 國立交通大學 |
2014-12-08T15:12:05Z |
Capacitance-voltage behaviors of the LTPS TFTs before and after DC stress explained by the slicing model
|
Kuo, Yan-Fu; Huang, Shih-Che; Chao, Yu-Te; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:12:04Z |
Highly reliable integrated amorphous silicon thin film transistors gate driver
|
Liu, Chin-Wei; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:12:03Z |
Charge-Trapping-Induced Parasitic Capacitance and Resistance in SONOS TFTs Under Gate Bias Stress
|
Lin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Jian, Fu-Yen; Li, Hung-Wei; Chen, Shih-Ching; Chuang, Ying-Shao; Chen, Te-Chih; Tai, Ya-Hsiang; Lee, Ming-Hsien; Chen, Jim-Shone |
| 國立交通大學 |
2014-12-08T15:12:02Z |
A low temperature polycrystalline silicon thin film transistor phase locked loop circuit used for clock regeneration
|
Tai, Ya-Hsiang; Tseng, Chen-Yeh |
| 國立交通大學 |
2014-12-08T15:12:01Z |
Generalized Hot-Carrier Degradation and Its Mechanism in Poly-Si TFTs Under DC/AC Operations
|
Tai, Ya-Hsiang; Huang, Shih-Che; Chen, Po-Ting; Lin, Chih-Jung |
| 國立交通大學 |
2014-12-08T15:11:58Z |
Dynamic stress effects on the reliability of poly-Si TFT
|
Kuo, Yan-Fu; Huang, Shih-Che; Shih, Wei-Lun; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:11:54Z |
Anomalous on-current and subthreshold swing improvement in low-temperature polycrystalline-silicon thin-film transistors under Gate bias stress
|
Lin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Jian, Fu-Yen; Li, Hung-Wei; Chen, Yi-Chuan; Chen, Te-Chih; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:11:53Z |
Estimation of the effect of channel shortening for P-type poly-Si TFTs under AC stress
|
Huang, Shih-Che; Tsao, Hung-Chuan; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:11:44Z |
Environment-dependent thermal instability of sol-gel derived amorphous indium-gallium-zinc-oxide thin film transistors
|
Chung, Wan-Fang; Chang, Ting-Chang; Li, Hung-Wei; Chen, Shih-Ching; Chen, Yu-Chun; Tseng, Tseung-Yuen; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:11:35Z |
Analysis of P-type poly-Si TFT degradation under dynamic gate voltage stress using the slicing model
|
Huang, Shih-Che; Tsao, Hung-Chuan; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:11:09Z |
Characterization of poly-Si TFT variation using interdigitated method
|
Huang, Shih-Che; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:11:07Z |
Novel gate-all-around poly-Si TFTs with multiple nanowire channels
|
Liao, Ta-Chuan; Tu, Shih-Wei; Yu, Ming H.; Lin, Wei-Kai; Liu, Cheng-Chin; Chang, Kuo-Jui; Tai, Ya-Hsiang; Cheng, Huang-Chung |
| 國立交通大學 |
2014-12-08T15:11:06Z |
The Linear Combination Model for the Degradation of Amorphous Silicon Thin Film Transistors under Drain AC Stress
|
Tai, Ya Hsiang; Tsai, Ming-Hsien; Huang, Shih-Che |
| 國立交通大學 |
2014-12-08T15:10:35Z |
Dependence of Photosensitive Effect on the Defects Created by DC Stress for LTPS TFTs
|
Tai, Ya-Hsiang; Kuo, Yan-Fu; Lee, Yun-Hsiang |
