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"tai ya hsiang"的相關文件
顯示項目 176-185 / 203 (共21頁)
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| 國立交通大學 |
2014-12-08T15:10:25Z |
Photosensitivity Analysis of Low-Temperature Poly-Si Thin-Film Transistor Based on the Unit-Lux-Current
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Tai, Ya-Hsiang; Kuo, Yan-Fu; Lee, Yun-Hsiang |
| 國立交通大學 |
2014-12-08T15:09:52Z |
Degradation Mechanism of Poly-Si TFTs Dynamically Operated in OFF Region
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Tai, Ya-Hsiang; Huang, Shih-Che; Chen, Po-Ting |
| 國立交通大學 |
2014-12-08T15:07:52Z |
Degradation of Low Temperature Polycrystalline Silicon Thin Film Transistors under Negative Bias Temperature Instability Stress with Illumination Effect
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Lin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Li, Hung-Wei; Hsu, Wei-Che; Chen, Shih-Ching; Tai, Ya-Hsiang; Jian, Fu-Yen; Chen, Te-Chih; Tu, Kuan-Jen; Wu, Hsing-Hua; Chen, Yi-Chan |
| 國立交通大學 |
2014-12-08T15:07:50Z |
Analysis of Anomalous Capacitance Induced by TAGIDL in p-Channel LTPS TFTs
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Lin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Li, Hung-Wei; Chen, Shih-Ching; Jian, Fu-Yen; Chuang, Ying-Shao; Chen, Te-Chih; Chen, Yu-Chun; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:07:21Z |
Characterization of the Channel-Shortening Effect on P-Type Poly-Si TFTs
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Tai, Ya-Hsiang; Huang, Shih-Che; Chen, Po-Ting |
| 國立交通大學 |
2014-12-08T15:06:57Z |
An Empirical Defect-Related Photo Leakage Current Model for LTPS TFTs Based on the Unit Lux Current
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Tai, Ya-Hsiang; Kuo, Yan-Fu; Sun, Guo-Pei |
| 國立交通大學 |
2014-12-08T15:06:41Z |
Bias-induced oxygen adsorption in zinc tin oxide thin film transistors under dynamic stress
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Chen, Yu-Chun; Chang, Ting-Chang; Li, Hung-Wei; Chen, Shih-Ching; Lu, Jin; Chung, Wan-Fang; Tai, Ya-Hsiang; Tseng, Tseung-Yuen |
| 國立交通大學 |
2014-12-08T15:05:29Z |
Formation and nonvolatile memory characteristics of W nanocrystals by in-situ steam generation oxidation
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Chen, Shih-Cheng; Chang, Ting-Chang; Hsieh, Chieh-Ming; Li, Hung-Wei; Sze, S. M.; Nien, Wen-Ping; Chan, Chia-Wei; Yeh (Huang), Fon-Shan; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:04:22Z |
Characterization of device degradation of poly-Si TFTs under dynamic operation with drain biased
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Tai, Ya-Hsiang; Huang, Shih-Che; Chan, Chang-Lung |
| 國立成功大學 |
2014-10-21 |
Influence of an anomalous dimension effect on thermal instability in amorphous-InGaZnO thin-film transistors
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Liu, Kuan-Hsien; Chang, Ting-Chang; Chou, Wu-Ching; Chen, Hua-Mao; Tsai, Ming-Yen; Wu, Ming-Siou; Hung, Yi-Syuan; Hung, Pei-Hua; Hsieh, Tien-Yu; Tai, Ya-Hsiang; Chu, Ann-Kuo; Yeh, Bo-Liang |
顯示項目 176-185 / 203 (共21頁)
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