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Institution Date Title Author
國立交通大學 2019-04-02T05:59:32Z Reducing threshold voltage shifts in amorphous silicon thin film transistors by hydrogenating the gate nitride prior to amorphous silicon deposition Tsai, JW; Huang, CY; Tai, YH; Cheng, HC; Su, FC; Luo, FC; Tuan, HC
國立交通大學 2019-04-02T05:59:28Z ANOMALOUS BIAS-STRESS-INDUCED UNSTABLE PHENOMENA OF HYDROGENATED AMORPHOUS-SILICON THIN-FILM TRANSISTORS TAI, YH; TSAI, JW; CHENG, HC; SU, FC
國立交通大學 2014-12-08T15:39:21Z A distributed charge storage with GeO2 nanodots Chang, TC; Yan, ST; Hsu, CH; Tang, MT; Lee, JF; Tai, YH; Liu, PT; Sze, SM
國立交通大學 2014-12-08T15:39:11Z High-performance polycrystalline silicon thin-film transistor with multiple nanowire channels and lightly doped drain structure Wu, YC; Chang, TC; Chang, CY; Chen, CS; Tu, CH; Liu, PT; Zan, HW; Tai, YH
國立交通大學 2014-12-08T15:36:05Z Enhanced performance of poly-Si thin film transistors using fluorine ions implantation Tu, CH; Chang, TC; Liu, PT; Zan, HW; Tai, YH; Yang, CY; Wu, YC; Liu, HC; Chen, WR; Chang, CY
國立交通大學 2014-12-08T15:36:04Z Improvement of reliability for polycrystalline thin-film transistors using self-aligned fluorinated silica glass spacers Tu, CH; Chang, TC; Liu, PT; Zan, HW; Tai, YH; Feng, LW; Wu, YC; Chang, CY
國立交通大學 2014-12-08T15:27:44Z Process-related instability mechanisms for the hydrogenated amorphous silicon thin film transistors Tai, YH; Su, FC; Feng, MS; Cheng, HC
國立交通大學 2014-12-08T15:25:43Z High performance and high reliability polysilicon thin-film transistors with multiple nano-wire channels Wu, YC; Chang, CY; Chang, TC; Liu, PT; Chen, CS; Tu, CH; Zan, HW; Tai, YH; Sze, SM
國立交通大學 2014-12-08T15:25:37Z Statistical study on the temperature dependence of the turn-on characteristics for p-type LTPS TFTs Tai, YH; Kuo, YF
國立交通大學 2014-12-08T15:18:43Z Damage effect of fluorine implantation on PECVD alpha-SiOC barrier dielectric Yang, FM; Chang, TC; Liu, PT; Chen, CW; Tai, YH; Lou, JC

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