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"talwar d n"的相关文件
显示项目 1-9 / 9 (共1页)
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| 臺大學術典藏 |
2021-09-02T00:04:48Z |
Anisotropic optical phonons in MOCVD grown Si-doped GaN/Sapphire epilayers
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Talwar D.N;Lin H.-H;Chuan Feng Z.; Talwar D.N; Lin H.-H; Chuan Feng Z.; HAO-HSIUNG LIN |
| 臺大學術典藏 |
2021-09-02T00:04:48Z |
Polarization dependent infrared reflectivity studies of Si-doped MOCVD grown GaN/Sapphire epilayers
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Talwar D.N;Lin H.-H;Feng Z.C.; Talwar D.N; Lin H.-H; Feng Z.C.; HAO-HSIUNG LIN |
| 臺大學術典藏 |
2020-06-11T06:39:35Z |
Optical and structural characteristics of Bridgman grown cubic Zn1-xMnxTe alloys
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Talwar, D.N.;Becla, P.;Lin, H.-H.;Feng, Z.C.; Talwar, D.N.; Becla, P.; Lin, H.-H.; Feng, Z.C.; HAO-HSIUNG LIN |
| 臺大學術典藏 |
2020-06-11T06:39:34Z |
Surface/structural characteristics and band alignments of thin Ga 2 O 3 films grown on sapphire by pulse laser deposition
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Yang, H.;Qian, Y.;Zhang, C.;Wuu, D.-S.;Talwar, D.N.;Lin, H.-H.;Lee, J.-F.;Wan, L.;He, K.;Feng, Z.C.; Yang, H.; Qian, Y.; Zhang, C.; Wuu, D.-S.; Talwar, D.N.; Lin, H.-H.; Lee, J.-F.; Wan, L.; He, K.; Feng, Z.C.; HAO-HSIUNG LIN |
| 臺大學術典藏 |
2018-09-10T15:23:22Z |
Investigation of optical parameters of boron doped aluminium nitride films grown on diamond using spectroscopic ellipsometry
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Xie, D.;Qiu, Z.R.;Talwar, D.N.;Liu, Y.;Song, J.-H.;Huang, J.-L.;Mei, T.;Liu, C.W.;Feng, Z.C.; Xie, D.; Qiu, Z.R.; Talwar, D.N.; Liu, Y.; Song, J.-H.; Huang, J.-L.; Mei, T.; Liu, C.W.; Feng, Z.C.; CHEE-WEE LIU |
| 臺大學術典藏 |
2018-09-10T09:22:34Z |
Influence of surface roughness and interfacial layer on the infrared spectra of V-CVD grown 3C-SiC/Si (100) epilayers
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Talwar, D.N.; Feng, Z.C.; Liu, C.W.; Tin, C.-C.; CHEE-WEE LIU |
| 國立臺灣大學 |
1993-01 |
On the impurity-induced phonon disordering in novel Cd1-xZnxTe alloys
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Talwar, D.N.; Feng, Z.C.; Becla, P. |
| 國立臺灣大學 |
1993-01 |
Compositional dependence of optical phonon frequencies in AlxGa1-xAs
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Feng, Z.C.; Perkowitz, S.; Kinnel, D.K.; Whitney &, R.L.; Talwar, D.N. |
| 國立臺灣大學 |
1991-01 |
Tight-binding description for the bound electronic states of isolated single and paired native defects in β-SiC
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Talwar, D. N.; Feng, Z. C. |
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