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Showing items 1-19 of 19 (1 Page(s) Totally) 1 View [10|25|50] records per page
| 國立臺灣科技大學 |
2020 |
Mixed dependent acceptance sampling plans for linear profiles
|
Tamirat, Y.;Wang, F.-K. |
| 國立臺灣科技大學 |
2020 |
Mixed dependent acceptance sampling plans for linear profiles
|
Tamirat, Y.;Wang, F.-K. |
| 國立臺灣科技大學 |
2019 |
Acceptance sampling plans based on EWMA yield index for the first order autoregressive process
|
Tamirat, Y.;Wang, F.-K. |
| 國立臺灣科技大學 |
2018 |
Acceptance sampling plan based on an exponentially weighted moving average statistic with the yield index for autocorrelation between polynomial profiles
|
Wang F.-K.; Tamirat Y. |
| 國立臺灣科技大學 |
2017 |
Dependent Mixed and Mixed Repetitive Sampling Plans for Linear Profiles
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Wang, F.-K;Tamirat, Y;Lo, S.-C;Aslam, M. |
| 國立臺灣科技大學 |
2017 |
Implementing EWMA Yield Index for Simple Linear Profiles with One-sided Specifications in Product Acceptance Determination
|
Wang, F.-K;Huang, C.-Y;Tamirat, Y. |
| 國立臺灣科技大學 |
2017 |
Sampling Schemes by Variables Inspection for the First-Order Autoregressive Model between Linear Profiles
|
Tamirat Y.; Wang F.-K.; Chen Y.-C. |
| 國立臺灣科技大學 |
2016 |
Process yield for multivariate linear profiles with one-sided specification limits
|
Wang, F.-K.;Tamirat, Y. |
| 國立臺灣科技大學 |
2016 |
Sampling Plan based on the Exponentially Weighted Moving Average Yield Index for Autocorrelation within Linear Profiles
|
Tamirat, Y;Wang, F.-K. |
| 國立臺灣科技大學 |
2016 |
Implementing the Ratio Test Statistic to Compare Two Suppliers for Linear Profiles
|
Wang, F.-K;Tamirat, Y. |
| 國立臺灣科技大學 |
2016 |
Multiple comparisons with the best for supplier selection with linear profiles
|
Wang, F.-K;Tamirat, Y. |
| 國立臺灣科技大學 |
2016 |
Multiple Comparisons with the Best for Process Selection for Linear Profiles with One-sided Specifications
|
Wang, F.-K;Tamirat, Y. |
| 國立臺灣科技大學 |
2016 |
Two New Independent Mixed Sampling Plans for Inspecting a Product with Linear Profiles
|
Wang, F.-K;Tamirat, Y. |
| 國立臺灣科技大學 |
2016 |
Process yield for multivariate linear profiles with one-sided specification limits
|
Wang, F.-K;Tamirat, Y. |
| 國立臺灣科技大學 |
2016 |
Lower confidence bound for process-yield index Spk with autocorrelated process data
|
Wang, F.-K;Tamirat, Y. |
| 國立臺灣科技大學 |
2015 |
Process Yield Analysis for Linear Within-Profile Autocorrelation
|
Wang, F.-K.;Tamirat, Y. |
| 國立臺灣科技大學 |
2015 |
Lower confidence bound for process-yield index Spk with autocorrelated process data
|
Wang, F.-K.;Tamirat, Y. |
| 國立臺灣科技大學 |
2015 |
Process Selection for Linear Profiles with One-sided Specifications Based on the Ratio Test Statistic
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Wang, F.-K.;Tamirat, Y.;Tsai, Y.-S. |
| 國立臺灣科技大學 |
2014 |
Process yield analysis for autocorrelation between linear profiles
|
Wang, F.-K.;Tamirat, Y. |
Showing items 1-19 of 19 (1 Page(s) Totally) 1 View [10|25|50] records per page
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