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Showing items 1-7 of 7 (1 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:25:45Z |
Study of annealing and exchange bias effects in PtMn based magnetic tunnel junction system
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Peng, TY; Yao, YD; Chen, SY; Wang, YH; Chen, WC; Gao, MJ; Tang, DD |
| 國立交通大學 |
2014-12-08T15:25:40Z |
The impact of uniaxial strain engineering on channel backscattering in nanoscale MOSFETs
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Lin, HN; Chen, HW; Ko, CH; Ge, CH; Lin, HC; Huang, TY; Lee, WC; Tang, DD |
| 國立交通大學 |
2014-12-08T15:25:11Z |
Positive bias and temperature stress induced two-stage drain current degradation in HfSiON nMOSFET's
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Chan, CT; Tang, CJ; Wang, T; Wang, HCH; Tang, DD |
| 國立交通大學 |
2014-12-08T15:16:38Z |
A novel transient characterization technique to investigate trap properties in HfSiON gate dielectric MOSFETs - From single electron emission to PBTI recovery transient
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Wang, TH; Chan, CT; Tang, CJ; Tsai, CW; Wang, HCH; Chi, MH; Tang, DD |
| 臺北醫學大學 |
2001 |
Building a Generic Architecture for Medical Information Exchange among Healthcare Providers
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劉立; 徐建業; 李友專; 劉建財; Li YC; Kuo HS; Jian WS; Tang DD; Liu CT; Liu Li; Hsu CY; Tan YK. |
| 臺北醫學大學 |
2001 |
Incorporating Smart Cards into Hospital Operating Systems
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李友專; Liu CT; Tang DD; Song CM; Chiu WD; Li YC; Liang TC |
| 臺北醫學大學 |
2001 |
Building a Generic Architecture for Medical Information Exchange among Healthcare Providers.
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簡文山; Li YC; Kuo HS; Jian WS; Tang DD; Liu CT; Liu L; Hsu CY; Tan YK. |
Showing items 1-7 of 7 (1 Page(s) Totally)
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