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Institution Date Title Author
國立交通大學 2019-04-02T06:04:43Z The impact of microstructure end defects on moisture resistance of novel SiOxNy passivation layer for OLED applications Chen, Yi-Jen; Hsu, Kuo-Yuan; Chen, Yin-Ying; Su, Cheng-Feng; Tang, Shuenn-Jiun; Leu, Jihperng
國立交通大學 2014-12-08T15:07:49Z The impact of microstructure end defects on moisture resistance of novel SiO(x)N(y) passivation layer for OLED applications Chen, Yi-Jen; Hsu, Kuo-Yuan; Chen, Yin-Ying; Su, Cheng-Feng; Tang, Shuenn-Jiun; Leu, Jihperng

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