|
|
Taiwan Academic Institutional Repository >
Browse by Author
|
"tao hun jan"
Showing items 1-5 of 5 (1 Page(s) Totally)
1
View [10|25|50] records per page
| 國立交通大學 |
2014-12-08T15:15:37Z |
Spatial and energetic distribution of border traps in the dual-layer HfO2/SiO2 high-k gate stack by low-frequency capacitance-voltage measurement
|
Wu, Wei-Hao; Tsui, Bing-Yue; Chen, Mao-Chieh; Hou, Yong-Tian; Jin, Yin; Tao, Hun-Jan; Chen, Shih-Chang; Liang, Mong-Song |
| 國立交通大學 |
2014-12-08T15:13:52Z |
Transient charging and discharging behaviors of border traps in the dual-layer HfO2/SiO2 high-k gate stack observed by using low-frequency charge pumping method
|
Wu, Wei-Hao; Tsui, Bing-Yue; Chen, Mao-Chieh; Hou, Yong-Tian; Jin, Yin; Tao, Hun-Jan; Chen, Shih-Chang; Liang, Mong-Song |
| 國立交通大學 |
2014-12-08T15:11:03Z |
Two-dimensional dopant profiling by electrostatic force microscopy using carbon nanotube modified cantilevers
|
Chin, Shu-Cheng; Chang, Yuan-Chih; Hsu, Chen-Chih; Lin, Wei-Hsiang; Wu, Chih-I; Chang, Chia-Seng; Tsong, Tien T.; Woon, Wei-Yen; Lin, Li-Te; Tao, Hun-Jan |
| 國立交通大學 |
2014-12-08T15:10:43Z |
Anomalous Gate-Edge Leakage Induced by High Tensile Stress in NMOSFET
|
Liu, Po-Tsun; Huang, Chen-Shuo; Lim, Peng-Soon; Lee, Da-Yuan; Tsao, Shueh-Wen; Chen, Chi-Chun; Tao, Hun-Jan; Mii, Yuh-Jier |
| 國立臺灣大學 |
2008 |
Two-dimensional dopant profiling by electrostatic force microscopy using carbon nanotube modified cantilevers
|
Chin, Shu-Cheng; Chang, Yuan-Chih; Hsu, Chen-Chih; Lin, Wei-Hsiang; Wu, Chih-I; Chang, Chia-Seng; Tsong, Tien T.; Woon, Wei-Yen; Lin, Li-Te; Tao, Hun-Jan |
Showing items 1-5 of 5 (1 Page(s) Totally)
1
View [10|25|50] records per page
|
