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Showing items 1-9 of 9 (1 Page(s) Totally)
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| 臺大學術典藏 |
2020-01-13T08:21:38Z |
Development of enhanced active shape model (EASM) for in-situ automatic optical inspection (AOI)
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Chen, L.-C.; Tapilouw, A.M.; Van Thai, N.; LIANG-CHIA CHEN |
| 臺大學術典藏 |
2020-01-13T08:21:38Z |
3-D surface profilometry using simultaneous phase-shifting interferometry
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Chen, L.-C.; Yeh, S.-L.; Tapilouw, A.M.; Chang, J.-C.; LIANG-CHIA CHEN |
| 臺大學術典藏 |
2020-01-13T08:21:38Z |
Development of innovative fringe locking strategies for vibration-resistant white light vertical scanning interferometry (VSI)
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Chen, L.-C.; Tapilouw, A.M.; Yeh, S.-L.; Lin, S.-T.; Chen, J.-L.; Huang, H.-C.; LIANG-CHIA CHEN |
| 臺大學術典藏 |
2020-01-13T08:21:37Z |
In-situ scanning white light interferometry employing dual-sensing configuration and active fringe-locking strategy
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Chen, L.-C.; Yeh, S.-L.; Tapilouw, A.M.; Lee, K.-F.; LIANG-CHIA CHEN |
| 臺大學術典藏 |
2020-01-13T08:21:36Z |
Automatic optical detection of offset and orientation of electronic component by enhanced active shape model (EASM)
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Chen, L.-C.; Van Thai, N.; Tapilouw, A.M.; LIANG-CHIA CHEN |
| 臺大學術典藏 |
2020-01-13T08:21:34Z |
Portable measurement system for static and dynamic characterization of MEMS component
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Wu, H.-W.; Chen, L.-C.; Tapilouw, A.M.; Nguyen, X.-L.; Chen, J.-L.; LIANG-CHIA CHEN |
| 臺大學術典藏 |
2020-01-13T08:21:34Z |
Orthogonal polarization Mirau interferometer using reflective-type waveplate
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Tapilouw, A.M.; Chen, L.-C.; Jen, Y.-J.; Lin, S.-T.; Yeh, S.-L.; LIANG-CHIA CHEN |
| 臺大學術典藏 |
2020-01-13T08:21:33Z |
Multi-function optical characterization and inspection of MEMS components using stroboscopic coherence scanning interferometry
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Tapilouw, A.M.; Chen, L.-C.; Xuan-Loc, N.; Chen, J.-L.; LIANG-CHIA CHEN |
| 臺大學術典藏 |
2020-01-13T08:21:33Z |
Theoretical simulation and experimental confirmation of duty cycle effect on stroboscopic white light interferometry for M(O)EMS dynamic characterization
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Chen, L.-C.; Tapilouw, A.M.; LIANG-CHIA CHEN |
Showing items 1-9 of 9 (1 Page(s) Totally)
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