臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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Institution	Date	Title	Author
臺大學術典藏	2022-05-24T06:26:45Z	Development of a flexure hinge-based stack-type 5 DOF coplanar nanometer-scale stage	Jywe W.-Y.;Jeng Y.-R.;Liu C.-H.;Teng Y.-F.;Wang H.-S.;Fung R.-F.; Jywe W.-Y.; Jeng Y.-R.; Liu C.-H.; Teng Y.-F.; Wang H.-S.; Fung R.-F.; Wen-Yuh Jywe
臺大學術典藏	2022-05-24T06:26:45Z	Development of a flexure hinge-based stack-type 5 DOF coplanar nanometer-scale stage	Jywe W.-Y.;Jeng Y.-R.;Liu C.-H.;Teng Y.-F.;Wang H.-S.;Fung R.-F.; Jywe W.-Y.; Jeng Y.-R.; Liu C.-H.; Teng Y.-F.; Wang H.-S.; Fung R.-F.; Wen-Yuh Jywe
臺大學術典藏	2022-05-24T06:26:44Z	A novel 5DOF thin coplanar nanometer-scale stage	Jywe W.-Y.;Jeng Y.-R.;Liu C.-H.;Teng Y.-F.;Wu C.-H.;Wang H.-S.;Chen Y.-J.; Jywe W.-Y.; Jeng Y.-R.; Liu C.-H.; Teng Y.-F.; Wu C.-H.; Wang H.-S.; Chen Y.-J.; Wen-Yuh Jywe
臺大學術典藏	2022-05-24T06:26:44Z	A novel 5DOF thin coplanar nanometer-scale stage	Jywe W.-Y.;Jeng Y.-R.;Liu C.-H.;Teng Y.-F.;Wu C.-H.;Wang H.-S.;Chen Y.-J.; Jywe W.-Y.; Jeng Y.-R.; Liu C.-H.; Teng Y.-F.; Wu C.-H.; Wang H.-S.; Chen Y.-J.; Wen-Yuh Jywe
臺大學術典藏	2022-05-24T06:26:42Z	Development of a novel laser dual-axis five- degrees-of-freedom measuring system	Jywe W.;Jeng Y.-R.;Liu C.-H.;Teng Y.-F.; Jywe W.; Jeng Y.-R.; Liu C.-H.; Teng Y.-F.; Wen-Yuh Jywe
臺大學術典藏	2022-05-24T06:26:42Z	Development of a novel laser dual-axis five- degrees-of-freedom measuring system	Jywe W.;Jeng Y.-R.;Liu C.-H.;Teng Y.-F.; Jywe W.; Jeng Y.-R.; Liu C.-H.; Teng Y.-F.; Wen-Yuh Jywe
臺大學術典藏	2022-05-24T06:26:42Z	Development for a simple measurement system for pick-and-place mechanisms	Jywe W.-Y.;Liu C.-H.;Yang Y.-T.;Hsu T.-H.;Teng Y.-F.;Jwo H.-H.;Huang H.-L.;Wang M.-S.; Jywe W.-Y.; Liu C.-H.; Yang Y.-T.; Hsu T.-H.; Teng Y.-F.; Jwo H.-H.; Huang H.-L.; Wang M.-S.; Wen-Yuh Jywe
臺大學術典藏	2022-05-24T06:26:42Z	Development for a simple measurement system for pick-and-place mechanisms	Jywe W.-Y.;Liu C.-H.;Yang Y.-T.;Hsu T.-H.;Teng Y.-F.;Jwo H.-H.;Huang H.-L.;Wang M.-S.; Jywe W.-Y.; Liu C.-H.; Yang Y.-T.; Hsu T.-H.; Teng Y.-F.; Jwo H.-H.; Huang H.-L.; Wang M.-S.; Wen-Yuh Jywe
臺大學術典藏	2022-05-24T06:26:42Z	The Application of the Dual-Beam Laser Interferometer for Calibration Precision Machine Tools	Liu C.-H.;Jywe W.-Y.;Chen I.-C.;Duan L.-L.;Jwo H.-H.;Jeng Y.-R.;Hsu T.-H.;Teng Y.-F.;Huang H.-L.;Wang M.-S.;J?ger G.; Liu C.-H.; Jywe W.-Y.; Chen I.-C.; Duan L.-L.; Jwo H.-H.; Jeng Y.-R.; Hsu T.-H.; Teng Y.-F.; Huang H.-L.; Wang M.-S.; J?ger G.; Wen-Yuh Jywe
臺大學術典藏	2022-05-24T06:26:42Z	The Application of the Dual-Beam Laser Interferometer for Calibration Precision Machine Tools	Liu C.-H.;Jywe W.-Y.;Chen I.-C.;Duan L.-L.;Jwo H.-H.;Jeng Y.-R.;Hsu T.-H.;Teng Y.-F.;Huang H.-L.;Wang M.-S.;J?ger G.; Liu C.-H.; Jywe W.-Y.; Chen I.-C.; Duan L.-L.; Jwo H.-H.; Jeng Y.-R.; Hsu T.-H.; Teng Y.-F.; Huang H.-L.; Wang M.-S.; J?ger G.; Wen-Yuh Jywe

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