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Showing items 1-11 of 11 (1 Page(s) Totally)
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| 國立成功大學 |
2009-12 |
Mechanisms of Hot-Carrier-Induced Threshold-Voltage Shift in High-Voltage p-Type LDMOS Transistors
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Chen, Jone F.; Tian, Kuen-Shiuan; Chen, Shiang-Yu; Wu, Kuo-Ming; Shih, J. R.; Wu, Kenneth |
| 國立成功大學 |
2009-09 |
An Investigation on Anomalous Hot-Carrier-Induced On-Resistance Reduction in n-Type LDMOS Transistors
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Chen, Jone F.; Tian, Kuen-Shiuan; Chen, Shiang-Yu; Wu, Kuo-Ming; Shih, J. R.; Wu, Kenneth |
| 國立成功大學 |
2009-06-15 |
橫向擴散金氧半電晶體因熱載子造成元件特性退化之研究
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田昆玄; Tian, Kuen-Shiuan |
| 國立成功大學 |
2009-06-15 |
橫向擴散金氧半電晶體因熱載子造成元件特性退化之研究
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田昆玄; Tian, Kuen-Shiuan |
| 國立成功大學 |
2009-04 |
Mechanism and Modeling of On-Resistance Degradation in n-Type Lateral Diffused Metal-Oxide-Semiconductor Transistors
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Chen, Jone F.; Tian, Kuen-Shiuan; Chen, Shiang-Yu; Wu, Kuo-Ming; Liu, C. M. |
| 國立成功大學 |
2008-09 |
On-resistance degradation induced by hot-carrier injection in LDMOS transistors with STI in the drift region
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Chen, Jone F.; Tian, Kuen-Shiuan; Chen, Shiang-Yu; Wu, Kuo-Ming; Liu, C. M. |
| 國立成功大學 |
2008-07-31 |
Gate current dependent hot-carrier-induced degradation in LDMOS transistors
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Chen, Jone F.; Tian, Kuen-Shiuan; Chen, Shiang-Yu; Lee, J. R.; Wu, Kuo-Ming; Huang, T. Y.; Liu, C. M. |
| 國立成功大學 |
2008-06-16 |
Mechanism and lifetime prediction method for hot-carrier-induced degradation in lateral diffused metal-oxide-semiconductor transistors
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Chen, Jone F.; Tian, Kuen-Shiuan; Chen, Shiang-Yu; Lee, J. R.; Wu, Kuo-Ming; Liu, C. M. |
| 國立成功大學 |
2008-04 |
An investigation on hot-carrier reliability and degradation index in lateral diffused metal-oxide-semiconductor field-effect transistors
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Tian, Kuen-Shiuan; Chen, Jone F.; Chen, Shiang-Yu; Wu, Kuo-Ming; Lee, J. R.; Huang, Tsung-Yi; Liu, C. A.; Hsu, S. L. |
| 國立成功大學 |
2006-06-14 |
不同輕摻雜濃度之n型通道橫向擴散金氧半場效電晶體其特性及熱載子可靠度之研究
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田昆玄; Tian, Kuen-Shiuan |
| 國立成功大學 |
2006-06-14 |
不同輕摻雜濃度之n型通道橫向擴散金氧半場效電晶體其特性及熱載子可靠度之研究
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田昆玄; Tian, Kuen-Shiuan |
Showing items 1-11 of 11 (1 Page(s) Totally)
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