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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Institution Date Title Author
國立交通大學 2014-12-08T15:15:28Z Modeling the well-edge proximity effect in highly scaled MOSFETs Sheu, Yi-Ming; Su, Ke-Wei; Tian, Shiyang; Yang, Sheng-Jier; Wang, Chih-Chiang; Chen, Ming-Jer; Liu, Sally

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