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Institution Date Title Author
國立成功大學 2021-05 Investigation of Degradation Behavior During Illuminated Negative Bias Temperature Stress in P-Channel Low-Temperature Polycrystalline Silicon Thin-Film Transistors Wang;Yu-Xuan;Chang;Ting-Chang;Tai;Mao-Chou;Wu;Chia-Chuan;Tu;Yu-Fa;Chen;Jian-Jie;Huang;Wei-Chen;Shih;Yu-Shan;Chen;Yu-An;Huang;Jen-Wei;Sze;Simon
國立成功大學 2020-12 Suppression of Edge Effect Induced by Positive Gate Bias Stress in Low-Temperature Polycrystalline Silicon TFTs With Channel Width Extension Over Source/Drain Regions Wang;Yu-Xuan;Tai;Mao-Chou;Chang;Ting-Chang;Huang;Shin-Ping;Zheng;Yu-Zhe;Wu;Chia-Chuan;Shih;Yu-Shan;Chen;Yu-An;Sun;Pei-Jun;Lu;I-Nien;Huang;Hui-Chun;Sze;Simon, M.
國立成功大學 2020-11 Enhancing Threshold Switching Characteristics and Stability of Vanadium Oxide-Based Selector With Vanadium Electrode Yeh;Tsung-Han;Chen;Po-Hsun;Lin;Chih-Yang;Tseng;Yi-Ting;Chen;Wen-Chung;Lin;Chun-Chu;Chang;Ting-Chang;Lee;Ching-Ting;Lee;Hsin-Ying
國立成功大學 2020-08 Hydrogen Diffusion and Threshold Voltage Shifts in Top-Gate Amorphous InGaZnO Thin-Film Transistors Chen;Hong-Chih;Chen;Jian-Jie;Zhou;Kuan-Ju;Chen;Guan-Fu;Kuo;Chuan-Wei;Shih;Yu-Shan;Su;Wan-Ching;Yang;Chih-Cheng;Huang;Hui-Chun;Shih;Chih-Cheng;Lai;Wei-Chih;Chang;Ting-Chang
國立成功大學 2020-07 Investigation and Compact Modeling of Hot-Carrier Injection for Read Disturbance in 3-D NAND Flash Memory Chen;Hong-Chih;Chen;Jian-Jie;Tu;Yu-Fa;Zhou;Kuan-Ju;Kuo;Chuan-Wei;Su;Wan-Ching;Hung;Yang-Hao;Shih;Yu-Shan;Huang;Hui-Chun;Tsai;Tsung-Ming;Huang;Jen-Wei;Lai;Wei-Chih;Chang;Ting-Chang
臺大學術典藏 2020-05-22T02:18:53Z The Association of Quality of Primary Care and the Potentially Avoidable Emergency Department (ED) Visit. Raymond N. Kuo; Ting Chang; Ting Chang;Raymond N. Kuo
臺大學術典藏 2020-05-22T02:18:53Z The Association of Quality of Primary Care and the Potentially Avoidable Emergency Department (ED) Visit. Raymond N. Kuo; Ting Chang; Ting Chang;Raymond N. Kuo
臺大學術典藏 2020-05-21T15:23:19Z The Association of Quality of Primary Care and the Potentially Avoidable Emergency Department (ED) Visit. Ting Chang;Raymond N. Kuo; Ting Chang; Raymond N. Kuo
臺大學術典藏 2020-05-21T15:23:19Z The Association of Quality of Primary Care and the Potentially Avoidable Emergency Department (ED) Visit. Ting Chang;Raymond N. Kuo; Ting Chang; Raymond N. Kuo
國立成功大學 2020-03 Impact of Gate Size on Abnormal Current Rise Under an Electric Field in Organic Thin-Film Transistors Chen;Hong-Chih;Chen;Guan-Fu;Chen;Jian-Jie;Kuo;Chuan-Wei;Zhou;Kuan-Ju;Tu;Yu-Fa;Lu;I-Nien;Shih;Yu-Shan;Sun;Li-Chuan;Huang;Hui-Chun;Wu;Wen-Chi;Lai;Wei-Chih;Chang;Ting-Chang
國立成功大學 2019-12 Formation of Hump Effect Due to Top-Gate Bias Stress in Organic Thin-Film Transistors Chen;Hong-Chih;Chen;Guan-Fu;Huang;Shin-Ping;Chang;Ting-Chang;Chen;Po-Hsun;Chen;Jian-Jie;Kuo;Chuan-Wei;Zhou;Kuan-Ju;Hung;Yang-Hao;Tsao;Yu-Ching;Chu;An-Kuo;Huang;Hui-Chun;Lai;Wei-Chih
國立成功大學 2019-11 Analog Resistive Switching and Synaptic Functions in WOx/TaOx Bilayer through Redox-Induced Trap-Controlled Conduction Chen;Wei-Ju;Cheng;Chia-Hao;Lin;Pei-En;Tseng;Yi-Ting;Chang;Ting-Chang;Chen;Jen-Sue
國立成功大學 2019-10-30 Investigation of the Capacitance-Voltage Electrical Characteristics of Thin-Film Transistors Caused by Hydrogen Diffusion under Negative Bias Stress in a Moist Environment Chen;Hong-Chih;Kuo;Chuan-Wei;Chang;Ting-Chang;Lai;Wei-Chih;Chen;Po-Hsun;Chen;Guan-Fu;Huang;Shin-Ping;Chen;Jian-Jie;Zhou;Kuan-Ju;Shih;Chih-Cheng;Tsao;Yu-Ching;Huang;Hui-Chun;Sze;Simon, M.
國立成功大學 2019-09 A Novel Heat Dissipation Structure for Inhibiting Hydrogen Diffusion in Top-Gate a-InGaZnO TFTs Chen;Hong-Chih;Chen;Guan-Fu;Chen;Po-Hsun;Huang;Shin-Ping;Chen;Jian-Jie;Zhou;Kuan-Ju;Kuo;Chuan-Wei;Tsao;Yu-Ching;Chu;An-Kuo;Huang;Hui-Chun;Lai;Wei-Chih;Chang;Ting-Chang
國立成功大學 2019-08 Abnormal Unsaturated Output Characteristics In a-InGaZnO TFTs With Light Shielding Layer Chen;Hong-Chih;Zhou;Kuan-Ju;Chen;Po-Hsun;Chen;Guan-Fu;Huang;Shin-Ping;Chen;Jian-Jie;Kuo;Chuan-Wei;Tsao;Yu-Ching;Tai;Mao-Chou;Chu;An-Kuo;Lai;Wei-Chih;Chang;Ting-Chang
國立成功大學 2019-06 An Energy-Band Model for Dual-Gate-Voltage Sweeping in Hydrogenated Amorphous Silicon Thin-Film Transistors Chen;Guan-Fu;Chen;Hong-Chih;Chang;Ting-Chang;Huang;Shin-Ping;Chen;Hua-Mao;Liao;Po-Yung;Chen;Jian-Jie;Kuo;Chuan-Wei;Lai;Wei-Chih;Chu;Ann-Kuo;Lin;Sung-Chun;Yeh;Cheng-Yen;Chang;Chia-Sen;Tsai;Cheng-Ming;Yu;Ming-Chang;Zhang;Shengdong
國立成功大學 2018-10-22 Floating top gate-induced output enhancement of a-InGaZnO thin film transistors under single gate operations Tai;Mao-Chou;Chang;Ting-Chang;Chen;Ming-Chen;Chian;Hsiao-Cheng;Tsao;Yu-Ching;Chien;Yu-Chieh;Wang;Yu-Xuan;Tsai;Yu-Lin;Chen;Jian-Jie;Zhang;Shengdong;Chang;Hsi-Ming
國立成功大學 2018-08-8 Cyclical Annealing Technique To Enhance Reliability of Amorphous Metal Oxide Thin Film Transistors Chen;Hong-Chih;Chang;Ting-Chang;Lai;Wei-Chih;Chen;Guan-Fu;Chen;Bo-Wei;Hung;Yu-Ju;Chang;Kuo-Jui;Cheng;Kai-Chung;Huang;Chen-Shuo;Chen;Kuo-Kuang;Lu;Hsueh-Hsing;Lin;Yu-Hsin
國立成功大學 2018 Drain-Induced-Barrier-Lowing-Like Effect Induced by Oxygen-Vacancy in Scaling-Down via-Contact Type Amorphous InGaZnO Thin-Film Transistors Yang;Chung-I;Chang;Ting-Chang;Liao;Po-Yung;Chen;Li-Hui;Chen;Bo-Wei;Chou;Wu-Ching;Chen;Guan-Fu;Lin;Sung-Chun;Yeh;Cheng-Yen;Tsai;Cheng-Ming;Yu;Ming-Chang;Zhang;Shengdong
國立成功大學 2017-01-9 Localized tail state distribution and hopping transport in ultrathin zinc-tin-oxide thin film transistor Li;Jeng-Ting;Liu;Li-Chih;Chen;Jen-Sue;Jeng;Jiann-Shing;Liao;Po-Yung;Chiang;Hsiao-Cheng;Chang;Ting-Chang;Nugraha;Insan, Mohamad;Loi;Antonietta, Maria

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