臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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	2019臺灣學術機構典藏研討會
	機構典藏系統RC7版本已發佈

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	臺大學術典藏NTU Scholars

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Institution	Date	Title	Author
國立成功大學	2021-05	Investigation of Degradation Behavior During Illuminated Negative Bias Temperature Stress in P-Channel Low-Temperature Polycrystalline Silicon Thin-Film Transistors	Wang;Yu-Xuan;Chang;Ting-Chang;Tai;Mao-Chou;Wu;Chia-Chuan;Tu;Yu-Fa;Chen;Jian-Jie;Huang;Wei-Chen;Shih;Yu-Shan;Chen;Yu-An;Huang;Jen-Wei;Sze;Simon
國立成功大學	2020-12	Suppression of Edge Effect Induced by Positive Gate Bias Stress in Low-Temperature Polycrystalline Silicon TFTs With Channel Width Extension Over Source/Drain Regions	Wang;Yu-Xuan;Tai;Mao-Chou;Chang;Ting-Chang;Huang;Shin-Ping;Zheng;Yu-Zhe;Wu;Chia-Chuan;Shih;Yu-Shan;Chen;Yu-An;Sun;Pei-Jun;Lu;I-Nien;Huang;Hui-Chun;Sze;Simon, M.
國立成功大學	2020-11	Enhancing Threshold Switching Characteristics and Stability of Vanadium Oxide-Based Selector With Vanadium Electrode	Yeh;Tsung-Han;Chen;Po-Hsun;Lin;Chih-Yang;Tseng;Yi-Ting;Chen;Wen-Chung;Lin;Chun-Chu;Chang;Ting-Chang;Lee;Ching-Ting;Lee;Hsin-Ying
國立成功大學	2020-08	Hydrogen Diffusion and Threshold Voltage Shifts in Top-Gate Amorphous InGaZnO Thin-Film Transistors	Chen;Hong-Chih;Chen;Jian-Jie;Zhou;Kuan-Ju;Chen;Guan-Fu;Kuo;Chuan-Wei;Shih;Yu-Shan;Su;Wan-Ching;Yang;Chih-Cheng;Huang;Hui-Chun;Shih;Chih-Cheng;Lai;Wei-Chih;Chang;Ting-Chang
國立成功大學	2020-07	Investigation and Compact Modeling of Hot-Carrier Injection for Read Disturbance in 3-D NAND Flash Memory	Chen;Hong-Chih;Chen;Jian-Jie;Tu;Yu-Fa;Zhou;Kuan-Ju;Kuo;Chuan-Wei;Su;Wan-Ching;Hung;Yang-Hao;Shih;Yu-Shan;Huang;Hui-Chun;Tsai;Tsung-Ming;Huang;Jen-Wei;Lai;Wei-Chih;Chang;Ting-Chang
臺大學術典藏	2020-05-22T02:18:53Z	The Association of Quality of Primary Care and the Potentially Avoidable Emergency Department (ED) Visit.	Raymond N. Kuo; Ting Chang; Ting Chang;Raymond N. Kuo
臺大學術典藏	2020-05-22T02:18:53Z	The Association of Quality of Primary Care and the Potentially Avoidable Emergency Department (ED) Visit.	Raymond N. Kuo; Ting Chang; Ting Chang;Raymond N. Kuo
臺大學術典藏	2020-05-21T15:23:19Z	The Association of Quality of Primary Care and the Potentially Avoidable Emergency Department (ED) Visit.	Ting Chang;Raymond N. Kuo; Ting Chang; Raymond N. Kuo
臺大學術典藏	2020-05-21T15:23:19Z	The Association of Quality of Primary Care and the Potentially Avoidable Emergency Department (ED) Visit.	Ting Chang;Raymond N. Kuo; Ting Chang; Raymond N. Kuo
國立成功大學	2020-03	Impact of Gate Size on Abnormal Current Rise Under an Electric Field in Organic Thin-Film Transistors	Chen;Hong-Chih;Chen;Guan-Fu;Chen;Jian-Jie;Kuo;Chuan-Wei;Zhou;Kuan-Ju;Tu;Yu-Fa;Lu;I-Nien;Shih;Yu-Shan;Sun;Li-Chuan;Huang;Hui-Chun;Wu;Wen-Chi;Lai;Wei-Chih;Chang;Ting-Chang

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