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Institution	Date	Title	Author
亞洲大學	201506	Reliability Analysis of Amorphous Silicon Thin-Film Transistors during Accelerated ESD stress	蔡宗叡(TSAI, JUNG-RUEY); 楊紹明(Shao-Ming Yang); 許健(Gene Sheu); Ruey Dar Cha(Ruey Dar Chang); Ting Ting We(Ting Ting Wen)

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