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Institution Date Title Author
臺大學術典藏 2018-09-10T05:58:34Z Charge-based capacitance measurement for bias-dependent capacitance YAO-WEN CHANG; Chang, Y.-W.; Chang, H.-W.; Lu, T.-C.; King, Y.-C.; Ting, W.; Ku, Y.-H.J.; Lu, C.-Y.
淡江大學 2008-12-04 The Role of Economic Condition in Accruals Models: Evidence from the Chinese Stock Market. Ting, W.; Yen, S. H.; Chiu, C. L.
淡江大學 2008-08-04 The relation between top management turnover and the firms' prior/Posterior default risk: the evidence from Chinese security market 丁緯; Ting, W; 顏信輝; Yen, Hsin-hui; 邱建良; Chiu, C. L.
淡江大學 2008-05-30 The Relation between Top Management Turnover and the Firms’ Default Risk 丁緯; Ting, W.; 顏信輝; Yen, Hsin-hui; 邱建良; Chiu, C. L.
淡江大學 2007-05-04 The role of accruals in conditional consevatism and debt contract conditioin: evidence in China's stock market 顏信輝; Yen, Hsin-hui; 邱建良; Chiu, C. L.; 丁緯; Ting, W.

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