| 國立交通大學 |
2014-12-08T15:18:00Z |
Using Experimental Design to Determine the Re-Sampling Strategy for Developing a Classification Model for Imbalanced Data
|
Tong, Lee-Ing; Chang, Yung-Chia; Lin, Shan-Hui |
| 國立交通大學 |
2014-12-08T15:17:50Z |
Predicting type II censored data from factorial experiments using modified maximum likelihood predictor
|
Yang, Chien-Hui; Tong, Lee-Ing |
| 國立交通大學 |
2014-12-08T15:15:01Z |
Development of a new cluster index for wafer defects
|
Tong, Lee-Ing; Wang, Chung-Ho; Chen, Da-Lun |
| 國立交通大學 |
2014-12-08T15:14:48Z |
Optimization of multi-response processes using the VIKOR method
|
Tong, Lee-Ing; Chen, Chi-Chan; Wang, Chung-Ho |
| 國立交通大學 |
2014-12-08T15:14:22Z |
The application of control chart for defects and defect clustering in IC manufacturing based on fuzzy theory
|
Hsieh, Kun-Lin; Tong, Lee-Ing; Wang, Min-Chia |
| 國立交通大學 |
2014-12-08T15:12:11Z |
Novel yield model for integrated circuits with clustered defects
|
Tong, Lee-Ing; Chao, Li-Chang |
| 國立交通大學 |
2014-12-08T15:11:52Z |
Determining the optimal re-sampling strategy for a classification model with imbalanced data using design of experiments and response surface methodologies
|
Tong, Lee-Ing; Chang, Yung-Chia; Lin, Shan-Hui |
| 國立交通大學 |
2014-12-08T15:11:19Z |
Using DEA to optimize a mixture design with multiple responses incorporating cost considerations
|
Tsai, Chih-Wei; Tong, Lee-Ing; Wang, Chung-Ho |
| 國立交通大學 |
2014-12-08T15:11:09Z |
Robust design for multiple dynamic quality characteristics using data envelopment analysis
|
Tong, Lee-Ing; Wang, Chun-Ho; Tsai, Chih-Wei |
| 國立交通大學 |
2014-12-08T15:09:01Z |
Wafer defect pattern recognition by multi-class support vector machines by using a novel defect cluster index
|
Chao, Li-Chang; Tong, Lee-Ing |
| 國立交通大學 |
2014-12-08T15:07:02Z |
Continuously Improving Methods for Increasing the Running Efficiency of Equipment in 300-mm Semiconductor Fabrication
|
Wang, Yu-Chih; Tong, Lee-Ing |
| 元培科技大學 |
2005-12 |
Integrating SPC and EPC for multivariate Autocorrelated Process
|
Tong, Lee-Ing;Yang, Chien-Hui;Huang, Cheng-Yi ; Shou, Cheng-Chi |
| 元培科技大學 |
2004-12 |
Constructing Control Process for Wafer Defects Using Data Mining Technique
|
Tong, Lee-Ing;Lee, Hsing-Yin; Huang, Chi-Feng; Lin, Chang-Ke;Yang, Chien-Hui |
| 元培科技大學 |
2003-12 |
Process Chart for Controlling Wafer Defects using Fuzzy Theory
|
Tong, Lee-Ing;Yang, Chien-Hui;Chen, Min-Hsiang; Yu, Hsiang-Pai; Wang, Min-Chia |
| 國立勤益科技大學 |
2002 |
Statistical testing for assessing the performance of lifetime index of electronic components with exponential distribution
|
Tong, Lee-Ing ; Chen, K.S.; Chen, H.T. |
