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"tong lee ing"
Showing items 171-180 of 185 (19 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:18:00Z |
Using Experimental Design to Determine the Re-Sampling Strategy for Developing a Classification Model for Imbalanced Data
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Tong, Lee-Ing; Chang, Yung-Chia; Lin, Shan-Hui |
| 國立交通大學 |
2014-12-08T15:17:50Z |
Predicting type II censored data from factorial experiments using modified maximum likelihood predictor
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Yang, Chien-Hui; Tong, Lee-Ing |
| 國立交通大學 |
2014-12-08T15:15:01Z |
Development of a new cluster index for wafer defects
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Tong, Lee-Ing; Wang, Chung-Ho; Chen, Da-Lun |
| 國立交通大學 |
2014-12-08T15:14:48Z |
Optimization of multi-response processes using the VIKOR method
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Tong, Lee-Ing; Chen, Chi-Chan; Wang, Chung-Ho |
| 國立交通大學 |
2014-12-08T15:14:22Z |
The application of control chart for defects and defect clustering in IC manufacturing based on fuzzy theory
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Hsieh, Kun-Lin; Tong, Lee-Ing; Wang, Min-Chia |
| 國立交通大學 |
2014-12-08T15:12:11Z |
Novel yield model for integrated circuits with clustered defects
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Tong, Lee-Ing; Chao, Li-Chang |
| 國立交通大學 |
2014-12-08T15:11:52Z |
Determining the optimal re-sampling strategy for a classification model with imbalanced data using design of experiments and response surface methodologies
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Tong, Lee-Ing; Chang, Yung-Chia; Lin, Shan-Hui |
| 國立交通大學 |
2014-12-08T15:11:19Z |
Using DEA to optimize a mixture design with multiple responses incorporating cost considerations
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Tsai, Chih-Wei; Tong, Lee-Ing; Wang, Chung-Ho |
| 國立交通大學 |
2014-12-08T15:11:09Z |
Robust design for multiple dynamic quality characteristics using data envelopment analysis
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Tong, Lee-Ing; Wang, Chun-Ho; Tsai, Chih-Wei |
| 國立交通大學 |
2014-12-08T15:09:01Z |
Wafer defect pattern recognition by multi-class support vector machines by using a novel defect cluster index
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Chao, Li-Chang; Tong, Lee-Ing |
Showing items 171-180 of 185 (19 Page(s) Totally)
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