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"tong lee ing"
Showing items 176-185 of 185 (4 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:12:11Z |
Novel yield model for integrated circuits with clustered defects
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Tong, Lee-Ing; Chao, Li-Chang |
| 國立交通大學 |
2014-12-08T15:11:52Z |
Determining the optimal re-sampling strategy for a classification model with imbalanced data using design of experiments and response surface methodologies
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Tong, Lee-Ing; Chang, Yung-Chia; Lin, Shan-Hui |
| 國立交通大學 |
2014-12-08T15:11:19Z |
Using DEA to optimize a mixture design with multiple responses incorporating cost considerations
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Tsai, Chih-Wei; Tong, Lee-Ing; Wang, Chung-Ho |
| 國立交通大學 |
2014-12-08T15:11:09Z |
Robust design for multiple dynamic quality characteristics using data envelopment analysis
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Tong, Lee-Ing; Wang, Chun-Ho; Tsai, Chih-Wei |
| 國立交通大學 |
2014-12-08T15:09:01Z |
Wafer defect pattern recognition by multi-class support vector machines by using a novel defect cluster index
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Chao, Li-Chang; Tong, Lee-Ing |
| 國立交通大學 |
2014-12-08T15:07:02Z |
Continuously Improving Methods for Increasing the Running Efficiency of Equipment in 300-mm Semiconductor Fabrication
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Wang, Yu-Chih; Tong, Lee-Ing |
| 元培科技大學 |
2005-12 |
Integrating SPC and EPC for multivariate Autocorrelated Process
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Tong, Lee-Ing;Yang, Chien-Hui;Huang, Cheng-Yi ; Shou, Cheng-Chi |
| 元培科技大學 |
2004-12 |
Constructing Control Process for Wafer Defects Using Data Mining Technique
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Tong, Lee-Ing;Lee, Hsing-Yin; Huang, Chi-Feng; Lin, Chang-Ke;Yang, Chien-Hui |
| 元培科技大學 |
2003-12 |
Process Chart for Controlling Wafer Defects using Fuzzy Theory
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Tong, Lee-Ing;Yang, Chien-Hui;Chen, Min-Hsiang; Yu, Hsiang-Pai; Wang, Min-Chia |
| 國立勤益科技大學 |
2002 |
Statistical testing for assessing the performance of lifetime index of electronic components with exponential distribution
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Tong, Lee-Ing ; Chen, K.S.; Chen, H.T. |
Showing items 176-185 of 185 (4 Page(s) Totally)
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