| 國立交通大學 |
2014-12-12T01:41:39Z |
薄膜產業三階段品質管制流程之構建
|
簡士超; 唐麗英; 洪瑞雲; Tong, Lee-Ing; Horng, Ruey-Yun |
| 國立交通大學 |
2014-12-12T01:41:38Z |
整合六標準差與軟體產業CMMI Level 4之管理方法
|
潘彥志; Pan, Yen-Chih; 唐麗英; Tong, Lee-Ing |
| 國立交通大學 |
2014-12-12T01:35:05Z |
運用迴歸分析分析生產週期時間－以C公司為例
|
張定一; Chang, Ting-Yi; 唐麗英; Tong, Lee-Ing |
| 國立交通大學 |
2014-12-12T01:31:53Z |
使用灰色理論及基因規劃法建構預測模型-以能源消耗之預測為例
|
李宜憲; Lee, Yi-Shian; 唐麗英; Tong, Lee-Ing |
| 國立交通大學 |
2014-12-12T01:31:53Z |
具有學習效果的流程式生產排程之最大完工時間與總完工時間最小化之研究
|
鐘愉翔; Chung, Yu-Hsiang; 唐麗英; 洪瑞雲; Tong, Lee-Ing; Horng, Ruey-Yun |
| 國立交通大學 |
2014-12-12T01:31:50Z |
建構台灣地區太陽能發電系統之發電量預測模型
|
高翊倫; Kao, Yee-Lun; 唐麗英; 梁高榮; Tong, Lee-Ing; Liang, Gau-Rong |
| 國立交通大學 |
2014-12-12T01:31:50Z |
考量具自我相關之多變異來源製程管制
|
鄭永裕; Yong-Yu Zheng; 唐麗英; 梁高榮; Tong, Lee-Ing; Liang, Gau-Rong |
| 國立交通大學 |
2014-12-12T01:31:49Z |
應用自組性演算法建構多階段信用風險評估模型
|
朱逸暉; Chu, Yi-Hui; 唐麗英; 張永佳; Tong, Lee-Ing; Chang, Yung-Chia |
| 國立交通大學 |
2014-12-12T01:31:39Z |
軟體發展流程之最佳化
|
廖怡鈞; Liao, I-Chun; 唐麗英; 洪瑞雲; Tong, Lee-Ing; Horng, Ruey-Yun |
| 國立交通大學 |
2014-12-12T01:31:39Z |
美麗產業之創新服務
|
王冠文; Wang, Kuan-Wen; 唐麗英; 張永佳; Tong, Lee-Ing; Chang, Yung-Chia |
| 國立交通大學 |
2014-12-12T01:26:18Z |
以案例式推理法建構類比積體電路在應用端之失效診斷系統
|
林鴻振; Lin, Hung-Chen; 唐麗英; Tong, Lee-Ing |
| 國立交通大學 |
2014-12-12T01:26:18Z |
應用案例式推理方法建構汽車零件品質診斷系統
|
李文宏; Lee Wen-Hong; 唐麗英; Tong Lee-Ing |
| 國立交通大學 |
2014-12-12T01:26:18Z |
LCD零組件出貨品質管制流程之構建-以背光光學特性之管制為例
|
廖和居; Liao, Ho-Chu; 唐麗英; Tong, Lee-Ing |
| 國立交通大學 |
2014-12-12T01:26:18Z |
應用西北角法建構晶圓廠瓶頸機台管理模式
|
王麗芬; Wang, Li-Feng; 唐麗英; Tong, Lee-Ing |
| 國立交通大學 |
2014-12-12T01:26:18Z |
應用良率學習曲線於太陽能電池產業之投料規劃
|
林奕成; Lin, Yi-Cheng; 唐麗英; Tong, Lee-Ing |
| 國立交通大學 |
2014-12-12T01:26:17Z |
IECQ-QC080000流程管理系統之建置-以某半導體測試廠為例
|
林威至; Lin,Wei-Chih; 唐麗英; Tong, Lee-Ing |
| 國立交通大學 |
2014-12-12T01:26:17Z |
目標管理推行模式之構建 - 以某光電公司為例
|
林嘉儀; Lin, Chia-Yi; 唐麗英; Tong, Lee-Ing |
| 國立交通大學 |
2014-12-12T01:25:35Z |
建構軟體發展流程之多變量管制系統
|
陳啟揚; Chen, Chi-Yang; 唐麗英; Tong, Lee-Ing |
| 國立交通大學 |
2014-12-12T01:24:18Z |
應用故障分析與實驗設計發展TFT-LCD彩色濾光片缺陷修補方法
|
吳秋妤; 唐麗英; 王春和; Tong, Lee-Ing; Wang, Chun-Huo |
| 國立交通大學 |
2014-12-12T01:24:17Z |
應用專案管理方法導入ISO/TS 16949品質管理系統 - 以某晶圓代工廠為例
|
陳耀斌; Chen, Yao-Pin; 唐麗英; 洪瑞雲; Tong, Lee-Ing; Horng, Ruey-Yun |
| 國立交通大學 |
2014-12-12T01:23:04Z |
晶圓廠機台加工效率指標之建立及應用
|
王有志; Wang, Yu-Chih; 唐麗英; Tong, Lee-Ing |
| 國立交通大學 |
2014-12-12T01:22:28Z |
應用多屬性決策方法訂定晶圓代工廠選擇量測機台供應商之最佳策略
|
潘俊豪; Pan, June-Haun; 唐麗英; Tong, Lee-Ing |
| 國立交通大學 |
2014-12-08T15:38:06Z |
Forecasting energy consumption using a grey model improved by incorporating genetic programming
|
Lee, Yi-Shian; Tong, Lee-Ing |
| 國立交通大學 |
2014-12-08T15:37:36Z |
Forecasting time series using a methodology based on autoregressive integrated moving average and genetic programming
|
Lee, Yi-Shian; Tong, Lee-Ing |
| 國立交通大學 |
2014-12-08T15:30:57Z |
Monitoring the software development process using a short-run control chart
|
Chang, Chih-Wei; Tong, Lee-Ing |
| 國立交通大學 |
2014-12-08T15:27:45Z |
Makespan minimization for m-machine permutation flowshop scheduling problem with learning considerations
|
Chung, Yu-Hsiang; Tong, Lee-Ing |
| 國立交通大學 |
2014-12-08T15:23:47Z |
Quantifying uncertainty of emission estimates in National Greenhouse Gas Inventories using bootstrap confidence intervals
|
Tong, Lee-Ing; Chang, Chih-Wei; Jin, Shin-En; Saminathan, R. |
| 國立交通大學 |
2014-12-08T15:23:05Z |
Bi-criteria minimization for the permutation flowshop scheduling problem with machine-based learning effects
|
Chung, Yu-Hsiang; Tong, Lee-Ing |
| 國立交通大學 |
2014-12-08T15:22:34Z |
Forecasting nonlinear time series of energy consumption using a hybrid dynamic model
|
Lee, Yi-Shian; Tong, Lee-Ing |
| 國立交通大學 |
2014-12-08T15:22:20Z |
Predicting High or Low Transfer Efficiency of Photovoltaic Systems Using a Novel Hybrid Methodology Combining Rough Set Theory, Data Envelopment Analysis and Genetic Programming
|
Lee, Yi-Shian; Tong, Lee-Ing |
| 國立交通大學 |
2014-12-08T15:18:00Z |
Using Experimental Design to Determine the Re-Sampling Strategy for Developing a Classification Model for Imbalanced Data
|
Tong, Lee-Ing; Chang, Yung-Chia; Lin, Shan-Hui |
| 國立交通大學 |
2014-12-08T15:17:50Z |
Predicting type II censored data from factorial experiments using modified maximum likelihood predictor
|
Yang, Chien-Hui; Tong, Lee-Ing |
| 國立交通大學 |
2014-12-08T15:15:01Z |
Development of a new cluster index for wafer defects
|
Tong, Lee-Ing; Wang, Chung-Ho; Chen, Da-Lun |
| 國立交通大學 |
2014-12-08T15:14:48Z |
Optimization of multi-response processes using the VIKOR method
|
Tong, Lee-Ing; Chen, Chi-Chan; Wang, Chung-Ho |
| 國立交通大學 |
2014-12-08T15:14:22Z |
The application of control chart for defects and defect clustering in IC manufacturing based on fuzzy theory
|
Hsieh, Kun-Lin; Tong, Lee-Ing; Wang, Min-Chia |
| 國立交通大學 |
2014-12-08T15:12:11Z |
Novel yield model for integrated circuits with clustered defects
|
Tong, Lee-Ing; Chao, Li-Chang |
| 國立交通大學 |
2014-12-08T15:11:52Z |
Determining the optimal re-sampling strategy for a classification model with imbalanced data using design of experiments and response surface methodologies
|
Tong, Lee-Ing; Chang, Yung-Chia; Lin, Shan-Hui |
| 國立交通大學 |
2014-12-08T15:11:19Z |
Using DEA to optimize a mixture design with multiple responses incorporating cost considerations
|
Tsai, Chih-Wei; Tong, Lee-Ing; Wang, Chung-Ho |
| 國立交通大學 |
2014-12-08T15:11:09Z |
Robust design for multiple dynamic quality characteristics using data envelopment analysis
|
Tong, Lee-Ing; Wang, Chun-Ho; Tsai, Chih-Wei |
| 國立交通大學 |
2014-12-08T15:09:01Z |
Wafer defect pattern recognition by multi-class support vector machines by using a novel defect cluster index
|
Chao, Li-Chang; Tong, Lee-Ing |
| 國立交通大學 |
2014-12-08T15:07:02Z |
Continuously Improving Methods for Increasing the Running Efficiency of Equipment in 300-mm Semiconductor Fabrication
|
Wang, Yu-Chih; Tong, Lee-Ing |
| 元培科技大學 |
2005-12 |
Integrating SPC and EPC for multivariate Autocorrelated Process
|
Tong, Lee-Ing;Yang, Chien-Hui;Huang, Cheng-Yi ; Shou, Cheng-Chi |
| 元培科技大學 |
2004-12 |
Constructing Control Process for Wafer Defects Using Data Mining Technique
|
Tong, Lee-Ing;Lee, Hsing-Yin; Huang, Chi-Feng; Lin, Chang-Ke;Yang, Chien-Hui |
| 元培科技大學 |
2003-12 |
Process Chart for Controlling Wafer Defects using Fuzzy Theory
|
Tong, Lee-Ing;Yang, Chien-Hui;Chen, Min-Hsiang; Yu, Hsiang-Pai; Wang, Min-Chia |
| 國立勤益科技大學 |
2002 |
Statistical testing for assessing the performance of lifetime index of electronic components with exponential distribution
|
Tong, Lee-Ing ; Chen, K.S.; Chen, H.T. |
