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Taiwan Academic Institutional Repository >
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"tong li"
Showing items 11-22 of 22 (1 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:35:00Z |
Monitoring defects in IC fabrication using a hotelling T-2 control chart
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Tong, LI; Wang, CH; Huang, CL |
| 國立交通大學 |
2014-12-08T15:27:23Z |
Modified process control chart in IC fabrication using clustering analysis
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Tong, LI; Lee, WI |
| 國立交通大學 |
2014-12-08T15:20:27Z |
Multi-response robust design by principal component analysis
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Su, CT; Tong, LI |
| 國立交通大學 |
2014-12-08T15:17:59Z |
Optimization of multiple responses using principal component analysis and technique for order preference by similarity to ideal solution
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Tong, LI; Wang, CH; Chen, HC |
| 國立交通大學 |
2014-12-08T15:17:58Z |
Optimization of a multi-response problem in Taguchi's dynamic system
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Hsieh, KL; Tong, LI; Chiu, HP; Yeh, HY |
| 國立交通大學 |
2014-12-08T15:17:50Z |
Analyzing type II censored data obtained from repetitious experiments
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Tong, LI; Yang, CH |
| 國立交通大學 |
2014-12-08T15:17:31Z |
Optimizing processes based on censored data obtained in repetitious experiments using grey prediction
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Tong, LI; Wang, CH; Hsiao, LC |
| 國立交通大學 |
2014-12-08T15:17:29Z |
Incorporating process capability index and quality loss function into analyzing the process capability for qualitative data
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Hsieh, KL; Tong, LI |
| 國立交通大學 |
2014-12-08T15:17:13Z |
Manufacturing performance evaluation for IC products
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Hsieh, KL; Tong, LI |
| 國立交通大學 |
2014-12-08T15:02:07Z |
Optimizing multi-response problems in the Taguchi method by fuzzy multiple attribute decision making
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Tong, LI; Su, CT |
| 國立交通大學 |
2014-12-08T15:01:17Z |
A neural network-based procedure for the process monitoring of clustered defects in integrated circuit fabrication
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Su, CT; Tong, LI |
| 義守大學 |
2005-06 |
Forecasting field failure data for repairable systems using neural networks and SARIMA model
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Tong LI; Liang YH |
Showing items 11-22 of 22 (1 Page(s) Totally)
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