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Showing items 1-7 of 7 (1 Page(s) Totally)
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| 國立成功大學 |
2023-01-09 |
模擬貝爾不定域相關性之古典通訊成本
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蔡柏安; Tsai, Bo-An |
| 國立交通大學 |
2017-04-21T06:49:28Z |
Low-temperature Microwave Annealing Processes for Future IC Fabrication
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Lee, Yao-Len; Tsai, Bo-An; Cho, Ta-Chun; Hsueh, Fu-Kuo; Sung, Po-Jung; Lai, Chiung-Hui; Luo, Chih-Wei; Chao, Tien-Sheng |
| 國立交通大學 |
2014-12-12T02:39:50Z |
低溫微波退火在互補式金氧半場效電晶體之研究
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蔡博安; Tsai, Bo-An; 李耀仁; 羅志偉; Lee, Yao-Jen; Luo, Chih-Wei |
| 國立交通大學 |
2014-12-08T15:43:49Z |
Using spike-anneal to reduce interfacial layer thickness and leakage current in metal-oxide-semiconductor devices with TaN/Atomic layer deposition-grown HfAlO/chemical oxide/Si structure
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Tsai, Bo-An; Lee, Yao-Jen; Peng, Hsin-Yi; Tzeng, Pei-Jer; Luo, Chih-wei; Chang-Liao, Kuei-Shu |
| 國立交通大學 |
2014-12-08T15:32:16Z |
Low-Temperature Microwave Annealing for MOSFETs With High-k/Metal Gate Stacks
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Lee, Yao-Jen; Tsai, Bo-An; Lai, Chiung-Hui; Chen, Zheng-Yao; Hsueh, Fu-Kuo; Sung, Po-Jung; Current, Michael I.; Luo, Chih-Wei |
| 國立交通大學 |
2014-12-08T15:24:06Z |
Low-Temperature Microwave Annealing Process for Dopant Activation and Thermal Stability of TiN Material
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Tsai, Bo-An; Lai, Chiung-Hui; Lee, Bo-Shiun; Luo, Chih-Wei; Lee, Yao-Jen |
| 國立成功大學 |
2006-07-05 |
使用音射原理的簡易型部分放電檢測器
|
蔡博安; Tsai, Bo-An |
Showing items 1-7 of 7 (1 Page(s) Totally)
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