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"tsai c"的相關文件
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| 國立成功大學 |
2016-08 |
INAPPROPRIATE USE OF URINARY CATHETERS AMONG HOSPITALIZED ELDERLY PATIENTS
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Hu, F; Tsai, C.; Chen, C.; Chang, C. |
| 國立交通大學 |
2014-12-08T15:46:59Z |
The effect of native oxide on epitaxial SiGe from deposited amorphous Ge on Si
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Wu, YH; Chen, WJ; Chin, A; Tsai, C |
| 國立交通大學 |
2014-12-08T15:46:45Z |
Deuterium effect on stress-induced leakage current
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Lin, BC; Cheng, YC; Chin, A; Wang, T; Tsai, C |
| 國立交通大學 |
2014-12-08T15:46:38Z |
Electrical characterization of Al2O3 on Si from thermally oxidized AlAs and Al
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Liao, CC; Chin, A; Tsai, C |
| 國立交通大學 |
2014-12-08T15:46:38Z |
Improved electrical characteristics of CoSi2 using HF-vapor pretreatment
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Wu, YH; Chen, WJ; Chang, SL; Chin, A; Gwo, S; Tsai, C |
| 國立交通大學 |
2014-12-08T15:46:32Z |
The leakage current effect of thin gate oxides (2.4-2.7 nm) with in situ native oxide desorption
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Lai, JM; Chieng, WH; Lin, BC; Chin, A; Tsai, C |
| 國立交通大學 |
2014-12-08T15:46:25Z |
Improved electrical characteristics of CoSi2 using HF-vapor pretreatment
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Wu, YH; Chen, WJ; Chang, SL; Chin, A; Gwo, S; Tsai, C |
| 國立交通大學 |
2014-12-08T15:27:49Z |
Ultra-thin oxide with atomically smooth interfaces
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Chin, A; Chen, WJ; Kao, RH; Lin, BC; Chang, T; Tsai, C; Huang, JCM |
| 國立交通大學 |
2014-12-08T15:27:15Z |
Mobility and oxide breakdown behavior in ultra-this oxide with atomically smooth interface
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Cheng, YC; Chen, WJ; Lin, BC; Tsai, C; Chin, A |
| 國立交通大學 |
2014-12-08T15:06:31Z |
BREAKDOWN-INITIATED NEGATIVE-RESISTANCE DEVICE WITH MOST-TRANSISTOR STRUCTURE
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YU, GJ; TSAI, C; YU, SY |
顯示項目 26-35 / 79 (共8頁)
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