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机构	日期	题名	作者
臺大學術典藏	2016	Reduced incidence of interstitial pneumonitis after Allogeneic hematopoietic stem cell transplantation using a modified technique of total body irradiation	Tsay W.; Cheng C.-L.; Chen C.-Y.; Chou S.-C.; Chiang Y.; Tsai C.-H.; Kuo S.-H.; Liu C.-Y.; Yao M.; Li C.-C.; SHANG-YI HUANG; Ko B.-S.; Lin C.-T.; Hou H.-A.; Chou W.-C.; Liu J.-H.; Lin C.-C.; Wu S.-J.; Hsu S.-C.; Chen Y.-C.; Lin K.-H.; Lin D.-T.; Chou H.-T.; Lu M.-Y.; Yang Y.-L.; Chang H.-H.; Liu M.-C.; Liao X.-W.; Wu J.-K.; Tien H.-F.; Tang J.-L.; Chen Y.-H.
臺大學術典藏	2016	Genetic alterations and their clinical implications in older patients with acute myeloid leukemia	Tsai C.-H.; Hou H.-A.; Tang J.-L.; Liu C.-Y.; Lin C.-C.; Chou W.-C.; Tseng M.-H.; Chiang Y.-C.; Kuo Y.-Y.; Liu M.-C.; Liu C.-W.; Lin L.-I.; Tsay W.; Yao M.; Li C.-C.; SHANG-YI HUANG; Ko B.-S.; Hsu S.-C.; Chen C.-Y.; Lin C.-T.; Wu S.-J.; Tien H.-F.
國立交通大學	2015-12-02T03:01:00Z	DYNAMIC ANALYSIS OF HULA HOOP MOTION AND OPTIMIZED ENERGY HARVEST CIRCUIT	Huang, T. -C.; Chao, Paul C. -P.; Chen, W. -D.; Tsai, C. -H.; Lu, C. X.; Sung, C. K.
國立成功大學	2015-09	Numerical simulation of potential inundation in a coastal zone	Chen, C-N.; Tsai, C-H.; Wu, M-H.; Tsai, C-T.
國立臺灣科技大學	2015	The application of Cu-Ag submicron composite particles in microelectronic bonding	Hsiao, C.-H.;Wu, J.-S.;Tsai, C.-H.;Chen, S.-Y.;Song, J.-M.
國立臺灣科技大學	2015	Effect of Ag Templates on the Formation of Au-Ag Hollow/Core-Shell Nanostructures	Tsai, C.-H.;Chen, S.-Y.;Song, J.-M.;Haruta, M.;Kurata, H.
國立臺灣科技大學	2015	Spontaneous growth of ultra-thin titanium oxides shell on Ag nanowires: an electron energy loss spectroscope observation	Tsai, C.-H.;Chen, S.-Y.;Song, J.-M.;Gloter, A.
國立臺灣大學	2015	TET2 ALTERATIONS IN TAIWANESE CHILDHOOD ACUTE MYELOID LEUKEMIA	Li, M. J.; Lin, D. T.; Tsai, F. J.; Tsai, C. H.; Peng, C. T.; 李孟儒; 林東燦
臺大學術典藏	2015	Combination of feature engineering and ranking models for paper-author identification in KDD Cup 2013	Su, Y.-C.; Lin, T.-W.; Tsai, C.-H.; Chang, W.-C.; Huang, K.-H.; Kuo, T.-M.; Lin, S.-W.; Lin, Y.-S.; Lu, Y.-C.; Yang, C.-P.; Chang, C.-X.; Chin, W.-S.; Juan, Y.-C.; Tung, H.-Y.; Wang, J.-P.; Wei, C.-K.; Wu, F.; Yin, T.-C.; Yu, T.; Zhuang, Y.; Lin, S.-D.; Lin, H.-T.; Lin, C.-J.; Li, C.-L.; SHOU-DE LIN et al.
國立交通大學	2014-12-08T15:48:25Z	The ballistic transport and reliability of the SOI and strained-SOI nMOSFETs with 65nm node and beyond technology	Hsieh, E. R.; Chang, Derrick W.; Chung, S. S.; Lin, Y. H.; Tsai, C. H.; Tsai, C. T.; Ma, G. H.
國立交通大學	2014-12-08T15:48:21Z	New Observation of an Abnormal Leakage Current in Advanced CMOS Devices with Short Channel Lengths Down to 50nm and Beyond	Hsieh, E. R.; Chung, Steve S.; Lin, Y. H.; Tsai, C. H.; Liu, P. W.; Tsai, C. T.; Ma, G. H.; Chien, S. C.; Sun, S. W.
國立交通大學	2014-12-08T15:45:53Z	More Strain and Less Stress- The Guideline for Developing High-End Strained CMOS Technologies with Acceptable Reliability	Chung, Steve S.; Hsieh, E. R.; Huang, D. C.; Lai, C. S.; Tsai, C. H.; Liu, P. W.; Lin, Y. H.; Tsai, C. T.; Ma, G. H.; Chien, S. C.; Sun, S. W.
國立交通大學	2014-12-08T15:39:25Z	The Understanding of Strain-Induced Device Degradation in Advanced MOSFETs with Process-Induced Strain Technology of 65nm Node and Beyond	Lin, M. H.; Hsieh, E. R.; Chung, Steve S.; Tsai, C. H.; Liu, P. W.; Lin, Y. H.; Tsai, C. T.; Ma, G. H.
國立交通大學	2014-12-08T15:33:43Z	The improvement of catalytic efficiency by optimizing Pt on carbon cloth as a cathode of a microbial fuel cell	Yen, S. J.; Tsai, M. C.; Wang, Z. C.; Peng, H. L.; Tsai, C. H.; Yew, T. R.
國立交通大學	2014-12-08T15:32:43Z	The Understanding of the Bulk Trigate MOSFET's Reliability Through the Manipulation of RTN Traps	Hsieh, E. R.; Wu, P. C.; Chung, Steve S.; Tsai, C. H.; Huang, R. M.; Tsai, C. T.
國立交通大學	2014-12-08T15:30:46Z	The Understanding of Multi-level RTN in Trigate MOSFETs Through the 2D Profiling of Traps and Its Impact on SRAM Performance: A New Failure Mechanism Found	Hsieh, E. R.; Tsai, Y. L.; Chung, Steve S.; Tsai, C. H.; Huang, R. M.; Tsai, C. T.
國立交通大學	2014-12-08T15:29:21Z	A Full-Color, White Light Emission of Quantum-Dot-Based Display Technology Using Pulsed Spray Method with Distributed Bragg Reflector	Chen, K. J.; Chen, H. C.; Lin, C. C.; Tsai, H. H.; Tsai, K. A.; Chien, S. H.; Hsu, Y. J.; Shih, M. H.; Kuo, H. C.; Tsai, C. H.; Shih, H. H.
國立交通大學	2014-12-08T15:28:02Z	Suppressing Device Variability by Cryogenic Implant for 28-nm Low-Power SoC Applications	Yang, C. L.; Tsai, C. H.; Li, C. I.; Tzeng, C. Y.; Lin, G. P.; Chen, W. J.; Chin, Y. L.; Liao, C. I.; Chan, M.; Wu, J. Y.; Hsieh, E. R.; Guo, B. N.; Lu, S.; Colombeau, B.; Chung, S. S.; Chen, I. C.
國立交通大學	2014-12-08T15:24:57Z	New observations on the uniaxial and biaxial strain-induced hot carrier and NBTI Reliabilities for 65nm node CMOS devices and beyond	Chung, Steve S.; Huang, D. C.; Tsai, Y. J.; Lai, C. S.; Tsai, C. H.; Liu, P. W.; Lin, Y. H.; Tsai, C. T.; Ma, G. H.; Chien, S. C.; Sun, S. W.
國立交通大學	2014-12-08T15:24:17Z	Optimal design of ITO/organic photonic crystals in polymer light-emitting diodes with sidewall reflectors for high efficiency	Tsai, C. H.; Chao, Paul C. -P.
國立交通大學	2014-12-08T15:22:44Z	Effect of nanomechanical and microstructural properties on annealed multilayer Si0.8Ge0.2-Si films	Lin, T. -Y.; Tsai, C. -H.; Yau, W. -H.; Chou, C. -P.
國立交通大學	2014-12-08T15:22:00Z	A New Observation of Strain-Induced Slow Traps in Advanced CMOS Technology with Process-Induced Strain Using Random Telegraph Noise Measurement	Lin, M. H.; Hsieh, E. R.; Chung, Steve S.; Tsai, C. H.; Liu, P. W.; Lin, Y. H.; Tsai, C. T.; Ma, G. H.
國立交通大學	2014-12-08T15:21:56Z	Design of High-Performance and Highly Reliable nMOSFETs with Embedded Si:C S/D Extension Stressor(Si:C S/D-E)	Chung, Steve S.; Hsieh, E. R.; Liu, P. W.; Chiang, W. T.; Tsai, S. H.; Tsai, T. L.; Huang, R. M.; Tsai, C. H.; Teng, W. Y.; Li, C. I.; Kuo, T. F.; Wang, Y. R.; Yang, C. L.; Tsai, C. T.; Ma, G. H.; Chien, S. C.; Sun, S. W.
國立交通大學	2014-12-08T15:21:21Z	A New and Simple Experimental Approach to Characterizing the Carrier Transport and Reliability of Strained CMOS Devices in the Quasi-Ballistic Regime	Hsieh, E. R.; Chung, Steve S.; Liu, P. W.; Chiang, W. T.; Tsai, C. H.; Teng, W. Y.; Li, C. I.; Kuo, T. F.; Wang, Y. R.; Yang, C. L.; Tsai, C. T.; Ma, G. H.
國立交通大學	2014-12-08T15:20:29Z	New Observations on the Physical Mechanism of Vth-Variation in Nanoscale CMOS Devices After Long Term Stress	Hsieh, E. R.; Chung, Steve S.; Tsai, C. H.; Huang, R. M.; Tsai, C. T.; Liang, C. W.

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