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显示项目 936-945 / 1146 (共115页)
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机构 日期 题名 作者
國立交通大學 2014-12-08T15:48:21Z New Observation of an Abnormal Leakage Current in Advanced CMOS Devices with Short Channel Lengths Down to 50nm and Beyond Hsieh, E. R.; Chung, Steve S.; Lin, Y. H.; Tsai, C. H.; Liu, P. W.; Tsai, C. T.; Ma, G. H.; Chien, S. C.; Sun, S. W.
國立交通大學 2014-12-08T15:45:53Z More Strain and Less Stress- The Guideline for Developing High-End Strained CMOS Technologies with Acceptable Reliability Chung, Steve S.; Hsieh, E. R.; Huang, D. C.; Lai, C. S.; Tsai, C. H.; Liu, P. W.; Lin, Y. H.; Tsai, C. T.; Ma, G. H.; Chien, S. C.; Sun, S. W.
國立交通大學 2014-12-08T15:39:25Z The Understanding of Strain-Induced Device Degradation in Advanced MOSFETs with Process-Induced Strain Technology of 65nm Node and Beyond Lin, M. H.; Hsieh, E. R.; Chung, Steve S.; Tsai, C. H.; Liu, P. W.; Lin, Y. H.; Tsai, C. T.; Ma, G. H.
國立交通大學 2014-12-08T15:33:43Z The improvement of catalytic efficiency by optimizing Pt on carbon cloth as a cathode of a microbial fuel cell Yen, S. J.; Tsai, M. C.; Wang, Z. C.; Peng, H. L.; Tsai, C. H.; Yew, T. R.
國立交通大學 2014-12-08T15:32:43Z The Understanding of the Bulk Trigate MOSFET's Reliability Through the Manipulation of RTN Traps Hsieh, E. R.; Wu, P. C.; Chung, Steve S.; Tsai, C. H.; Huang, R. M.; Tsai, C. T.
國立交通大學 2014-12-08T15:30:46Z The Understanding of Multi-level RTN in Trigate MOSFETs Through the 2D Profiling of Traps and Its Impact on SRAM Performance: A New Failure Mechanism Found Hsieh, E. R.; Tsai, Y. L.; Chung, Steve S.; Tsai, C. H.; Huang, R. M.; Tsai, C. T.
國立交通大學 2014-12-08T15:29:21Z A Full-Color, White Light Emission of Quantum-Dot-Based Display Technology Using Pulsed Spray Method with Distributed Bragg Reflector Chen, K. J.; Chen, H. C.; Lin, C. C.; Tsai, H. H.; Tsai, K. A.; Chien, S. H.; Hsu, Y. J.; Shih, M. H.; Kuo, H. C.; Tsai, C. H.; Shih, H. H.
國立交通大學 2014-12-08T15:28:02Z Suppressing Device Variability by Cryogenic Implant for 28-nm Low-Power SoC Applications Yang, C. L.; Tsai, C. H.; Li, C. I.; Tzeng, C. Y.; Lin, G. P.; Chen, W. J.; Chin, Y. L.; Liao, C. I.; Chan, M.; Wu, J. Y.; Hsieh, E. R.; Guo, B. N.; Lu, S.; Colombeau, B.; Chung, S. S.; Chen, I. C.
國立交通大學 2014-12-08T15:24:57Z New observations on the uniaxial and biaxial strain-induced hot carrier and NBTI Reliabilities for 65nm node CMOS devices and beyond Chung, Steve S.; Huang, D. C.; Tsai, Y. J.; Lai, C. S.; Tsai, C. H.; Liu, P. W.; Lin, Y. H.; Tsai, C. T.; Ma, G. H.; Chien, S. C.; Sun, S. W.
國立交通大學 2014-12-08T15:24:17Z Optimal design of ITO/organic photonic crystals in polymer light-emitting diodes with sidewall reflectors for high efficiency Tsai, C. H.; Chao, Paul C. -P.

显示项目 936-945 / 1146 (共115页)
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