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機構	日期	題名	作者
臺大學術典藏	2016	Spironolactone is associated with reduced risk of new-onset atrial fibrillation in patients receiving renal replacement therapy	Chung Y.-W.; Yang Y.-H.; CHO-KAI WU; Yu C.-C.; Juang J.-M.J.; Wang Y.-C.; Tsai C.-T.; Lin L.-Y.; Lai L.-P.; Hwang J.-J.; Chiang F.-T.; Chen P.-C.; Lin J.-L.
臺大學術典藏	2016	Genome-wide screening identifies a KCNIP1 copy number variant as a genetic predictor for atrial fibrillation	Tsai C.-T.; Hsieh C.-S.; Chang S.-N.; Chuang E.Y.; Ueng K.-C.; Tsai C.-F.; Lin T.-H.; Wu C.-K.; Lee J.-K.; Lin L.-Y.; Wang Y.-C.; CHIH-CHIEH YU; Lai L.-P.; Tseng C.-D.; Hwang J.-J.; Chiang F.-T.; Lin J.-L.
國立交通大學	2015-12-02T03:00:54Z	The Observation of BTI-induced RTN Traps in Inversion and Accumulation Modes on HfO2 High-k Metal Gate 28nm CMOS Devices	Wu, P. C.; Hsieh, E. R.; Lu, P. Y.; Chung, Steve S.; Chang, K. Y.; Liu, C. H.; Ke, J. C.; Yang, C. W.; Tsai, C. T.
國立成功大學	2015-09	Numerical simulation of potential inundation in a coastal zone	Chen, C-N.; Tsai, C-H.; Wu, M-H.; Tsai, C-T.
國立臺灣大學	2015-09	論外大陸礁層的自然延伸原則：以2012年ITLOS孟加拉v.緬甸海域劃界案為中心	蔡季廷; Tsai, C.T.
國立交通大學	2015-07-21T08:31:06Z	Gate Current Variation: A New Theory and Practice on Investigating the Off-State Leakage of Trigate MOSFETs and the Power Dissipation of SRAM	Hsieh, E. R.; Lin, S. T.; Chung, Steve S.; Huang, R. M.; Tsai, C. T.; Jung, L. T.
國立臺灣大學	2015	Statin use reduces the risk of dementia in elderly patients: a nationwide data survey and propensity analysis	Wu, C. -K.; Yang, Y. -H.; Lin, T. -T.; Tsai, C. -T.; Hwang, J. -J.; Lin, J. -L.; Chen, P. -C.; Chiang, F. -T.; Lin, L. -Y.; 林亮宇; 陳保中; 林俊立; 江福田; 吳卓鍇; 黃瑞仁; 蔡佳醍
臺大學術典藏	2015	Statin therapy lowers the risk of new-onset atrial fibrillation in patients with end-stage renal disease	Ho L.-T.; Lin L.-Y.; Yang Y.-H.; Wu C.-K.; Juang J.-M.J.; YI-CHIH WANG; Tsai C.-T.; Lai L.-P.; Hwang J.-J.; Chiang F.-T.; Lin J.-L.; Chen P.-C.
臺大學術典藏	2015	Aldosterone impairs vascular smooth muscle function: From clinical to bench research	Chou C.-H.; Chen Y.-H.; Hung C.-S.; Chang Y.-Y.; Tzeng Y.-L.; Wu X.-M.; Wu V.-C.; Tsai C.-T.; CHO-KAI WU; Ho Y.-L.; Wu K.-D.; Lin Y.-H.
臺大學術典藏	2015	Statin use reduces the risk of dementia in elderly patients: A nationwide data survey and propensity analysis	CHO-KAI WU; Yang Y.-H.; Lin T.-T.; Tsai C.-T.; Hwang J.-J.; Lin J.-L.; Chen P.-C.; Chiang F.-T.; Lin L.-Y.
臺大學術典藏	2015	Unique clinical characteristics and SCN5A mutations in patients with Brugada syndrome in Taiwan	Lai L.-P.; Yeh H.-M.; Sherri Yeh S.-F.; Chiang F.-T.; Tseng C.-D.; Chen W.-J.; Chiu F.-C.; Chen J.-J.; JYH-MING JIMMY JUANG; Tsai C.-T.; Lin L.-Y.; Liu Y.-B.; Yu C.-C.; Hwang J.-J.; Lin J.-L.
臺大學術典藏	2015	Statin therapy lowers the risk of new-onset atrial fibrillation in patients with end-stage renal disease	Ho L.-T.; Lin L.-Y.; Yang Y.-H.; Wu C.-K.; Juang J.-M.J.; Wang Y.-C.; Tsai C.-T.; Lai L.-P.; HWANG, JUEY-JEN; Chiang F.-T.; Lin J.-L.; Chen P.-C.
國立交通大學	2014-12-08T15:48:25Z	The ballistic transport and reliability of the SOI and strained-SOI nMOSFETs with 65nm node and beyond technology	Hsieh, E. R.; Chang, Derrick W.; Chung, S. S.; Lin, Y. H.; Tsai, C. H.; Tsai, C. T.; Ma, G. H.
國立交通大學	2014-12-08T15:48:21Z	New Observation of an Abnormal Leakage Current in Advanced CMOS Devices with Short Channel Lengths Down to 50nm and Beyond	Hsieh, E. R.; Chung, Steve S.; Lin, Y. H.; Tsai, C. H.; Liu, P. W.; Tsai, C. T.; Ma, G. H.; Chien, S. C.; Sun, S. W.
國立交通大學	2014-12-08T15:45:54Z	The Observation of Trapping and Detrapping Effects in High-k Gate Dielectric MOSFETs by a New Gate Current Random Telegraph Noise (I(G)-RTN) Approach	Chang, C. M.; Chung, Steve S.; Hsieh, Y. S.; Cheng, L. W.; Tsai, C. T.; Ma, G. H.; Chien, S. C.; Sun, S. W.
國立交通大學	2014-12-08T15:45:53Z	More Strain and Less Stress- The Guideline for Developing High-End Strained CMOS Technologies with Acceptable Reliability	Chung, Steve S.; Hsieh, E. R.; Huang, D. C.; Lai, C. S.; Tsai, C. H.; Liu, P. W.; Lin, Y. H.; Tsai, C. T.; Ma, G. H.; Chien, S. C.; Sun, S. W.
國立交通大學	2014-12-08T15:39:25Z	The Understanding of Strain-Induced Device Degradation in Advanced MOSFETs with Process-Induced Strain Technology of 65nm Node and Beyond	Lin, M. H.; Hsieh, E. R.; Chung, Steve S.; Tsai, C. H.; Liu, P. W.; Lin, Y. H.; Tsai, C. T.; Ma, G. H.
國立交通大學	2014-12-08T15:32:43Z	The Understanding of the Bulk Trigate MOSFET's Reliability Through the Manipulation of RTN Traps	Hsieh, E. R.; Wu, P. C.; Chung, Steve S.; Tsai, C. H.; Huang, R. M.; Tsai, C. T.
國立交通大學	2014-12-08T15:30:46Z	The Understanding of Multi-level RTN in Trigate MOSFETs Through the 2D Profiling of Traps and Its Impact on SRAM Performance: A New Failure Mechanism Found	Hsieh, E. R.; Tsai, Y. L.; Chung, Steve S.; Tsai, C. H.; Huang, R. M.; Tsai, C. T.
國立交通大學	2014-12-08T15:25:05Z	Effect of supercritical fluids on field emission from carbon nanotubes	Liu, P. T.; Tsai, C. T.; Kin, K. T.; Chang, P. L.; Chen, C. M.; Cheng, H. F.; Chang, T. C.
國立交通大學	2014-12-08T15:24:59Z	Twin-GD: A new twin gated-diode measurement for the interface characterization of ultra-thin gate oxide MOSFET's with EOT down to 1nm	Lee, G. D.; Chung, S. S.; Mao, A. Y.; Lin, W. M.; Yang, C. W.; Hsieh, Y. S.; Chu, K. T.; Cheng, L. W.; Tai, H.; Hsu, L. T.; Lee, C. R.; Meng, H. L.; Tsai, C. T.; Ma, G. H.; Chien, S. C.; Sun, S. W.
國立交通大學	2014-12-08T15:24:57Z	New observations on the uniaxial and biaxial strain-induced hot carrier and NBTI Reliabilities for 65nm node CMOS devices and beyond	Chung, Steve S.; Huang, D. C.; Tsai, Y. J.; Lai, C. S.; Tsai, C. H.; Liu, P. W.; Lin, Y. H.; Tsai, C. T.; Ma, G. H.; Chien, S. C.; Sun, S. W.
國立交通大學	2014-12-08T15:22:00Z	A New Observation of Strain-Induced Slow Traps in Advanced CMOS Technology with Process-Induced Strain Using Random Telegraph Noise Measurement	Lin, M. H.; Hsieh, E. R.; Chung, Steve S.; Tsai, C. H.; Liu, P. W.; Lin, Y. H.; Tsai, C. T.; Ma, G. H.
國立交通大學	2014-12-08T15:21:56Z	Design of High-Performance and Highly Reliable nMOSFETs with Embedded Si:C S/D Extension Stressor(Si:C S/D-E)	Chung, Steve S.; Hsieh, E. R.; Liu, P. W.; Chiang, W. T.; Tsai, S. H.; Tsai, T. L.; Huang, R. M.; Tsai, C. H.; Teng, W. Y.; Li, C. I.; Kuo, T. F.; Wang, Y. R.; Yang, C. L.; Tsai, C. T.; Ma, G. H.; Chien, S. C.; Sun, S. W.
國立交通大學	2014-12-08T15:21:21Z	A New and Simple Experimental Approach to Characterizing the Carrier Transport and Reliability of Strained CMOS Devices in the Quasi-Ballistic Regime	Hsieh, E. R.; Chung, Steve S.; Liu, P. W.; Chiang, W. T.; Tsai, C. H.; Teng, W. Y.; Li, C. I.; Kuo, T. F.; Wang, Y. R.; Yang, C. L.; Tsai, C. T.; Ma, G. H.

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