| 國立交通大學 |
2015-07-21T08:31:06Z |
Gate Current Variation: A New Theory and Practice on Investigating the Off-State Leakage of Trigate MOSFETs and the Power Dissipation of SRAM
|
Hsieh, E. R.; Lin, S. T.; Chung, Steve S.; Huang, R. M.; Tsai, C. T.; Jung, L. T. |
| 國立臺灣大學 |
2015 |
Statin use reduces the risk of dementia in elderly patients: a nationwide data survey and propensity analysis
|
Wu, C. -K.; Yang, Y. -H.; Lin, T. -T.; Tsai, C. -T.; Hwang, J. -J.; Lin, J. -L.; Chen, P. -C.; Chiang, F. -T.; Lin, L. -Y.; 林亮宇; 陳保中; 林俊立; 江福田; 吳卓鍇; 黃瑞仁; 蔡佳醍 |
| 臺大學術典藏 |
2015 |
Statin therapy lowers the risk of new-onset atrial fibrillation in patients with end-stage renal disease
|
Ho L.-T.; Lin L.-Y.; Yang Y.-H.; Wu C.-K.; Juang J.-M.J.; YI-CHIH WANG; Tsai C.-T.; Lai L.-P.; Hwang J.-J.; Chiang F.-T.; Lin J.-L.; Chen P.-C. |
| 臺大學術典藏 |
2015 |
Aldosterone impairs vascular smooth muscle function: From clinical to bench research
|
Chou C.-H.; Chen Y.-H.; Hung C.-S.; Chang Y.-Y.; Tzeng Y.-L.; Wu X.-M.; Wu V.-C.; Tsai C.-T.; CHO-KAI WU; Ho Y.-L.; Wu K.-D.; Lin Y.-H. |
| 臺大學術典藏 |
2015 |
Statin use reduces the risk of dementia in elderly patients: A nationwide data survey and propensity analysis
|
CHO-KAI WU; Yang Y.-H.; Lin T.-T.; Tsai C.-T.; Hwang J.-J.; Lin J.-L.; Chen P.-C.; Chiang F.-T.; Lin L.-Y. |
| 臺大學術典藏 |
2015 |
Unique clinical characteristics and SCN5A mutations in patients with Brugada syndrome in Taiwan
|
Lai L.-P.; Yeh H.-M.; Sherri Yeh S.-F.; Chiang F.-T.; Tseng C.-D.; Chen W.-J.; Chiu F.-C.; Chen J.-J.; JYH-MING JIMMY JUANG; Tsai C.-T.; Lin L.-Y.; Liu Y.-B.; Yu C.-C.; Hwang J.-J.; Lin J.-L. |
| 臺大學術典藏 |
2015 |
Statin therapy lowers the risk of new-onset atrial fibrillation in patients with end-stage renal disease
|
Ho L.-T.; Lin L.-Y.; Yang Y.-H.; Wu C.-K.; Juang J.-M.J.; Wang Y.-C.; Tsai C.-T.; Lai L.-P.; HWANG, JUEY-JEN; Chiang F.-T.; Lin J.-L.; Chen P.-C. |
| 國立交通大學 |
2014-12-08T15:48:25Z |
The ballistic transport and reliability of the SOI and strained-SOI nMOSFETs with 65nm node and beyond technology
|
Hsieh, E. R.; Chang, Derrick W.; Chung, S. S.; Lin, Y. H.; Tsai, C. H.; Tsai, C. T.; Ma, G. H. |
| 國立交通大學 |
2014-12-08T15:48:21Z |
New Observation of an Abnormal Leakage Current in Advanced CMOS Devices with Short Channel Lengths Down to 50nm and Beyond
|
Hsieh, E. R.; Chung, Steve S.; Lin, Y. H.; Tsai, C. H.; Liu, P. W.; Tsai, C. T.; Ma, G. H.; Chien, S. C.; Sun, S. W. |
| 國立交通大學 |
2014-12-08T15:45:54Z |
The Observation of Trapping and Detrapping Effects in High-k Gate Dielectric MOSFETs by a New Gate Current Random Telegraph Noise (I(G)-RTN) Approach
|
Chang, C. M.; Chung, Steve S.; Hsieh, Y. S.; Cheng, L. W.; Tsai, C. T.; Ma, G. H.; Chien, S. C.; Sun, S. W. |
