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"tsai c t"的相关文件
显示项目 776-785 / 868 (共87页)
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| 臺大學術典藏 |
2015 |
Unique clinical characteristics and SCN5A mutations in patients with Brugada syndrome in Taiwan
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Lai L.-P.; Yeh H.-M.; Sherri Yeh S.-F.; Chiang F.-T.; Tseng C.-D.; Chen W.-J.; Chiu F.-C.; Chen J.-J.; JYH-MING JIMMY JUANG; Tsai C.-T.; Lin L.-Y.; Liu Y.-B.; Yu C.-C.; Hwang J.-J.; Lin J.-L. |
| 臺大學術典藏 |
2015 |
Statin therapy lowers the risk of new-onset atrial fibrillation in patients with end-stage renal disease
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Ho L.-T.; Lin L.-Y.; Yang Y.-H.; Wu C.-K.; Juang J.-M.J.; Wang Y.-C.; Tsai C.-T.; Lai L.-P.; HWANG, JUEY-JEN; Chiang F.-T.; Lin J.-L.; Chen P.-C. |
| 國立交通大學 |
2014-12-08T15:48:25Z |
The ballistic transport and reliability of the SOI and strained-SOI nMOSFETs with 65nm node and beyond technology
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Hsieh, E. R.; Chang, Derrick W.; Chung, S. S.; Lin, Y. H.; Tsai, C. H.; Tsai, C. T.; Ma, G. H. |
| 國立交通大學 |
2014-12-08T15:48:21Z |
New Observation of an Abnormal Leakage Current in Advanced CMOS Devices with Short Channel Lengths Down to 50nm and Beyond
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Hsieh, E. R.; Chung, Steve S.; Lin, Y. H.; Tsai, C. H.; Liu, P. W.; Tsai, C. T.; Ma, G. H.; Chien, S. C.; Sun, S. W. |
| 國立交通大學 |
2014-12-08T15:45:54Z |
The Observation of Trapping and Detrapping Effects in High-k Gate Dielectric MOSFETs by a New Gate Current Random Telegraph Noise (I(G)-RTN) Approach
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Chang, C. M.; Chung, Steve S.; Hsieh, Y. S.; Cheng, L. W.; Tsai, C. T.; Ma, G. H.; Chien, S. C.; Sun, S. W. |
| 國立交通大學 |
2014-12-08T15:45:53Z |
More Strain and Less Stress- The Guideline for Developing High-End Strained CMOS Technologies with Acceptable Reliability
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Chung, Steve S.; Hsieh, E. R.; Huang, D. C.; Lai, C. S.; Tsai, C. H.; Liu, P. W.; Lin, Y. H.; Tsai, C. T.; Ma, G. H.; Chien, S. C.; Sun, S. W. |
| 國立交通大學 |
2014-12-08T15:39:25Z |
The Understanding of Strain-Induced Device Degradation in Advanced MOSFETs with Process-Induced Strain Technology of 65nm Node and Beyond
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Lin, M. H.; Hsieh, E. R.; Chung, Steve S.; Tsai, C. H.; Liu, P. W.; Lin, Y. H.; Tsai, C. T.; Ma, G. H. |
| 國立交通大學 |
2014-12-08T15:32:43Z |
The Understanding of the Bulk Trigate MOSFET's Reliability Through the Manipulation of RTN Traps
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Hsieh, E. R.; Wu, P. C.; Chung, Steve S.; Tsai, C. H.; Huang, R. M.; Tsai, C. T. |
| 國立交通大學 |
2014-12-08T15:30:46Z |
The Understanding of Multi-level RTN in Trigate MOSFETs Through the 2D Profiling of Traps and Its Impact on SRAM Performance: A New Failure Mechanism Found
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Hsieh, E. R.; Tsai, Y. L.; Chung, Steve S.; Tsai, C. H.; Huang, R. M.; Tsai, C. T. |
| 國立交通大學 |
2014-12-08T15:25:05Z |
Effect of supercritical fluids on field emission from carbon nanotubes
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Liu, P. T.; Tsai, C. T.; Kin, K. T.; Chang, P. L.; Chen, C. M.; Cheng, H. F.; Chang, T. C. |
显示项目 776-785 / 868 (共87页)
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