|
"tsai c y"的相關文件
顯示項目 551-560 / 757 (共76頁)
<< < 51 52 53 54 55 56 57 58 59 60 > >>
每頁顯示[10|25|50]項目
| 國立交通大學 |
2014-12-08T15:23:05Z |
Size-Dependent Trapping Effect in Nano-Dot Non-Volatile Memory
|
Tsai, C. Y.; Cheng, C. H.; Chang, T. Y.; Chou, K. Y.; Chin, Albert; Yeh, F. S. |
| 國立交通大學 |
2014-12-08T15:21:34Z |
High-Performance Charge-Trapping Flash Memory Device With an Ultrathin 2.5-nm Equivalent-Si(3)N(4)-Thickness Trapping Layer
|
Tsai, C. Y.; Chin, Albert |
| 國立交通大學 |
2014-12-08T15:21:10Z |
High-Performance GaN MOSFET With High-k LaAlO(3)/SiO(2) Gate Dielectric
|
Tsai, C. Y.; Wu, T. L.; Chin, Albert |
| 國立交通大學 |
2014-12-08T15:12:24Z |
Development of new features of ant colony optimization for flowshop scheduling
|
Lin, B. M. T.; Lu, C. Y.; Shyu, S. J.; Tsai, C. Y. |
| 國立交通大學 |
2014-12-08T15:12:03Z |
Arsenic-Implanted HfON Charge-Trapping Flash Memory With Large Memory Window and Good Retention
|
Tsai, C. Y.; Lee, T. H.; Chin, Albert |
| 國立交通大學 |
2014-12-08T15:09:37Z |
Corrosion behaviors of austenitic Fe-30Mn-7Al-xCr-1C alloys in 3.5% NaCl solution
|
Tuan, Y. H.; Wang, C. S.; Tsai, C. Y.; Chao, C. G.; Liu, T. F. |
| 國立交通大學 |
2014-12-08T15:06:39Z |
Improved Capacitance Density and Reliability of High-k Ni/ZrO(2)/TiN MIM Capacitors Using Laser-Annealing Technique
|
Tsai, C. Y.; Chiang, K. C.; Lin, S. H.; Hsu, K. C.; Chi, C. C.; Chin, Albert |
| 元智大學 |
2014-1-1 |
Paternalistic leadership in four East Asian societies: Generalizability and cultural differences of the triad model
|
Cheng, B. S.; Boer, D.; Chou, L. F.; Huang M.-P.; Yoneyama, S.; Shim, D.; Sun, J. M.; Lin, T. T.; Chou, W. J.; Tsai, C. Y. |
| 國立臺灣科技大學 |
2014 |
A study of sinusoidal-excited wall charge behavior in EEFL by parallel-loaded series resonance
|
Hsieh, G.-C.;Tsai, C.-Y. |
| 國立臺灣科技大學 |
2014 |
Photovoltaic burp charge system on energy-saving configuration by smart charge management
|
Hsieh, H.-I.;Tsai, C.-Y.;Hsieh, G.-C. |
顯示項目 551-560 / 757 (共76頁)
<< < 51 52 53 54 55 56 57 58 59 60 > >>
每頁顯示[10|25|50]項目
|
