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Showing items 1-18 of 18 (1 Page(s) Totally)
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| 國立交通大學 |
2019-04-02T06:04:53Z |
Analysis and Solution to Overcome EOS Failure Induced by Latchup Test in A High-Voltage Integrated Circuits
|
Tsai, Hui-Wen; Ker, Ming-Dou; Liu, Yi-Sheng; Chuang, Ming-Nan |
| 東海大學 |
2019 |
激勵形式對工作滿意度及組織認同感之影響
|
蔡慧紋; TSAI, HUI-WEN |
| 國立交通大學 |
2017-04-21T06:49:51Z |
Improve Latch-up Immunity by Circuit Solution
|
Tsai, Hui-Wen; Ker, Ming-Dou |
| 國立交通大學 |
2017-04-21T06:49:05Z |
Compensation Circuit with Additional Junction Sensor to Enhance Latchup Immunity for CMOS Integrated Circuits
|
Tsai, Hui-Wen; Ker, Ming-Dou |
| 國立臺灣大學 |
2016 |
論我國都市更新條例之相關問題
|
蔡慧雯; Tsai, Hui-Wen |
| 國立交通大學 |
2015-12-04T07:03:17Z |
ACTIVE GUARD RING STRUCTURE TO IMPROVE LATCH-UP IMMUNITY
|
KER MING-DOU; TSAI HUI-WEN |
| 國立交通大學 |
2015-12-02T02:59:12Z |
Latch-Up Protection Design With Corresponding Complementary Current to Suppress the Effect of External Current Triggers
|
Tsai, Hui-Wen; Ker, Ming-Dou |
| 國立交通大學 |
2015-11-26T00:55:39Z |
提升積體電路栓鎖防疫能力之設計方法與實現
|
蔡惠雯; Tsai, Hui-Wen; 柯明道; Ker, Ming-Dou |
| 國立交通大學 |
2015-07-21T11:21:14Z |
Active Guard Ring to Improve Latch-Up Immunity
|
Tsai, Hui-Wen; Ker, Ming-Dou |
| 淡江大學 |
2015 |
新北市國民小學行政人員校園危機管理認知與實際作為之研究
|
蔡惠雯;Tsai, Hui-Wen |
| 國立交通大學 |
2014-12-08T15:35:55Z |
Layout Consideration and Circuit Solution to Prevent EOS Failure Induced by Latchup Test in a High-Voltage Integrated Circuits
|
Tsai, Hui-Wen; Ker, Ming-Dou |
| 國立交通大學 |
2014-12-08T15:33:13Z |
Analysis and Solution to Overcome EOS Failure Induced by Latchup Test in A High-Voltage Integrated Circuits
|
Tsai, Hui-Wen; Ker, Ming-Dou; Liu, Yi-Sheng; Chuang, Ming-Nan |
| 國立交通大學 |
2014-12-08T15:13:13Z |
Design of 2xVDD-tolerant I/O buffer with considerations of gate-oxide reliability and hot-carrier degradation
|
Tsai, Hui-Wen; Ker, Ming-Dou |
| 國立交通大學 |
2014-12-08T15:11:39Z |
Design to suppress return-back leakage current of charge pump circuit in low-voltage CMOS process
|
Weng, Yi-Hsin; Tsai, Hui-Wen; Ker, Ming-Dou |
| 國立交通大學 |
2014-12-08T15:07:59Z |
Design of 2xVDD-tolerant mixed-voltage I/O buffer against gate-oxide reliability and hot-carrier degradation
|
Tsai, Hui-Wen; Ker, Ming-Dou |
| 國立成功大學 |
2011-02-08 |
日治時期臺灣北部民間借貸利率研究—— 以《新屋鄉葉氏嘗簿》為主的解讀與分析
|
蔡惠雯; Tsai, Hui-Wen |
| 南華大學 |
2011 |
兒童讀經的社會觀察－以嘉義地區的三個讀經班為例
|
蔡惠文; Tsai, Hui-wen |
| 東海大學 |
2010 |
組織配適、組織重組與策略更新─新竹商銀購併案之個案研究分析
|
蔡惠雯; Tsai, Hui-Wen |
Showing items 1-18 of 18 (1 Page(s) Totally)
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