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Showing items 11-18 of 18 (1 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:35:55Z |
Layout Consideration and Circuit Solution to Prevent EOS Failure Induced by Latchup Test in a High-Voltage Integrated Circuits
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Tsai, Hui-Wen; Ker, Ming-Dou |
| 國立交通大學 |
2014-12-08T15:33:13Z |
Analysis and Solution to Overcome EOS Failure Induced by Latchup Test in A High-Voltage Integrated Circuits
|
Tsai, Hui-Wen; Ker, Ming-Dou; Liu, Yi-Sheng; Chuang, Ming-Nan |
| 國立交通大學 |
2014-12-08T15:13:13Z |
Design of 2xVDD-tolerant I/O buffer with considerations of gate-oxide reliability and hot-carrier degradation
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Tsai, Hui-Wen; Ker, Ming-Dou |
| 國立交通大學 |
2014-12-08T15:11:39Z |
Design to suppress return-back leakage current of charge pump circuit in low-voltage CMOS process
|
Weng, Yi-Hsin; Tsai, Hui-Wen; Ker, Ming-Dou |
| 國立交通大學 |
2014-12-08T15:07:59Z |
Design of 2xVDD-tolerant mixed-voltage I/O buffer against gate-oxide reliability and hot-carrier degradation
|
Tsai, Hui-Wen; Ker, Ming-Dou |
| 國立成功大學 |
2011-02-08 |
日治時期臺灣北部民間借貸利率研究—— 以《新屋鄉葉氏嘗簿》為主的解讀與分析
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蔡惠雯; Tsai, Hui-Wen |
| 南華大學 |
2011 |
兒童讀經的社會觀察－以嘉義地區的三個讀經班為例
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蔡惠文; Tsai, Hui-wen |
| 東海大學 |
2010 |
組織配適、組織重組與策略更新─新竹商銀購併案之個案研究分析
|
蔡惠雯; Tsai, Hui-Wen |
Showing items 11-18 of 18 (1 Page(s) Totally)
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