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"tsai j l a huang k y a lai j h"
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| 東海大學 |
2002 |
Hot carrier degradation in deep sub-micron nitride spacer lightly doped drain N-channel metal-oxide-semiconductor transistors
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Tsai, J.-L.a, Huang, K.-Y.a, Lai, J.-H.b, Gong, J.a, Yang, F.-J.b, Lin, S.-Y.a |
| 東海大學 |
2002 |
The study of threshold voltage extraction of nitride spacer NMOS transistors in early stage hot carrier stress
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Tsai, J.-L.a, Huang, K.-Y.a, Lai, J.-H.a, Gong, J.a, Yang, F.-J.b, Lin, S.-Y.b |
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