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"tsai jung ruey"

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Showing items 21-30 of 40  (4 Page(s) Totally)
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Institution Date Title Author
亞洲大學 2013-10 Low-voltage high-speed programming/erasing floating-gate memory device with gate-all-around polycrystalline silicon nanowire Lee, Ko-Hui;李克慧;蔡宗叡;TSAI, JUNG-RUEY;張睿達;Chang, Ruey-Dar;林鴻志;Huang, Horng-Chih;黃調元;Tiao-Yuan, Huang
亞洲大學 2012.10 Room temperature fabricated transparent IZO thin-film transistor with a high-k gate dielectric of LaAlO3 film 蔡宗叡;TSAI, JUNG-RUEY;林文凱;Lin, Wen-Kai
亞洲大學 2012.07 Effects of Oxygen Pressure and Post-Deposition Annealing on the Characteristics of Pulsed Laser Deposited High-k Dielectric LaAlO3 Films on Indium Tin Oxide Films 蔡宗叡;TSAI, JUNG-RUEY;林文凱;Lin, Wen-Kai;馮文生;Feng, Wen-Sheng;劉國辰;Liu, Kou-Chen
亞洲大學 2012-09 Failure Analysis of Power MOSFETs based on Multi-finger Configuration under Unclamped Inductive Switching (UIS) Stress Condition 楊紹明;Yang, Shao-Ming;蔡宗叡;Tsai, Jung-Ruey;許健;Sheu, Gene
亞洲大學 2012-09 Shifting Time Waveform Induced CMOS Latch Up in Bootstrapping Technique Applications 蔡宗叡;Tsai, Jung-Ruey;許健;Sheu, Gene
亞洲大學 2012-09 Analysis of LDMOS for Effect of Fingers, Device-Width and Inductance on reverse recovery 蔡宗叡;Tsai, Jung-Ruey;楊紹明;Yang, Shao-Ming;許健;Sheu, Gene
亞洲大學 2012-08 Analysis of LDMOS for Effect of Finger and Device-width on Gate Feedback Charge 楊紹明;Yang, Shao-Ming;蔡宗叡;Tsai, Jung-Ruey;許健;Sheu, Gene
亞洲大學 2012-03 A New Methodology to Investigate the Effect of Stress and Bias on 2DEG and Drain Current of AlGaN/GaN Based Heterostructure 許健;Sheu, Gene;蔡宗叡;Tsai, Jung-Ruey;楊紹明;Yang, Shao-Ming
亞洲大學 2012-03 A New Methodology to Investigate the Effect of Stress and Bias on 2DEG and Drain Current of AlGaN-GaN Based Heterostructure 許健;Sheu, Gene;蔡宗叡;Tsai, Jung-Ruey;楊紹明;Yang, Shao-Ming
亞洲大學 2012-03 Effect of finger and device-width on ruggedness of nLDMOS device under Single-pulse Unclamped Inductive Switching (UIS) conditions 蔡宗叡;Tsai, Jung-Ruey

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