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| 國家衛生研究院 |
2021-09-26 |
Clinical and functional characterization of a novel STUB1 frameshift mutation in autosomal dominant spinocerebellar ataxia type 48 (SCA48)
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Chen, HY;Hsu, CL;Lin, HY;Lin, YF;Tsai, SF;Ho, YJ;Li, YR;Tsai, JW;Teng, SC;Lin, CH |
| 中山醫學大學 |
2021 |
Morphologic Spectrum of Lymphadenopathy in Adult-onset Immunodeficiency (Anti-interferon-gamma Autoantibodies)
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Thingujam, B; Syue, LS; Wang, RC; Chen, CJ; Yu, SC; Chen, CC; Medeiros, LJ; Liao, IC; Tsai, JW; Chang, KC |
| 國家衛生研究院 |
2020-03-31 |
Muscle atrophy-related myotube-derived exosomal microRNA in neuronal dysfunction: Targeting both coding and long noncoding RNAs
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Yang, CP;Yang, WS;Wong, YH;Wang, KH;Teng, YC;Chang, MH;Liao, KH;Nian, FS;Chao, CC;Tsai, JW;Hwang, WL;Lin, MW;Tzeng, TY;Wang, PN;Campbell, M;Chen, LK;Tsai, TF;Chang, PC;Kung, HJ |
| 國家衛生研究院 |
2020-02-21 |
WNT3A promotes neuronal regeneration upon traumatic brain injury
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Chang, CY;Liang, MZ;Wu, CC;Huang, PY;Chen, HI;Yet, SF;Tsai, JW;Kao, CF;Chen, L |
| 國立交通大學 |
2019-04-02T05:59:32Z |
Reducing threshold voltage shifts in amorphous silicon thin film transistors by hydrogenating the gate nitride prior to amorphous silicon deposition
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Tsai, JW; Huang, CY; Tai, YH; Cheng, HC; Su, FC; Luo, FC; Tuan, HC |
| 國立交通大學 |
2019-04-02T05:59:28Z |
ANOMALOUS BIAS-STRESS-INDUCED UNSTABLE PHENOMENA OF HYDROGENATED AMORPHOUS-SILICON THIN-FILM TRANSISTORS
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TAI, YH; TSAI, JW; CHENG, HC; SU, FC |
| 國立交通大學 |
2019-04-02T05:58:44Z |
The instability characteristics of amorphous silicon thin film transistors with various interfacial and bulk defect states
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Cheng, HC; Tsai, JW; Huang, CY; Luo, FC; Tuan, HC |
| 國立交通大學 |
2014-12-08T15:45:05Z |
The instability mechanisms of hydrogenated amorphous silicon thin film transistors under AC bias stress
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Huang, CY; Teng, TH; Tsai, JW; Cheng, HC |
| 國立交通大學 |
2014-12-08T15:44:45Z |
Turnaround phenomenon of threshold voltage shifts in amorphous silicon thin film transistors under negative bias stress
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Huang, CY; Tsai, JW; Teng, TH; Yang, CJ; Cheng, HC |
| 國立交通大學 |
2014-12-08T15:03:40Z |
NOVEL STRUCTURE FOR MEASURING THE DENSITY-OF-STATE DISTRIBUTION OF HIGH-RESISTIVITY SEMICONDUCTOR-FILMS BY ISOTHERMAL CAPACITANCE TRANSIENT SPECTROSCOPY
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CHEN, YE; WANG, FS; TSAI, JW; CHENG, HC |
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