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"tsai k y"的相关文件
显示项目 36-45 / 99 (共10页)
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| 臺大學術典藏 |
2020-01-17T07:45:14Z |
Void-based photonic crystal mirror with high reflectivity and low dissipation for extreme-ultraviolet radiation
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Lee, Y.-M.; Li, J.-H.; Tsai, K.-Y.; JIA-HAN LI |
| 臺大學術典藏 |
2020-01-17T07:45:13Z |
Direct-scatterometry-enabled optical-proximity-correction-model calibration
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JIA-HAN LI; Chen, A.C.; Shieh, J.J.; Li, J.-H.; Tsai, K.-Y.; Shen, Y.-T.; Liu, C.-H.; Ng, P.C.W.; Chen, C.-Y. |
| 臺大學術典藏 |
2020-01-17T07:45:12Z |
Simulation and experiment of speckle reduction by the beam splitting method on a pico-projection system
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Pei, T.-H.; Yeh, F.-C.; Tsai, K.-Y.; Li, J.-H.; Liu, Z.-R.; Hung, C.-L.; JIA-HAN LI |
| 臺大學術典藏 |
2020-01-17T07:45:12Z |
Direct-scatterometry-enabled PEC model calibration with two-dimensional layouts
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Yang, Y.-Y.; Lee, H.-P.; Liu, C.-H.; Yu, H.-Y.; Tsai, K.-Y.; Li, J.-H.; JIA-HAN LI |
| 臺大學術典藏 |
2020-01-17T07:45:12Z |
Optical scatterometry system for detecting specific line edge roughness of resist gratings subjected to detector noises
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Lee, Y.-M.; Li, J.-H.; Wang, F.-M.; Cheng, H.-H.; Shen, Y.-T.; Tsai, K.-Y.; Shieh, J.J.; Chen, A.C.; JIA-HAN LI |
| 臺大學術典藏 |
2020-01-17T07:45:11Z |
The electrostatic potential inside the electron-optical systen with periodic boundary-value conditions
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Pei, T.-H.; Tsai, K.-Y.; Li, J.-H.; JIA-HAN LI |
| 臺大學術典藏 |
2020-01-17T07:45:11Z |
Refractive index and effective thickness measurement system for the RGB color filter coatings with absorption and scattering properties
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Lee, Y.-M.; Cheng, H.-H.; Li, J.-H.; Tsai, K.-Y.; Sheng, Y.-T.; JIA-HAN LI |
| 臺大學術典藏 |
2020-01-17T07:45:10Z |
Supplementary zones-surrounded Fresnel zone plate with enhanced optical resolution
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JIA-HAN LI; Li, J.-H.; Liu, Z.-Y.; Tsai, C.-H.; Chung, T.-T.; Tsai, K.-Y.; Chiou, P.-C.; Hsu, C.-P.; Chen, S.-H.; Lee, Y.-M. |
| 臺大學術典藏 |
2020-01-17T07:45:10Z |
Comparison of the vectorial diffraction theory and Fraunhofer approximation method on diffractive images of Fresnel zone plates
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Pei, T.-H.; Tsai, K.-Y.; Li, J.-H.; JIA-HAN LI |
| 臺大學術典藏 |
2020-01-13T08:20:45Z |
Silicon photodiodes for electron beam position and drift detection in scanning electron microscopy and electron beam lithography system
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Kuo, Y.-H. ;Wu, C.-J. ;Yen, J.-Y. ;Chen, S.-Y. ;Tsai, K.-Y. ;Chen, Y.-Y.Jia-Yush Yen; Kuo, Y.-H.; Wu, C.-J.; Yen, J.-Y.; Chen, S.-Y.; Tsai, K.-Y.; Chen, Y.-Y.; JIA-YUSH YEN |
显示项目 36-45 / 99 (共10页)
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