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機構 日期 題名 作者
臺大學術典藏 2020-10-27T12:04:17Z Comparative clinical outcomes of Taiwanese patients with resected buccal and tongue squamous cell carcinomas Chang K.-P; Yen T.-C.; Kang C.-J; Huang S.-F; Chen T.-M; Wang C.-H; Chien C.-Y; Chen W.-C; Lee L.-Y; Lin C.-Y; Wang H.-M; Hsieh C.-H; Tsao C.-K; Fang T.-J; Terng S.-D; Tsai K.-Y; Hwang T.-Z; Leu Y.-S; Chu P.-Y; Wang C.P; Liao C.-T; Wen Y.-W; Yang L.Y; Lee S.R; Ng S.-H; Liu T.-W; Tsai S.-T; Tsai M.-H; Lin J.-C; Chen P.-R; PEI-JEN LOU
臺大學術典藏 2020-10-27T12:04:14Z Adjuvant radiotherapy after curative surgery for oral cavity squamous cell carcinoma and treatment effect of timing and duration on outcome– A Taiwan Cancer Registry national database analysis Tsai K.-Y; Terng S.-D; Chien C.-Y; Yang M.-H; Hao S.-P; Wang C.-C; Tsai M.-H; Chen H.H.W; Kuo C; Wu Y.-H.; Leu Y.-S; Chu P.-Y; Chang J.T.-C; Tsai M.-H; Lin J.-C; Liu T.-W; PEI-JEN LOU; Liao C.-T; Tsai S.-T; Chiang C.-J; Tsai M.-H; Cheng Y.-J
臺大學術典藏 2020-06-16T06:34:48Z Supplementary zones-surrounded fresnel zone plate Lee, Y.-M.;Chen, S.-H.;Hsu, C.-P.;Chiou, P.-C.;Tsai, K.-Y.;Chung, T.-T.;Cheng-Han-Tsai, Liu, Z.-Y.;Li, J.-H.; Lee, Y.-M.; Chen, S.-H.; Hsu, C.-P.; Chiou, P.-C.; Tsai, K.-Y.; Chung, T.-T.; Cheng-Han-Tsai, Liu, Z.-Y.; Li, J.-H.; KUEN-YU TSAI
臺大學術典藏 2020-06-16T06:34:48Z Design of automatic controllers for model-based OPC with optimal resist threshold determination for improving correction convergence Su, Y.-S.;Ng, P.C.W.;Tsai, K.-Y.;Chen, Y.-Y.; Su, Y.-S.; Ng, P.C.W.; Tsai, K.-Y.; Chen, Y.-Y.; KUEN-YU TSAI
臺大學術典藏 2020-06-16T06:34:48Z The electrostatic potential inside the electron-optical systen with periodic boundary-value conditions Pei, T.-H.;Tsai, K.-Y.;Li, J.-H.; Pei, T.-H.; Tsai, K.-Y.; Li, J.-H.; KUEN-YU TSAI
臺大學術典藏 2020-06-04T07:43:54Z Frontalization with Adaptive Exponentially-Weighted Average Ensemble Rule for Deep Learning Based Facial Expression Recognition Tsai, K.-Y.; Ding, J.-J.; Lee, Y.-C.; JIAN-JIUN DING; Tsai, K.-Y.;Ding, J.-J.;Lee, Y.-C.
臺大學術典藏 2020-01-17T07:47:38Z Solution-refined method for electrostatic potential distribution of large-scale electron optics Lee, Y.-M.; Li, J.-H.; Sheu, T.-W.-H.; Tsai, K.-Y.; Yen, J.-Y.; TONY W. H. SHEU
臺大學術典藏 2020-01-17T07:45:18Z A fully model-based methodology for simultaneously correcting EUV mask shadowing and optical proximity effects with improved pattern transfer fidelity and process windows Ng, P.C.W.; Tsai, K.-Y.; Lee, Y.-M.; Pei, T.-H.; Wang, F.-M.; Li, J.-H.; Chen, A.C.; JIA-HAN LI
臺大學術典藏 2020-01-17T07:45:17Z Fresnel zone plate manufacturability analysis for direct-write lithography by simulating focusing and patterning performance versus fabrication errors Tsai, K.-Y.; Chen, S.-Y.; Pei, T.-H.; Li, J.-H.; JIA-HAN LI
臺大學術典藏 2020-01-17T07:45:17Z Efficient scattering simulations for equivalent extreme ultraviolet mask multilayer structures by modified transmission line theory and finite-difference time-domain method Lee, Y.-M.; Li, J.-H.; Ng, P.C.W.; Pei, T.-H.; Wang, F.-M.; Tsai, K.-Y.; Chen, A.C.; JIA-HAN LI
臺大學術典藏 2020-01-17T07:45:17Z Using transmission line theory to calculate equivalent refractive index of EUV mask multilayer structures for efficient scattering simulation by finite-difference time-domain method Lee, Y.-M.; Li, J.-H.; Ng, P.C.W.; Pei, T.-H.; Wang, F.-M.; Tsai, K.-Y.; Chen, A.C.; JIA-HAN LI
臺大學術典藏 2020-01-17T07:45:17Z Stochastic simulation of photon scattering for EUV mask defect inspection Pei, T.-H.; Tsai, K.-Y.; Li, J.-H.; JIA-HAN LI
臺大學術典藏 2020-01-17T07:45:16Z Erratum: Fully model-based methodology for simultaneous correction of extreme ultraviolet mask shadowing and proximity effects (Journal of Micro/ Nanolithography, MEMS, and MOEMS (2011) 10 (013004)) Ng, P.C.W.; Tsai, K.-Y.; Lee, Y.-M.; Wang, F.-M.; Li, J.-H.; Chen, A.C.; JIA-HAN LI
臺大學術典藏 2020-01-17T07:45:16Z Fully model-based methodology for simultaneous correction of extreme ultraviolet mask shadowing and proximity effects Ng, P.C.W.; Tsai, K.-Y.; Lee, Y.-M.; Wang, F.-M.; Li, J.-H.; Chen, A.C.; JIA-HAN LI
臺大學術典藏 2020-01-17T07:45:15Z Direct-scatterometry-enabled lithography model calibration Chen, C.-Y.; Tsai, K.-Y.; Shen, Y.-T.; Lee, Y.-M.; Li, J.-H.; Shieh, J.J.; Chen, A.C.; JIA-HAN LI
臺大學術典藏 2020-01-17T07:45:14Z Void-based photonic crystal mirror with high reflectivity and low dissipation for extreme-ultraviolet radiation Lee, Y.-M.; Li, J.-H.; Tsai, K.-Y.; JIA-HAN LI
臺大學術典藏 2020-01-17T07:45:13Z Direct-scatterometry-enabled optical-proximity-correction-model calibration JIA-HAN LI; Chen, A.C.; Shieh, J.J.; Li, J.-H.; Tsai, K.-Y.; Shen, Y.-T.; Liu, C.-H.; Ng, P.C.W.; Chen, C.-Y.
臺大學術典藏 2020-01-17T07:45:12Z Simulation and experiment of speckle reduction by the beam splitting method on a pico-projection system Pei, T.-H.; Yeh, F.-C.; Tsai, K.-Y.; Li, J.-H.; Liu, Z.-R.; Hung, C.-L.; JIA-HAN LI
臺大學術典藏 2020-01-17T07:45:12Z Direct-scatterometry-enabled PEC model calibration with two-dimensional layouts Yang, Y.-Y.; Lee, H.-P.; Liu, C.-H.; Yu, H.-Y.; Tsai, K.-Y.; Li, J.-H.; JIA-HAN LI
臺大學術典藏 2020-01-17T07:45:12Z Optical scatterometry system for detecting specific line edge roughness of resist gratings subjected to detector noises Lee, Y.-M.; Li, J.-H.; Wang, F.-M.; Cheng, H.-H.; Shen, Y.-T.; Tsai, K.-Y.; Shieh, J.J.; Chen, A.C.; JIA-HAN LI
臺大學術典藏 2020-01-17T07:45:11Z The electrostatic potential inside the electron-optical systen with periodic boundary-value conditions Pei, T.-H.; Tsai, K.-Y.; Li, J.-H.; JIA-HAN LI
臺大學術典藏 2020-01-17T07:45:11Z Refractive index and effective thickness measurement system for the RGB color filter coatings with absorption and scattering properties Lee, Y.-M.; Cheng, H.-H.; Li, J.-H.; Tsai, K.-Y.; Sheng, Y.-T.; JIA-HAN LI
臺大學術典藏 2020-01-17T07:45:10Z Supplementary zones-surrounded Fresnel zone plate with enhanced optical resolution JIA-HAN LI; Li, J.-H.; Liu, Z.-Y.; Tsai, C.-H.; Chung, T.-T.; Tsai, K.-Y.; Chiou, P.-C.; Hsu, C.-P.; Chen, S.-H.; Lee, Y.-M.
臺大學術典藏 2020-01-17T07:45:10Z Comparison of the vectorial diffraction theory and Fraunhofer approximation method on diffractive images of Fresnel zone plates Pei, T.-H.; Tsai, K.-Y.; Li, J.-H.; JIA-HAN LI
臺大學術典藏 2020-01-13T08:20:45Z Silicon photodiodes for electron beam position and drift detection in scanning electron microscopy and electron beam lithography system Kuo, Y.-H. ;Wu, C.-J. ;Yen, J.-Y. ;Chen, S.-Y. ;Tsai, K.-Y. ;Chen, Y.-Y.Jia-Yush Yen; Kuo, Y.-H.; Wu, C.-J.; Yen, J.-Y.; Chen, S.-Y.; Tsai, K.-Y.; Chen, Y.-Y.; JIA-YUSH YEN

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