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"tsai ming qun"
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| 國立成功大學 |
2006-04-27 |
Global and local residual stress in silicon carbide films produced by plasma-enhanced chemical vapor deposition
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Chung, Chen-Kuei; Lin, Tzu-Yin; Duh, Jenq-Gong; Tsai, Ming-Qun |
| 國立成功大學 |
2005-01 |
Fabrication and characterization of amorphous Si films by PECVD for MEMS
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Chung, Chen-Kuei; Tsai, Ming-Qun; Tsai, Po-Hao; Lee, Chiapyng |
| 國立成功大學 |
2004-07-19 |
碳化矽/碳微奈米複合薄膜製程與性質檢測之研究
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蔡名琨; Tsai, Ming-Qun |
| 國立成功大學 |
2004-07-19 |
碳化矽/碳微奈米複合薄膜製程與性質檢測之研究
|
蔡名琨; Tsai, Ming-Qun |
Showing items 1-4 of 4 (1 Page(s) Totally)
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