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Showing items 36-45 of 45 (5 Page(s) Totally)
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| 國立成功大學 |
2013-01-15 |
Investigating degradation behavior of InGaZnO thin-film transistors induced by charge-trapping effect under DC and AC gate bias stress
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Hsieh, Tien-Yu; Chang, Ting-Chang; Chen, Te-Chih; Tsai, Ming-Yen; Chen, Yu-Te |
| 國立成功大學 |
2013-01-15 |
Investigating the degradation behavior under hot carrier stress for InGaZnO TFTs with symmetric and asymmetric structures
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Tsai, Ming-Yen; Chang, Ting-Chang; Chu, Ann-Kuo; Chen, Te-Chih; Hsieh, Tien-Yu; Chen, Yu-Te; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi |
| 國立臺中教育大學 |
2013 |
資訊融入國小視覺藝術鑑賞教學之行動研究
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蔡明諺; Tsai, Ming-Yen |
| 國立高雄應用科技大學 |
2013 |
以Q方法分析紅茶業者對茶園觀光之經濟影響的知覺
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蔡明諺; Tsai, Ming-yen |
| 國立成功大學 |
2012-07-23 |
Self-heating enhanced charge trapping effect for InGaZnO thin film transistor
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Chen, Te-Chih; Chang, Ting-Chang; Hsieh, Tien-Yu; Tsai, Ming-Yen; Chen, Yu-Te; Chung, Yi-Chen; Ting, Hung-Che; Chen, Chia-Yu |
| 國立成功大學 |
2012-06-04 |
Origin of self-heating effect induced asymmetrical degradation behavior in InGaZnO thin-film transistors
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Hsieh, Tien-Yu; Chang, Ting-Chang; Chen, Te-Chih; Tsai, Ming-Yen; Chen, Yu-Te; Chung, Yi-Chen; Ting, Hung-Che; Chen, Chia-Yu |
| 國立臺灣大學 |
2010 |
以穿透式電子顯微鏡觀察在高電流密度下覆晶封裝中 Ni(V)金屬墊層的消耗現象
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蔡明諺; Tsai, Ming-Yen |
| 國立政治大學 |
2009 |
動態規劃數值解 ：退休後資產配置
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蔡明諺; Tsai, Ming Yen |
| 國立政治大學 |
2006-12 |
俄中軍事合作關係的發展與影響
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蔡明彥; Tsai, Ming-Yen |
| 中華醫事科技大學 |
1993-07 |
Effect of secreted products of vibrio vulnificus on lymphocytes and lnfluence of lron on serum resistance of vibrio vulnificus
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張文政; 何貴惠; 張珍琦; 葉才明; Wen-Chen Chang; Kuei-Hui Ho; Chen-Chi Chang; Tsai-Ming Yen |
Showing items 36-45 of 45 (5 Page(s) Totally)
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