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"tsai ms"
Showing items 41-50 of 100 (10 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:48:51Z |
Conduction mechanism and temperature-dependent current-voltage in (Ba, Sr)TiO3 thin films
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Tsai, MS; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:47:24Z |
Effect of bottom electrodes on dielectric relaxation and defect analysis of (Ba0.47Sr0.53)TiO3 thin film capacitors
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Tsai, MS; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:46:54Z |
Effect of bottom electrode materials and annealing treatments on the electrical characteristics of Ba0.47Sr0.53TiO3 film capacitors
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Tsai, MS; Sun, SC; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:46:14Z |
Effect of bottom electrode materials on the electrical and reliability characteristics of (Ba, Sr)TiO3 capacitors
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Tsai, MS; Sun, SC; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:46:13Z |
Effect of oxygen to argon ratio on defects and electrical conductivities in Ba0.47Sr0.53TiO3 thin-film capacitors
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Tsai, MS; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:46:08Z |
Nitric acid-based slurry with citric acid as an inhibitor for copper chemical mechanical polishing
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Hu, TC; Chiu, SY; Dai, BT; Tsai, MS; Tung, IC; Feng, MS |
| 國立交通大學 |
2014-12-08T15:46:05Z |
The novel precleaning treatment for selective tungsten chemical vapor deposition
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Chang, TC; Mor, YS; Liu, PT; Sze, SM; Yang, YL; Tsai, MS; Chang, CY |
| 國立交通大學 |
2014-12-08T15:45:36Z |
Effect of bottom electrodes on resistance degradation and breakdown of (Ba, Sr)TiO3 thin films
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Tsai, MS; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:45:19Z |
Retardation in the chemical-mechanical polish of the boron-doped polysilicon and silicon
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Yang, WL; Cheng, CY; Tsai, MS; Liu, DG; Shieh, MS |
| 國立交通大學 |
2014-12-08T15:45:16Z |
Dielectric relaxation and defect analysis of Ta2O5 thin films
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Ezhilvalavan, S; Tsai, MS; Tseng, TY |
Showing items 41-50 of 100 (10 Page(s) Totally)
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