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Taiwan Academic Institutional Repository >
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"tsai sheng fu"
Showing items 11-19 of 19 (1 Page(s) Totally)
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| 國立成功大學 |
2003-06-14 |
適用於極大型積體電路之多晶矽與擴散層電阻特性之研究
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蔡盛伏; Tsai, Sheng-Fu |
| 國立成功大學 |
2003-06-14 |
適用於極大型積體電路之多晶矽與擴散層電阻特性之研究
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蔡盛伏; Tsai, Sheng-Fu |
| 國立成功大學 |
2003-05 |
Temperature-dependent characteristics of polysilicon and diffused resistors
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Chuang, Hung-Ming; Thei, K. B.; Tsai, Sheng-Fu; Liu, Wen-Chau |
| 國立成功大學 |
2003-04-29 |
A new and improved structure of polysilicon resistor for subquarter micrometer CMOS device applications
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Thei, Kong-Beng; Cheng, Chung-Long; Lin, Hsin-Chien; Chang, Tong-Sen; Tsai, Nun-Sian; Lee, Kuo-Hwa; Chuang, Hung-Ming; Tsai, Sheng-Fu; Liu, Wen-Chau |
| 國立成功大學 |
2003-04 |
A comprehensive study of polysilicon resistors for CMOS ULSI applications
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Chuang, Hung-Ming; Thei, Kong-Beng; Tsai, Sheng-Fu; Lu, Chun-Tsen; Liao, Xin-Da; Lee, Kuan-Ming; Chen, Hon-Rung; Liu, Wen-Chau |
| 國立成功大學 |
2002-10 |
Comparative study of double ion implant Ti-salicide and pre-amorphization implant Co-salicide for ultra-large-scale integration applications
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Chuang, Hung-Ming; Thei, Kong-Beng; Tsai, Sheng-Fu; Lu, Chun-Tsen; Liao, Xin-Da; Lee, Kuan-Ming; Liu, Wen-Chau |
| 國立成功大學 |
2002-06 |
Effects of electrical and temperature stress on polysilicon resistors for CMOS technology applications
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Thei, Kong-Beng; Chuang, Hung-Ming; Tsai, Sheng-Fu; Lu, Chun-Tsen; Liao, Xin-Da; Lee, Kuan-Ming; Liu, Wen-Chau |
| 國立成功大學 |
2001-11 |
Unfairness of measurement-based admission controls in a heterogeneous environment
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Lai, Yuan-Cheng; Tsai, Sheng-Fu |
| 國立臺灣科技大學 |
2001 |
Unfairness of Measurement-based Admission Controls in a Heterogeneous Environment
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Lai, Yuan-Cheng;Tsai, Sheng-Fu |
Showing items 11-19 of 19 (1 Page(s) Totally)
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